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low-energy ion-scattering spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
... Abstract This article is a brief account of low-energy ion-scattering spectroscopy (LEIS) for determining the atomic structure of solid surfaces. It begins with a description of the general principles of LEIS. This is followed by a section providing information on the equipment used for LEIS...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001773
EISBN: 978-1-62708-178-8
... Abstract Low-energy ion-scattering spectroscopy (LEISS) is used extensively to analyze solid surfaces. The LEISS process relies on binary elastic collisions between an incident ion beam and the atoms in a sample to obtain information on the surface atoms. The velocity of the scattered ions...
Image
Published: 15 December 2019
Fig. 9 Schematic view of low-energy ion-scattering spectroscopy combined with an ultrahigh vacuum chamber. AES, Auger electron spectroscopy; LEED, low-energy electron diffraction; MCP, microchannel plate; TDC, time-to-digital converter; TMP, turbo molecular pump More
Image
Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
Image
Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy More
Image
Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy More
Image
Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... inductively coupled plasma atomic emission spectroscopy ICP-MS inductively coupled plasma mass spectrometry IR infrared (spectroscopy) IRRAS infrared reflection absorption spectroscopy LEED low-energy electron diffraction LEISS low-energy ion-scattering spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... chromatography; ICP-MS, inductively coupled plasma mass spectroscopy; LC, liquid chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS, low-energy ion-scattering spectroscopy; MFS, molecular fluorescence spectroscopy; NAA, neutron activation analysis; NMR, nuclear magnetic resonance; OM, optical...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... • … … • • • • • • • • • • … … Ion chromatography D,N … D,N D,N D,N D,N D,N D,N … N D,N D,N D,N … … Liquid chromatography … … D … D D D D … … D D D … … Liquid chromatography mass spectrometry D, • D,N D,• D,• D D D D … … D D D … … Low-energy ion-scattering spectroscopy...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., electron probe x-ray microanalysis; FTIR, Fourier transform infrared spectroscopy; IA, image analysis; IC, ion chromatography; ICP-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
..., there are several possibilities for surface chemical analysis: the characteristic energy loss of scattered primary ions (ISS, RBS), the mass of secondary (sputtered) particles (SIMS, SNMS, GDMS), or their optical emission (GDOES). Primary ion energy spectroscopy is performed either at low energy (<10 keV) ( Ref...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... perpendicular planes as peaks in the energy spectra of the secondary arriving at different foci. electrons generated. backscattered ion. An ion that has entered a Auger electron spectroscopy (AES). A tech- sample and, through one or more collisions, atom. The smallest particle of an element that nique...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006657
EISBN: 978-1-62708-213-6
... mass spectroscopy, and low-energy ion-scattering spectroscopy, discussed in articles in this Volume, are among the most widely used surface-sensitive analytical techniques capable of providing elemental composition of the outermost atomic layers of a solid. These techniques are used to investigate...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... bonding, and elemental depth profile Ion scattering spectroscopy (ISS) The energy of scattered primary ions from the surface allows identification of surface atoms. Chemical composition of the surface films at atomic and a molecular level Secondary ion mass spectrometry (SIMS) Incident ion beam...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001775
EISBN: 978-1-62708-178-8
... crystal Low-energy ion-scattering spectroscopy: Low-energy Lattice strain measurement of heteroepitaxy layers Rutherford backscattering spectrometry using keV or superlattices ions rather than typical Rutherford backscattering spectrometry, which uses MeV ions Samples Cross-section transmission...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of a field ion element due to a change in chemical with a small energy loss. The back- microscope with a hole in its screen open- bonding relative to a specified element or scattered electron yield is strongly de- ing into a mass spectrometer; atoms are compound. pendent upon atomic number, qualita- removed...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... that have not been included in this division include: Glow discharge optical emission spectroscopy, a surface-sensitive technique (covered in Division 2, “Spectroscopy,” in this Volume) Electron energy loss spectroscopy (covered in Division 9, “Microscopy and Microanalysis,” in this Volume) Ion...