Search Results for ionization potential

The shielding gas used in a welding process has a significant influence on the overall performance of the welding system. This article discusses the basic properties of a shielding gas in terms of ionization potential, thermal conductivity, dissociation and recombination, reactivity/oxidation potential, surface tension, gas purity, and gas density. It describes the characteristics of the components of a shielding gas blend. The article discusses the selection of shielding gas for gas-metal arc welding (GMAW), gas-tungsten arc welding (GTAW), and plasma arc welding (PAW), as well as the influence of shielding gas on weld mechanical properties. It concludes with a discussion on flux-cored arc welding.

The shielding gas used in an arc welding process has a significant influence on the overall performance of the welding system. These gases are argon, helium, oxygen, hydrogen, nitrogen, and carbon dioxide. This article discusses the shielding gas selection criteria for plasma arc welding, gas metal arc welding, and flux cored arc welding. It describes the basic properties of shielding gases, namely, dissociation, recombination, reactivity potential, oxidation potential, and gas purity. The article also provides information on the influence of the shielding gas on weld mechanical properties and self-shielded flux cored arc welding.

This article endeavors to familiarize the reader with a selection of different ionization designs and instrument components to provide knowledge for sorting the various analytical strategies in the field of solid analysis by mass spectrometry (MS). It begins with a description of the general principles of MS. This is followed by sections providing a basic understanding of instrumentation and discussing the operating requirements as well as practical considerations related to solid sample analysis by MS. Instrumentation discussed include the triple quadrupole mass spectrometer and the time-of-flight mass spectrometer. Inductively coupled plasma and thermal ionization MS provide atomic information, and direct analysis in real-time and matrix-assisted laser-desorption ionization MS are used to analyze molecular compositions. The article describes various factors pertinent to ionization methods, namely glow discharge mass spectrometry and secondary ion mass spectrometry. It concludes with a section on various examples of applications and interpretation of MS for various materials.

Field ion microscopy (FIM) can be used to study the three-dimensional structure of materials, such as metals and semiconductors, because successive atom layers can be ionized and removed from the surface by field evaporation. The ions removed from the surface by field evaporation can be analyzed chemically by coupling to the microscope a time-of-flight mass spectrometer of single-particle sensitivity, known as the atom probe (AP). This article describes the principles, sample preparation, and quantitative analysis of FIM. It also provides information on the principles, instrument design and operation, mass spectra and their interpretation, and applications of AP microanalysis.

Dealloying is a corrosion process in which one or more elements are selectively dissolved, leaving behind a porous residue of the remaining elements. This article describes the dealloying in various systems, namely, dezincification, graphitic corrosion, dealuminification, and noble metal alloys dealloying. The current-potential behavior of a binary alloy undergoing selective dissolution is reviewed. The article highlights the four mechanisms required for the formation of porous metals: ionization-redeposition, surface diffusion, volume diffusion, and percolation model of selective dissolution.

Surface modification is the alteration of the surface composition or structure using energy or particle beams. This article discusses two different surface modification methods. The first, ion implantation, is the introduction of ionized species into the substrate using kilovolt to megavolt ion accelerating potentials. The second method, laser processing, is high-power laser melting with or without mixing of materials precoated on the substrate, followed by rapid melt quenching. The article also describes the advantages and disadvantages of the surface modification approach to promote corrosion resistance.

Gas analysis by mass spectrometry, or gas mass spectrometry, is a useful analytical tool for investigations performed in controlled atmospheres or in vacuum. This article provides sufficient information to determine if gas mass spectrometry can produce the data required and to determine the type of instrument necessary for a particular application. It discusses the working operations of gas mass spectrometer components, namely, the introduction system, ion sources, mass analyzers, and the ion detector. The article also provides information on resolution of a gas mass spectrometer determined by the width of the source slit and the collector slit. Finally, it describes the instrument set-up for gas mass spectrometry, and shows how to analyze the test results of gas mass spectrometry.

This article focuses on some of the factors pertinent to atomic absorption spectroscopy (AAS). It begins by describing the working principle, critical components, and construction of flame atomic absorption instrumentation. This is followed by sections discussing various types of interferences in AAS, namely vaporization, ionization, matrix interferences, and background correction. Some of the methods for the analysis of microliter-sized samples and methods of standard additions to the sample solution for generating calibration standards are then reviewed. The article concludes with a section on processes involved in matrix matching.

This article provides a brief account of glow discharge mass spectrometry (GDMS) for direct determination of trace elements in solid samples and for fast depth profiling in a great variety of innovative materials. It begins by describing the general principles of GDMS. This is followed by a discussion on the various components of a GDMS system as well as commercial GDMS instruments. A description of processes involved in specimen preparation and cleaning in GDMS is then presented. Various problems pertinent to multielemental calibrations in GDMS are discussed along with measures to overcome them. The article further provides information on the processes involved in the analytical setup of parameters in GDMS, covering the steps involved in the analysis of GDMS data. It ends with a section on the application and interpretation of GDMS in the metals industry.

