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light-scattering-based particle size analysis

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Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006981
EISBN: 978-1-62708-439-0
... acquisition-related metadata for AM data sets to improve data usability and reusability. Also included in the article are exemplar metadata definitions for a data set acquired from light-scattering-based particle size analysis. acquisition-related metadata additive manufacturing data reusability...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006096
EISBN: 978-1-62708-175-7
... of another instrument. Laser Diffraction (Coherent Light Scattering) One of the most versatile instruments to measure particle size operates on the principle of coherent light scattering. Particles, while suspended in a slurry, are pumped in front of a laser beam. From the angle and intensity...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... light-scattering method can be described by two theories based on particle size: relatively small (≤6 μm, or 0.236 mil) particles and larger particles. A brief discussion of these methods follows. For a more thorough treatment, refer to Chapter 6 in Modern Methods of Particle Size Analysis ( Ref 1...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... patterns, and magnetic contrast in SEM Backscattered (plasmon and interband transition interactions) 1–1000 eV less than beam energy Beam electron scattered back after collision producing plasmon oscillations or interband transition Surface analysis in SAM; light-element analysis in STEM where...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... or working curve. absorbance (A). The logarithm to the base 10 dc intermittent noncapacitive arc. of the reciprocal of the transmittance. The analytical electron microscopy (AEM). The preferred term for photography is optical activation analysis. A method of chemical technique of materials analysis...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... the applications of PIXE in atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes. particle-induced X-ray emission Overview Introduction Particle-induced x-ray emission (PIXE) is one of several elemental analyses based on characteristic x-rays...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... Quantification Microscope magnification is calibrated against reference standards. Lateral feature dimensions can be measured to an accuracy better than 0.5 μm. Computer analysis of digitally-acquired images can measure area and volume fractions, particle sizes, grain size, and other features. Scanning...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006383
EISBN: 978-1-62708-192-4
... reflects the particle size; and threshold values determine the size bin for the particle ( Ref 46 ). A more modern type of particle counter is the light-scattering APC. As with the light-blockage method, particles produce a measurable interference in the transmission of light through the sample...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
..., alpha particles with energies as high as 30 MeV are sometimes used. Figure 5 shows the elemental sensitivity of PIXE analysis based on typical parameters discussed in this article. Fig. 5 Sensitivity of PIXE analysis versus proton energy and atomic number based on typical parameter given...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... and firing response as well as ultimate properties. In addition, the degree of powder agglomeration may affect forming and lead to larger-scale porosity. The microscopic methods described in the section “Microstructural Analysis” in this article are quite suitable for determining particle size. However...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of field that transmits light without dispersing it tural units; quantitative analysis is con- and can result from design or execution, into its component wavelengths. See also cerned with the precise measurement of or both. achromatic lens, apochromatic lens. amount. A variety of physical measure- ments...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... of the same size. Based on their analysis of the “Have Cracks, Will Travel” data, Berens and Hovey ( Ref 5 ) proposed a probabilistic description of POD, where: The POD is more than a function of just crack size. For an inspection procedure to detect a discontinuity of interest, the POD assessment...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001755
EISBN: 978-1-62708-178-8
... detonation. Part of the information desired from these tests was an analysis of the sizes, shapes, and chemistries of the particles collected on these filters. These analyses were performed using a scanning electron microscope equipped with an energy-dispersive x-ray detector and interfaced with an image...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
..., and spectrometry techniques with data analysis. electron diffraction transmission electron microscopy crystal structure Overview Introduction Microstructure observation is an essential approach for materials characterization, which is primarily performed by using light optical microscopy...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003437
EISBN: 978-1-62708-195-5
.... The analysis is conducted by passing the light beam through the suspension. An alternate method is to disperse the particles in air and pass the suspension through the laser beam. The diffraction pattern that is produced by the interaction of the laser beam with the suspension is analyzed to determine the size...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... in the specimen (texture analysis) Powder, polycrystalline compact Size of crystallites Line profile analysis Powder Magnitude of macrostress (residual-stress analysis) Line shifts Polycrystalline specimen Amount of phase Quantitative analysis Powder Change of state Special atmosphere chambers...
Series: ASM Handbook
Volume: 1A
Publisher: ASM International
Published: 31 August 2017
DOI: 10.31399/asm.hb.v01a.a0006336
EISBN: 978-1-62708-179-5
... with computer-based image analysis software. However, such systems are limited in effectiveness due to the complex nature of visual inspection. Studies that have been carried out to assess the possibility of extending such methods to iron castings have not given encouraging results. Contrast between defective...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001775
EISBN: 978-1-62708-178-8
... cross section; for helium ions Z 1 = 2), Z 2 2 (for a given projectile, it is more sensitive to heavy elements than light elements), and E −2 (scattering yield increases with decreasing ion beam energy). In thin film analysis, ratios of scattering cross sections between two elements Z...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006637
EISBN: 978-1-62708-213-6
..., Z 1 = 2), Z 2 2 (for a given projectile, it is more sensitive to heavy elements than light elements), and E −2 (scattering yield increases with decreasing ion beam energy). In thin-film analysis, ratios of scattering cross sections between two elements Z 2 and Z ′ 2 often...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006056
EISBN: 978-1-62708-175-7
... and Related Compounds by X-Ray Monitoring of Gravity Sedimentation Sedimentation 0.1–100 B822 – Standard Test Method for Particle Size Distribution of Metal Powders and Related Compounds by Light Scattering Light Scattering 0.4–2000 B859 – De-Agglomeration of Refractory Metal Powders...