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ion scattering spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
... Abstract This article is a brief account of low-energy ion-scattering spectroscopy (LEIS) for determining the atomic structure of solid surfaces. It begins with a description of the general principles of LEIS. This is followed by a section providing information on the equipment used for LEIS...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001773
EISBN: 978-1-62708-178-8
... Abstract Low-energy ion-scattering spectroscopy (LEISS) is used extensively to analyze solid surfaces. The LEISS process relies on binary elastic collisions between an incident ion beam and the atoms in a sample to obtain information on the surface atoms. The velocity of the scattered ions...
Image
Published: 15 December 2019
Fig. 9 Schematic view of low-energy ion-scattering spectroscopy combined with an ultrahigh vacuum chamber. AES, Auger electron spectroscopy; LEED, low-energy electron diffraction; MCP, microchannel plate; TDC, time-to-digital converter; TMP, turbo molecular pump More
Image
Published: 15 December 2019
Fig. 11 A series of ion-scattering spectroscopy polar angle scans for 2 keV 20 Ne + ions backscattered from a Pt(111) surface along the [ 1 ¯ 10] azimuth More
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
... surface analysis methods, namely, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and Rutherford backscattering spectroscopy. It also provides useful information on the applications of surface analysis. Auger electron...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis. corrosion corrosion inhibition...
Image
Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More
Image
Published: 01 January 1994
spectroscopy). GDOES (GDMS), glow discharge optical emission spectroscopy (glow discharge mass spectroscopy). RBS (ISS), Rutherford backscattering spectroscopy (ion scattering spectroscopy). Source: Ref 3 More
Image
Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy More
Image
Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
Image
Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
Image
Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... chromatography; ICP-MS, inductively coupled plasma mass spectroscopy; LC, liquid chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS, low-energy ion-scattering spectroscopy; MFS, molecular fluorescence spectroscopy; NAA, neutron activation analysis; NMR, nuclear magnetic resonance; OM, optical...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... inductively coupled plasma atomic emission spectroscopy ICP-MS inductively coupled plasma mass spectrometry IR infrared (spectroscopy) IRRAS infrared reflection absorption spectroscopy LEED low-energy electron diffraction LEISS low-energy ion-scattering spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... • … … • • • • • • • • • • … … Ion chromatography D,N … D,N D,N D,N D,N D,N D,N … N D,N D,N D,N … … Liquid chromatography … … D … D D D D … … D D D … … Liquid chromatography mass spectrometry D, • D,N D,• D,• D D D D … … D D D … … Low-energy ion-scattering spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., electron probe x-ray microanalysis; FTIR, Fourier transform infrared spectroscopy; IA, image analysis; IC, ion chromatography; ICP-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... perpendicular planes as peaks in the energy spectra of the secondary arriving at different foci. electrons generated. backscattered ion. An ion that has entered a Auger electron spectroscopy (AES). A tech- sample and, through one or more collisions, atom. The smallest particle of an element that nique...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... ISO International Organization for Standardization ISS ion scattering spectroscopy J joule J ion current density k Boltzmann constant k thermal conductivity; Boltzmann constant; wear factor; wear coefficient K kelvin K wear coefficient...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0006515
EISBN: 978-1-62708-200-6
... oxygen index GC/MS gas chromatograph/mass ISO International Organization for spectrometer Standardization LPS liquid-phase sintering GPa gigapascal ISS ion scattering spectroscopy LTCC low-temperature co-fired multilayer GPC gel permeation chromatography IT isothermal technique ceramic gpd grams per...