This article presents a detailed account of ion chromatography (IC). It begins by describing the principles of common separation modes in IC. This is followed by a section on the different modes of detection, namely suppressed conductivity detection, nonsuppressed conductivity detection, spectrophotometric detection, and electrochemical detection. Various separation modes in IC are then described. The article further provides information on various eluents species, analyte range, and sample preparation techniques in IC. It ends by providing information on the instrumentation and applications and future directions of IC.

Ion chromatography (IC) is an analytical technique that uses columns packed with ion exchange resins to separate ions in aqueous solutions and dynamically elute them to a detector. This article provides information on the different modes of detection, namely, eluent-suppressed conductivity detection, single-column ion chromatography with conductivity detection, ion chromatography with spectrophotometric detection, and amperometric electrochemical detection. It describes the modes of separation techniques in IC and reversed-phase IC. The article discusses the detection capabilities of IC, the procedures for preparing solid and liquid samples, as well as the applications of IC.

Identification of alloys using quantitative chemical analysis is an essential step during a metallurgical failure analysis process. There are several methods available for quantitative analysis of metal alloys, and the analyst should carefully approach selection of the method used. The choice of appropriate analytical techniques is determined by the specific chemical information required, the condition of the sample, and any limitations imposed by interested parties. This article discusses some of the commonly used quantitative chemical analysis techniques for metals. The discussion covers the operating principles, applications, advantages, and disadvantages of optical emission spectroscopy (OES), inductively coupled plasma optical emission spectroscopy (ICP-OES), X-ray spectroscopy, and ion chromatography (IC). In addition, information on combustion analysis and inert gas fusion analysis is provided.

This article introduces various analytical techniques commonly used in the characterization of organic solids and liquids and discusses the challenges in performing the analysis, with examples. Some general advice in approaching a material analysis is also provided.

This article introduces the fundamental concepts and the essential components of liquid chromatography (LC). It discusses the different modes of LC, such as liquid-solid chromatography, liquid-liquid chromatography, bonded-phase chromatograph, normal-phase chromatography, reversed-phase chromatography, ion-exchange chromatography, ion-pair chromatography, and size-exclusion chromatography. The article also includes a discussion on the qualitative and quantitative analyses and the applications of LC.

This article provides an overview of common analytical tools used as part of the process of providing practical information regarding the causes of a coating problem or failure. The common analytical tools include Fourier transform infrared spectroscopy, differential scanning calorimetry, scanning electron microscopy-energy dispersive X-ray spectroscopy, chromatography, and electrochemical impedance spectroscopy. Test cabinets and standard test environments for laboratory analysis are reviewed. The article describes non-standard simulation testing and case studies of simulated environments for coating failure analysis.

This article is a compilation of definitions of terms related to materials characterization techniques.

This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.

This article is a compilation of terms and definitions related to materials characterization.