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focused ion beam tomography

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
... sectioning, focused ion beam tomography, atom probe tomography, and X-ray microtomography. Nine case studies are presented that represent the work of the various research groups currently working on 3D microscopy using serial sectioning and illustrate the variants of the basic experimental techniques...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005504
EISBN: 978-1-62708-197-9
... Abstract This article reviews the characterization methods for producing 3-D microstructural data sets. The methods include serial sectioning by mechanical material removal method and focused ion beam tomography method. The article describes how these data sets are used in realistic 3-D...
Image
Published: 15 December 2019
Fig. 39 (a) Ion beam and (b) electron beam images of a plasma focused ion beam serial-sectioning tomography acquisition on an aluminum alloy showing key geometric features, including the cross-sectional face, redeposition trench, fiducial marks, and protective pad on the top surface. In (b More
Image
Published: 15 December 2019
Fig. 45 Atom probe tomography sample-preparation workflow using the focused ion beam. See text for description. Courtesy of B. Langelier, Canadian Centre for Electron Microscopy More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... Abstract This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... determination of the surface Atom probe tomography Ellipsometry, mostly used for thin-film thickness measurement The techniques covered in this division are based on probing methods using direct probe contact, electron, ion, photon, thermal, or x-ray interaction between the analytical instrument...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006456
EISBN: 978-1-62708-190-0
... ). To perform the 3-D reconstruction, CT systems require a computing procedure to calculate, locate, and display the point-by-point relative attenuation of the energy beam passing through the testpiece. Fig. 1 Comparison of (a) computed tomography (CT) and (b) radiography. A high-quality digital...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... Abstract Nondestructive testing (NDT), also known as nondestructive evaluation (NDE), includes various techniques to characterize materials without damage. This article focuses on the typical NDE techniques that may be considered when conducting a failure investigation. The article begins...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006637
EISBN: 978-1-62708-213-6
... of measuring small lattice strain and establishes a basis for using planar-channeled focusing for the structural study of interface phenomena, such as impurity location, interface reconstruction, and other structural effects. Fig. 16 Resonance effect (oscillations of the ion beam) in Rutherford...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0006515
EISBN: 978-1-62708-200-6
... perfluoroelastomer L length HVTR high-voltage track rate FGM functionally graded material Hz hertz LAS Li20-AI20 T Si02 system Fig. figure i current (measure of number of electrons) Ib pound I current; emergent intensity FIRE focused infrared energy (welding) Ibf pound-force FKM fluoroelastomer IBAD ion-beam...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005639
EISBN: 978-1-62708-174-0
... (∼10 W). Because highly focusable beam power sources (single-mode fiber lasers and small electron beam welders) of up to ∼1 kW are presently available, quite fast travel speeds should be energetically possible. At 1 kW, still assuming a cubic fusion zone 100 μm on a side and its energy requirement...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005610
EISBN: 978-1-62708-174-0
... and meet the process requirements. On the other hand, the focus coil current setting, which allows the operator to adjust the beam focus position in the weld chamber, is difficult to replicate, due to the manual nature in which the beam focus setting is controlled. During focusing, the strength...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... and images sample surfaces through controlled rastering of a highly focused electron beam across the area of interest. A variety of signals are produced, particularly backscattered and secondary electrons, as the electron beam interacts with the sample surface; these signals provide local topographic...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006478
EISBN: 978-1-62708-190-0
... employed. The transducer is usually positioned close to the part (within an inch at frequencies above 400 Hz and within several inches for lower frequencies), with the beam focused in the part. Figure 9(a) shows the TT method. Figure 10 shows a comparison of a 400 kHz air-coupled inspection and a 5 MHz...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003436
EISBN: 978-1-62708-195-5
... modes. Figure 9 shows the configurations commonly employed. The transducer is usually positioned close to the part (within an inch at frequencies above 400 Hz and within several inches for lower frequencies), with the beam focused in the part. Figure 9(a) shows the TT method. Figure 10 shows...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.9781627081900
EISBN: 978-1-62708-190-0
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... EELS) Not normally Chemical states Depth profiling capability Yes, with ion-beam sputtering No Rarely … No Limited to transparent materials Yes … Not normally Yes, over the top 50 Å Quantification Standards required 10–20 at.%; 1–2 at.% with standards Standardless or pure element...
Series: ASM Handbook
Volume: 23A
Publisher: ASM International
Published: 12 September 2022
DOI: 10.31399/asm.hb.v23A.a0006863
EISBN: 978-1-62708-392-8
... lamination process Directed Energy Deposition Directed energy deposition is the process that creates parts by melting and fusing material as it is deposited. Parts are built layer by layer using a focused laser beam. Raw materials include iron, nickel, metallic powders, and so on. This process...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... be supported by themselves due to their sizes and shapes (e.g., nanoparticles and nanorods), TEM grids with support films made of carbon and silicon nitrides are required ( Fig. 5b ). Grids are typically 3 mm (0.12 in.) in diameter and ~100 μm thick. A focused ion beam (FIB) instrument can also be used...