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low-energy atom-scattering spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
... Abstract This article is a brief account of low-energy ion-scattering spectroscopy (LEIS) for determining the atomic structure of solid surfaces. It begins with a description of the general principles of LEIS. This is followed by a section providing information on the equipment used for LEIS...
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Published: 15 December 2019
Fig. 21 Image of magnesium atoms on a clean MgO(100) surface obtained using low-energy atom-scattering spectroscopy (TOF-LAS3000, Pascal Co., Japan) More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001773
EISBN: 978-1-62708-178-8
... Abstract Low-energy ion-scattering spectroscopy (LEISS) is used extensively to analyze solid surfaces. The LEISS process relies on binary elastic collisions between an incident ion beam and the atoms in a sample to obtain information on the surface atoms. The velocity of the scattered ions...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of the electron beam should not exceed 20 keV. There is signal and accuracy loss when low-energy x-rays are used in EPMA for elements with atomic numbers less than 15. X-rays generated within the specimen attenuate on their way to the surface. These losses can be limited with reduced beam energy closer...
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Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
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Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy More
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Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... inductively coupled plasma atomic emission spectroscopy ICP-MS inductively coupled plasma mass spectrometry IR infrared (spectroscopy) IRRAS infrared reflection absorption spectroscopy LEED low-energy electron diffraction LEISS low-energy ion-scattering spectroscopy...
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Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... nuclear bom- atoms on internal surfaces of the pump, bardment experiments. See also neutron and condenser, condenser lens. A term applied to which are maintained at extremely low proton. lenses or mirrors designed to collect, con- temperatures. trol, and concentrate radiation in an illumi- Curie point...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... In some cases, the chemical state of the surface atoms can also be determined from energy shifts and peak shapes. Auger electrons have relatively low kinetic energy, which limits their escape depth. Any Auger electrons emitted from an interaction will lose energy through additional scattering reactions...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... in expelling an outer electron (Auger electron) from the atom ( Fig. 1c ). Auger electrons have low energies, and therefore only electrons with sufficient energy originating from the surface or near the surface from a depth of approximately 0.8 to 2 nm (3.1 to 7.9 × 10 −8 in.) can escape. Auger electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... standard line. In spectroscopy, a the outermost atomic layers of a solid Joule-Thomson expansion. The adiabatic, spectral line of an internal standard, with material, in which principally mono- irreversible expansion of a gas flowing which the radiant energy of an analytical energetic, singly charged, low...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
.... FIM-AP, field ion microscopy - atom probe. ISS, ion scattering spectroscopy. SAM, scanning Auger microscopy. SIMS, secondary ion mass spectroscopy. TEELS, transmission electron energy loss spectroscopy. TEM, transmission electron microscopy. The principal components of an analytical surface...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... developed techniques, such as “Introduction to Scanning Probe Microscopy” and “Atomic Force Microscopy,” as well as established methods, such as “Auger Electron Spectroscopy,” “Low-Energy Electron Diffraction,” and “Secondary Ion Mass Spectroscopy.” Quick reference summary of surface analysis...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
...-scattering spectrometry (covered in Division 3, “Mass and Ion Spectrometry,” in this Volume) Contact angle, a surface-sensitive technique for single-layer atom detection and surface free-energy analysis White light interferometry, good for surface roughness analysis and three-dimensional contour...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001769
EISBN: 978-1-62708-178-8
... information Influence of surface structure on catalytic processes as low-energy electron diffraction. However, some Evolution of crystal structure in epitaxial growth measurements--for example, atom positions~re Grain size determination in thin oriented films more difficult than with low-energy electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001775
EISBN: 978-1-62708-178-8
... is a well-developed technique. Detailed methods and examples are available in Ref 10 , 11 , and 12 . Rutherford backscattering spectrometry channeling of silicon sputtered by low-energy noble gas can provide information on sputter-induced crystal damage. The quantitative number of displaced silicon atoms...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... the 1937 Nobel Prize in Physics. Low-energy electron diffraction measurements are conducted by using a monoenergetic beam of electrons that impinges on the crystal surface. Diffraction of electrons occurs because of the periodic arrangement of atoms in the surface. This periodic arrangement can...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
.... Thus, x-ray spectroscopy is simply the manner by which this spectrum of x-rays is produced. Note that this spectrum is limited at both the low and high ends of the energy/wavelength scale. Because it takes energy to remove an electron from its orbital and cause it to be ejected from the atom, the high...