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interference microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... Illumination Methods Light Optical Images versus Scanning Electron Microscopy Images of Microstructure Summary Bright-Field Illumination Polarized Light Dark-Field Illumination Nomarski Differential Interference Contrast Comparison of Imaging Modes Polarized Light versus Bright Field...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
.... (c) Differential interference-contrast illumination. (d) Crossed polarized light illumination. As-polished. 200× Fig. 22 Principles of polarized light microscopy Fig. 23 Mechanically twinned hafnium weld. Specimen was attack polished and heat tinted (∼400 °C, or 750 °F). Polarized...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001754
EISBN: 978-1-62708-178-8
... and the morphology of large second-phase particles. Specialized optical metallographic techniques, such as polarized light microscopy and interference microscopy, can add significantly to the information obtained in a microscopic investigation, and interference microscopy can be used to identify height differences...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... can be visualized at the nanometer scale with Nomarski optical interference microscopy. The methods vary in the information they provide in both lateral extent and depth into the surface. In addition, analysis of wear debris and wear particles is performed. Modern test equipment and data...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003797
EISBN: 978-1-62708-177-1
... ( Ref 18 ), and ion etching ( Ref 19 ), as well as chemical etchants other than Murakami's. Each has particular advantages for certain grades and compositions of carbide or for particular imaging methods. Imaging methods other than bright-field optical microscopy include differential interference...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... analysis Magnetic susceptibility Thermo-optical analysis Microscopy Source: Ref 33 Factors influencing thermal analysis Table 4 Factors influencing thermal analysis Test method Measured variable Factors influencing measurement (a) Dilatometry Size or volume Interference...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... current, successful techniques. Methods for preparation of thin foils for transmission electron microscopy are also described in the literature ( Ref 6 , 10 ), but are not reviewed in this article. Differential interference contrast (DIC) illumination is also effective in revealing structure (see...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... microscopy and for ceramics. Wet etching The sample surface has been wetted before immersion into the etching solution. This is important when using color etchants. Wipe etching See swabbing . Source: Ref 1 Colors obtained at various thicknesses of interference films of silver iodide...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... Fig. 1 Collage of micrographs taken from an ultrathin section of an interlayer-modified carbon fiber composite. The morphology of the interlayer area is shown with the use of transmitted-light Hoffman modulation contrast and differential interference contrast (DIC). Reflected-light bright...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006056
EISBN: 978-1-62708-175-7
... Table 2 Methods used to analyze chemical composition Method Analytical basis Characteristics Analysis Atomic absorption spectrometry (AAS) Absorption High matrix interference, low spectral interference, low operation cost, elemental sets fixed by configuration Bulk Direct current...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... is approximately 0.2 μm. However, smaller features—as small as approximately 0.05 μm—can be detected by image contrast enhancement with polarized light, interference contrast, or dark-field illuminations. Fig. 1 Light microscopy image showing the surface texture of stainless steel tubing for needles...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003752
EISBN: 978-1-62708-177-1
.... and Wilson J.E. , The Examination of Metals in Polarized Light , Proc. Am. Soc. Test. Mater. , Vol 38 (Part II) , 1938 , p 315 19. Rosenberger H.E. , Differential Interference Contrast Microscopy , Interpretive Techniques for Microstructural Analysis , Plenum Press , 1977 , p 79...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006116
EISBN: 978-1-62708-175-7
... of the Deformed Metal Layer Grinding and Polishing After Preparation Examination Etching and Interference Layer Deposition Optical Microscopy Techniques Safety Acknowledgment References References 1. Saltykov S.A. , “Stereometric Metallurgy,” Technical Documents Liaison...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006765
EISBN: 978-1-62708-295-2
..., and etching. The influence of microstructures on the failure of a material is discussed and examples of such work are given to illustrate the value of light microscopy. In addition, information on heat-treatment-related failures, fabrication-/machining-related failures, and service failures is provided...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006641
EISBN: 978-1-62708-213-6
...) in conjunction with nanoparticle shape and size information provided by transmission electron microscopy and high-resolution field-emission scanning electron microscopy ( Ref 20 ). A combination of these techniques could be useful in exploring and better understanding the impact of nanoparticles...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... microscopy is applied to high-resolution, high-frequency ultrasonic inspection techniques that produce images of features beneath the surface of a sample. Because ultrasonic energy requires continuity of materials to propagate, internal defects such as voids, inclusions, delaminations, and cracks interfere...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... … S S S S … … Scanning electron microscopy ● … … ● ● … … ● … ● ● … S … ● Secondary ion mass spectroscopy ● … ● ● … … … … ● ● ● S … … … Spark source mass spectrometry ● … ● ● ● ● ● … … ● ● ● … … … Transmission electron microscopy...