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focused ion beam tomography

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
... sectioning, focused ion beam tomography, atom probe tomography, and X-ray microtomography. Nine case studies are presented that represent the work of the various research groups currently working on 3D microscopy using serial sectioning and illustrate the variants of the basic experimental techniques...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005504
EISBN: 978-1-62708-197-9
...: Ref 4 Abstract This article reviews the characterization methods for producing 3-D microstructural data sets. The methods include serial sectioning by mechanical material removal method and focused ion beam tomography method. The article describes how these data sets are used in realistic 3...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... Abstract This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... determination of the surface Atom probe tomography Ellipsometry, mostly used for thin-film thickness measurement The techniques covered in this division are based on probing methods using direct probe contact, electron, ion, photon, thermal, or x-ray interaction between the analytical instrument...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... Abstract Nondestructive testing (NDT), also known as nondestructive evaluation (NDE), includes various techniques to characterize materials without damage. This article focuses on the typical NDE techniques that may be considered when conducting a failure investigation. The article begins...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006456
EISBN: 978-1-62708-190-0
... ). To perform the 3-D reconstruction, CT systems require a computing procedure to calculate, locate, and display the point-by-point relative attenuation of the energy beam passing through the testpiece. Fig. 1 Comparison of (a) computed tomography (CT) and (b) radiography. A high-quality digital...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006478
EISBN: 978-1-62708-190-0
... Nondestructive Evaluation , IS-4923, Thompson D.O. and Chimenti D.E. , Ed., Williamsburg, VA , June 1987 73. Smith B.D. , Cone-Beam Tomography: Recent Advances and a Tutorial Review , Opt. Eng. , Vol 29 ( No. 5 ), May 1990 10.1117/12.55621 74. Boyd J.E...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003436
EISBN: 978-1-62708-195-5
... at up to 50 cm/s (20 in./s) surface speed. Squirters are used up to 100 cm/s (40 in./s). Cannot effectively use focused transducers Can only be used in PE mode Not effective for parts with complex shapes Limited penetration capability Capabilities of computed tomography for NDE...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... EELS) Not normally Chemical states Depth profiling capability Yes, with ion-beam sputtering No Rarely … No Limited to transparent materials Yes … Not normally Yes, over the top 50 Å Quantification Standards required 10–20 at.%; 1–2 at.% with standards Standardless or pure element...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.9781627081900
EISBN: 978-1-62708-190-0
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006378
EISBN: 978-1-62708-192-4
... theoretical approaches. New methods of analysis offer significant opportunities to further our understanding. A variety of new technologies have been applied in materials characterization: electron backscatter diffraction analysis, focused ion beam tomography, x-ray computed tomography, and three...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005639
EISBN: 978-1-62708-174-0
... , 1995 , p 407 57. Stevie F.A. , Irwin R.B. , Shofner T.L. , Brown S.R. , Drown J.L. , and Giannuzzi L.A. , Plan View TEM Sample Preparation Using the Focused Ion Beam Lift-Out Technique , AIP Conf. Proc. , Vol 449 , 1998 , p 868 58. Reyntjens S...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... , 10.3139/147.110148 54. Giannuzzi L.A. and Stevie F.A. , Ed., Introduction to Focused Ion Beams , Springer US , Boston, MA , 2005 10.1007/b101190 55. Sun C. , Müller E. , Meffert M. , and Gerthsen D. , On the Progress of Scanning Transmission Electron...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005610
EISBN: 978-1-62708-174-0
.... , Goumeniouk A. , Nazarenko O.K. , and Akopjantz K.S. , Mathematical Simulation of the Influence of Ion-Compensation, Self-Magnetic Field and Scattering on an Electron Beam during Welding , Vacuum , Vol 62 , 2001 , p 87 – 96 10.1016/S0042-207X(00)00433-4 4. Arata Y...
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.a0006574
EISBN: 978-1-62708-290-7
... to crystallographic texture and grain structure; understand the path of plastic deformation Focused ion beam ( Ref 1 , 7 ) Investigate the grain structure via channeling contrast Transmission electron microscopy ( Ref 1 , 7 , 42 ) Probe local changes in dislocation density and the formation of subgrain...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.9781627082907
EISBN: 978-1-62708-290-7
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.a0006570
EISBN: 978-1-62708-290-7
... with controlled parameters can also be used for surface micromachining or polishing. Inert gas should be used to minimize surface oxidation of the workpiece. Processing parameters include laser power, beam feed rate, focused beam diameter, focal offset, and beam offset ( Fig. 22 ). The beam offset, or hatching...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
... begun on avoiding the need for time focusing ( Ref 15 ). Every neutron diffraction instrument is comprised of four main components: Neutron source, either constant wavelength or TOF Properly conditioned neutron beam in terms of size, divergence, and spectral distribution Sample stage...
Series: ASM Handbook
Volume: 4E
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.hb.v04e.a0006262
EISBN: 978-1-62708-169-6
... and Re-Aged) 7150 Aluminium Alloy , Z. Metallke. , Vol 85 , 1994 , p 134 – 139 29. Warren P.J. , Grovenor C.R.M. , and Crompton J.S. , Field-Ion Microscope/Atom-Probe Analysis of the Effect of RRA Heat Treatment on the Matrix Strengthening Precipitates in Alloy Al-7150 , Surf...