Gas analysis by mass spectrometry, or gas mass spectrometry, is a general technique using a family of instrumentation that creates a charged ion from a gas phase chemical species and measures the mass-to-charge ratio. This article covers gas analysis applications that do not use chromatographic separation to physically isolate components of the sample prior to analysis. It is intended to provide an understanding of gas analysis instrumentation and terminology that will help make informed decisions in choosing an instrument and methodology appropriate for the data needed. Mass-analyzer technologies for gas mass spectrometry, namely quadrupole mass filters, magnetic sector mass filters, and time-of-flight mass analyzers are covered. Common factors to consider in choosing an analyzer for static or continuous gas measurement are also described. In addition, the article presents some examples of applications of gas mass spectrometry.

This article discusses the general principles, optical systems, and emission sources of optical emission spectroscopy for elemental analysis. Changes in the energy of the valence or outer shell electrons result in the atomic lines used in emission spectroscopy. Each possible combination of electron configurations produces a spectroscopic term that describes the state of the atom. Atomic emission is analytically useful only to the extent that the emission from one atomic species can be measured and its intensity recorded independent of emission from other sources. Emission sources are often designed to minimize molecular emission. Each of the four types of emission sources; arcs, high-voltage sparks, glow discharges, and flames; has a set of physical characteristics with accompanying analytical assets and liabilities. The article also discusses the applications of each type of emission source.

This article discusses the basic principles of inductively coupled plasma mass spectrometry (ICP-MS), covering different instruments used for performing ICP-MS analysis. The instruments covered include the sample-introduction system, ICP ion source, mass analyzer, and ion detector. Emphasis is placed on ICP-MS applications in the semiconductor, photovoltaic, materials science, and other electronics and high-technology areas.

This article briefly describes the capabilities of gas chromatography/mass spectrometry, which is used to qualitatively and quantitatively determine organic (and some inorganic) compound purity and stability and to identify components in a mixture. The discussion covers in more detail gas chromatography/mass spectrometry (GC/MS) instrumentation, interpreting mass spectra, GC/MS methodology, and GC/MS advances. Sample preparation, which is very important in GC/MS to avoid erroneous data and to minimize maintenance and troubleshooting of the instrument, is also discussed. Further, the article highlights the state of the art in the MS detector technology.

This article is a detailed account of optical emission spectroscopy (OES) for elemental analysis. It begins with a discussion on the historical background of OES and development trends in OES methods. This is followed by a description of the general principles and optical systems of OES, along with various types of emission sources commonly used for OES. Some of the processes involved in calibration and quantification of OES for direct solids analysis by the ratio method are then described. The article ends with a discussion on the applications of each type of emission sources.

This article is dedicated to gas chromatography (GC), covering the chromatographic method and primary components of a modern GC apparatus. The components include the carrier gas cylinder, flow controller and pressure regulator, sample inlet and injection port, column oven, and detector. Common GC detectors are the thermal conductivity cell detector, flame ionization detector, electron capture detector, sulfur chemiluminescence detector, and nitrogen-phosphorus detector.

Laser-beam welding (LBW) is a joining process that produces coalescence of material with the heat obtained from the application of a concentrated coherent light beam impinging upon the surface to be welded. This article describes the steps that must be considered when selecting the LBW process. It reviews the individual process variables that influence procedure development of the LBW process. Joint design and special practices related to LBW are discussed. The article concludes with a discussion on the use of consumables and special welding practices.

This article provides an overview of the fundamentals, mechanisms, process physics, advantages, and limitations of laser beam welding. It describes the independent and dependent process variables in view of their role in procedure development and process selection. The article includes information on independent process variables such as incident laser beam power and diameter, laser beam spatial distribution, traverse speed, shielding gas, depth of focus and focal position, weld design, and gap size. Dependent variables, including depth of penetration, microstructure and mechanical properties of laser-welded joints, and weld pool geometry, are discussed. The article also reviews the various injuries and electrical and chemical hazards associated with laser beam welding.

This article presents the following characteristics of pure metals : structure, chemical composition, mass characteristics, thermal properties, electrical properties, chemical properties, magnetic properties, optical properties, fabrication characteristics, nuclear properties, and mechanical properties.

The gas-tungsten arc welding (GTAW) process is performed using a welding arc between a nonconsumable tungsten-base electrode and the workpieces to be joined. The arc discharge requires a flow of electrons from the cathode through the arc column to the anode. This article discusses two cases of electron discharge at the cathode: thermionic emission and nonthermionic emission, also called cold cathode, or field emission. It schematically illustrates relative heat transfer contributions to workpiece in the GTAW process. The article provides information on the effects of cathode tip shape and shielding gas composition in the GTAW process.

This article describes the characteristics of continuous cathodic arc sources and filtering process for removing macroparticles from a cathodic arc. It provides information on the types of arc sources and the properties of deposited materials. The advantages, limitations, and applications of arc deposition are also discussed.