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low-energy electron diffraction

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... Abstract Low-energy electron diffraction (LEED) is a technique for investigating the crystallography of surfaces and overlayers adsorbed on surfaces. This article provides a brief account of LEED, covering the principles and measurements of diffraction from surfaces. Some of the processes...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001769
EISBN: 978-1-62708-178-8
... Abstract Low-energy electron diffraction (LEED) is a technique for investigating the crystallography of surfaces and overlayers adsorbed on surfaces. This article describes the principles of diffraction from surfaces, and elucidates the method of sample preparation to achieve diffraction...
Image
Published: 15 December 2019
Fig. 11 Diffraction patterns from GaAs (110). (a) Low-energy electron diffraction pattern near normal incidence, E p = 100 eV. (b) Reflection high-energy electron diffraction pattern, incident beam along [100] azimuth at grazing angle of incidence of 4.5°, E p = 10 keV. The lowest More
Image
Published: 15 December 2019
Fig. 10 Mean free path for inelastic scattering of electrons as a function of kinetic energy of electrons travelling in a solid. Electrons in the low-energy electron diffraction energy range travel only of the order of 0.4 to 2 nm in the crystal before losing energy and thus becoming lost More
Image
Published: 15 December 2019
Fig. 9 Schematic view of low-energy ion-scattering spectroscopy combined with an ultrahigh vacuum chamber. AES, Auger electron spectroscopy; LEED, low-energy electron diffraction; MCP, microchannel plate; TDC, time-to-digital converter; TMP, turbo molecular pump More
Image
Published: 15 December 2019
Fig. 6 Reciprocal lattice and Ewald construction corresponding to low-energy electron diffraction and comparison to real-space picture. (a) Real-space schematic diagram of diffraction from a surface. The electron beam is incident on the sample along the direction given by e − . The five More
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... longitudinal, liter lb pound lbf pound force LBW laser beam welding LCL lower control limit LEED low-energy electron diffraction LEFM linear elastic fracture mechanics LME liquid metal embrittlement LMP Larson-Miller parameter ln natural logarithm (base e ) LNG...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... inductively coupled plasma atomic emission spectroscopy ICP-MS inductively coupled plasma mass spectrometry IR infrared (spectroscopy) IRRAS infrared reflection absorption spectroscopy LEED low-energy electron diffraction LEISS low-energy ion-scattering spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
..., surface chemical reaction, surface contamination, wear, depth profile of each element with ion gun sputtering Low-energy electron diffraction (LEED) Electrons Diffraction electrons Surface crystallography and microstructure 10 μm 0.4–2 nm Adsorption, catalysis, chemical reactions, crystallography...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... developed techniques, such as “Introduction to Scanning Probe Microscopy” and “Atomic Force Microscopy,” as well as established methods, such as “Auger Electron Spectroscopy,” “Low-Energy Electron Diffraction,” and “Secondary Ion Mass Spectroscopy.” Quick reference summary of surface analysis...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... microscope LCT low coiling temperature LDPE low-density polyethylene LEED low-energy electron diffraction ln natural logarithm (base e ) log common logarithm (base 10) LPCVD low-pressure chemical vapor deposition LSI large-scale integrated (circuit...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
... converter (time resolution 10 ns), (7) pulse generator (100 kHz, 50 V), (8 ) low-energy electron diffraction (LEED) optics and Auger electron spectroscopy (AES) equipment, and (9 ) software to collect data and control the stepping motor. A neutralizer is shown in Fig. 9 . It is not needed for LEIS...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
...; SIMS: secondary ion mass spectroscopy; RBS: Rutherford backscattering spectrometry; XPS: x-ray photoelectron spectroscopy; AFM: atomic force microscopy; EFM: electrostatic force microscopy; SCM: scanning capacitance microscopy; NIM: nanoimpedance microscopy; LEED: low-energy electron diffraction; RHEED...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... of atomic number contrast: ∼1 μm X-ray characterization of elemental chemistry: ∼2 μm using typical beam voltages of ∼20 kV (much better resolution, ∼100 nm, can be obtained using low voltage beams) Electron diffraction characterization of crystal structure and orientation: ∼1 μm Elemental...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... approximately one-half the depth of the scattered electron range. Auger electrons are collected from sample depths of 0.5 to 3 nm below the surface, depending on their energy. Because Auger electron energies are relatively low, only those near the sample surface escape without suffering additional energy loss...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... materials at low beam energy. Elastic scattering is responsible for both electron diffraction (thin foils) and the generation of backscattered electrons (bulk specimens and thin foils). Coherent elastic scattering of electrons in the forward direction produces the form of electron diffraction commonly...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0005663
EISBN: 978-1-62708-173-3
... nondestructive evaluation H Henry LBW laser-beam welding NEC National Electric Code H enthalpy; hardness; magnetic field LCL lower control limit NEMA National Electrical Manufacturers As- HAZ heat-affected zone LEED low-energy electron diffraction HB Brinell hardness LEFM linear elastic fracture mechanics...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... scattering is more probable in high-atomic-number materials at low beam energy. Elastic scattering is responsible for both electron diffraction (thin foils) and the generation of BEs (bulk samples in SEM and thin specimens in TEM). Coherent elastic scattering of electrons in the forward direction produces...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001725
EISBN: 978-1-62708-178-8
...” are articles on “Analytical Transmission Electron Microscopy,” “Scanning Electron Microscopy,” “Electron Probe X-Ray Microanalysis,” and “Low-Energy Electron Diffraction.” Each article begins with a summary of general uses, applications, limitations, sample requirements, and capabilities of related...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... elastic scattering (diffraction) from a given set of crystal planes into cones of intensity, with the cone axis normal to the diffraction plane. Because the Bragg angle for the diffraction of low- to medium-energy electrons is on the order of 2°, the apex semiangle of the cone is 90° minus the Bragg angle...