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laser scanning confocal microscopy

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Published: 01 June 2012
Fig. 6 Confocal laser scanning microscopy image of interfacial margins of resin-dentin restoration More
Image
Published: 01 January 2003
Fig. 5 Conceptual model of biofilm structure as determined by confocal scanning laser microscopy. The metal is shown crosshatched. Note the nearly continuous base film upon which sits a series of cauliflower-like cell clusters separated by voids through which bulk water can flow (arrows More
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006967
EISBN: 978-1-62708-439-0
... for typical AM applications are focus variation and coherent confocal microscopy. A summary of benefits includes: High resolution/surface point density Recorded surface isotropy Fast relative to contact stylus systems No surface contact required, removing a number of issues associated...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... kV kilovolt kW kilowatt l length ℓ length L longitudinal; liter lb pound lbf pound force LCVD laser-induced chemical vapor deposition LCL lower control limit LCP liquid crystal polymer LCSM laser confocal scanning...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006387
EISBN: 978-1-62708-192-4
... measurement at the nanoscale, such as atomic force microscopy (AFM) measurement and scanning electron microscopy measurement. It reviews the techniques of wear measurement at the atomic level, namely, transmission electron microscopy (TEM) measurement and AFM combined with TEM measurement. atomic force...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... influence the choice of light or electron microscopy (as detailed in the subsequent articles “Light Microscopy” and “Scanning Electron Microscopy” in this Handbook). However, these general factors are common to any imaging system, and an understanding of electron and light microscopy can be introduced...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... Abstract This article discusses the fundamentals and operating principles of the following acoustic microscopy methods: scanning laser acoustic microscopy, C-mode scanning acoustic microscopy, and scanning acoustic microscopy. It describes the applications of acoustic microscopy for detecting...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... on (a) a cobalt-chromium alloy device and (b) a Nitinol device after electropolishing Fig. 7 Scanning electron microscopy images of cracks in laser-cut stents. The stainless steel stent in (a) has a fatigue crack that occurred during ultrasonic cleaning after laser cutting. The fracture in the Nitinol...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003536
EISBN: 978-1-62708-180-1
... profilometry ( Ref 65 ), atomic force microscopy ( Ref 66 ), confocal scanning microscopy ( Ref 67 ), light profile microscopy ( Ref 68 ), interferometry ( Ref 69 ), stylus profilometry ( Ref 70 ), and SEM stereo-pair based methods ( Ref 71 ). For laser profilometry ( Ref 65 ), the fracture surface...
Series: ASM Handbook
Volume: 23A
Publisher: ASM International
Published: 12 September 2022
DOI: 10.31399/asm.hb.v23A.a0006893
EISBN: 978-1-62708-392-8
... into a base biopolymer and subsequently decoding the information contained in the hydrogel sheet. Hydrogel sheet with array of void areas as imaged by (b) confocal fluorescence, and (c) scanning electron microscope. (d) Confocal fluorescence image illustrating dimensions and shape of spots created...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... to the relevant material, this article is divided into sections based on classes of semiconductors that share a common set of analytic techniques. A number of techniques have uses across these categories, such as scanning electron microscopy for imaging surfaces at high spatial resolution, while other techniques...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
.... Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are invaluable tools as well; however, they should be used in conjunction with light microscopy, rather than as a substitute. For more information on these methods, see the article “Scanning Electron Microscopy” in this Volume...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003680
EISBN: 978-1-62708-182-5
..., and chemical compounds deposited in the pores ( Ref 8 ). An example obtained by TEM with UTST is given in Fig. 9 , showing the vertical section of a porous type oxide film formed on aluminum. Focused ion beam (FIB) technique is also used to make slices of oxide films, and confocal scanning laser microscopy...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005655
EISBN: 978-1-62708-198-6
... ( Ref 77 ). As a result, the extent of resorption can be measured by microscopic observation of the surface, using analyses such as scanning electron microscopy, confocal and fluorescent microscopy, contact and laser profilometry, transmission electron roscopy, and scanning probe microscopy...
Series: ASM Handbook
Volume: 23A
Publisher: ASM International
Published: 12 September 2022
DOI: 10.31399/asm.hb.v23A.a0006889
EISBN: 978-1-62708-392-8
... of the laser or electron beam. Specifically, for PBF-EB/M, electromagnetic lenses focus and orientate the electron beam. The electromagnetic control allows for high scan speeds and high positional accuracy. Scan speeds have been reported to be as high as 8000 m/s (26,247 ft/s), allowing up to 120 cm 3 /h (4.24...
Series: ASM Handbook
Volume: 23A
Publisher: ASM International
Published: 12 September 2022
DOI: 10.31399/asm.hb.v23A.9781627083928
EISBN: 978-1-62708-392-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.9781627084390
EISBN: 978-1-62708-439-0
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003586
EISBN: 978-1-62708-182-5
... in a polarization experiment is i app as a function of the potential, E , as shown by the thick solid line in Fig. 1 , where i app = i ox − i red . To obtain i app as a function of E , the applied potential between the reference electrode and working electrode is controlled and scanned at constant...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003678
EISBN: 978-1-62708-182-5
... is preferred over light microscopy because of the higher depth of focus, while FEM permits characterization of the phosphated surface with very low excitation voltage, yielding a higher surface sensitivity. A three-dimensional picture of the phosphated surface can be obtained by AFM or confocal laser...