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Image
Single-crystalline copper sample gallium focused ion beam milled to create ...
Available to PurchasePublished: 15 December 2019
Fig. 42 Single-crystalline copper sample gallium focused ion beam milled to create cantilevers for testing. Reprinted with permission from Ref 70
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Image
A single magnesium alloy powder particle showing the focused ion beam milli...
Available to PurchasePublished: 30 September 2015
Fig. 4 A single magnesium alloy powder particle showing the focused ion beam milling technique to achieve 100 nm thickness for electron transparency for TEM. Courtesy of University of Central Florida
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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... is presented. ion beam interaction focused ion beam imaging focused ion beam milling Overview Introduction Focused ion beam (FIB) instruments can be thought of as the tools that can help humans to see, manipulate, and analyze matter at the smallest length scales. At the most fundamental...
Abstract
This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses the essential components, and explains their function only to the extent that it helps the operator obtain the desired results. An explanation of how the components of ion optical column shape and steer the ion beam to the desired target locations is then provided. The article also reviews the many diverse accessories and options that enable the instrument to realize its full potential across all of the varied applications. This is followed by a detailed analysis of the physical processes associated with the ion beam interacting with the sample. Finally, a complete survey of the most prominent FIB applications is presented.
Book: Fractography
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 June 2024
DOI: 10.31399/asm.hb.v12.a0006847
EISBN: 978-1-62708-387-4
... replicas and the site-specific FIB thin-foil preparation technique. It provides an overview of FIB-TEM specimen preparation. focused ion beam milling fractographs replica technique specimen preparation transmission electron microscopy FRACTOGRAPHY is an important research area for providing...
Abstract
The introduction of focused ion beam (FIB) microscopy in the 1990s added the capability of studying fracture surfaces in the third dimension and making site-specific and stress-free transmission electron microscope (TEM) specimens in situ. This article reviews the methods for preparing replicas and the site-specific FIB thin-foil preparation technique. It provides an overview of FIB-TEM specimen preparation.
Book Chapter
Bulk and Surface Characterization of Powders
Available to PurchaseBook: Powder Metallurgy
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., showing the dark B 4 C phase dispersed within agglomerates. Courtesy of University of Central Florida To analyze powders using a transmission electron microscope (TEM), the powder is attached to a TEM grid and thinned to electron transparency by focused ion-beam milling (FIB). Figure 4 shows...
Abstract
This article discusses the capabilities and limitations of various material characterization methods that assist in the selection of a proper analytical tool for analyzing particulate materials. Commonly used methods are microanalysis, surface analysis, and bulk analysis. The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques, such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed.
Image
(a) Typical focused ion beam (FIB) and scanning electron microscope (SEM) g...
Available to PurchasePublished: 15 December 2019
Fig. 37 (a) Typical focused ion beam (FIB) and scanning electron microscope (SEM) geometry for producing a cross section. (b) Cross section of a spherical particle from an iron powder. SEM image nicely shows the surface newly exposed by FIB milling. Courtesy of Tescan Orsay Holding, a.s.
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(a) Forescattered electron micrograph of iron surface before oxidation. (b,...
Available to PurchasePublished: 15 December 2019
Fig. 45 (a) Forescattered electron micrograph of iron surface before oxidation. (b, c) Environmental scanning electron microscope/secondary electron micrographs during oxidation. (d) Secondary electron micrograph of focused ion beam (FIB)-milled cross section showing oxide scale thickness
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Image
Step-by-step transmission electron microscope (TEM) H-bar lift-out techniqu...
Available to PurchasePublished: 01 June 2024
Fig. 10 Step-by-step transmission electron microscope (TEM) H-bar lift-out technique from a fracture surface. (a) Scanning electron microscope identification of crack-initiation point. Original magnification: 2500×. (b) Focused ion beam (FIB) deposits platinum to protect the region of interest
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Book Chapter
Three-Dimensional Microstructure Representation
Available to PurchaseSeries: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005504
EISBN: 978-1-62708-197-9
... its publication. Due to space limitations, this section focuses exclusively on experimental characterization methods involving serial-sectioning-based 3-D reconstructions centered about sequential planar milling (by either mechanical or ion beam methods); other sections of this article describe how...
Abstract
This article reviews the characterization methods for producing 3-D microstructural data sets. The methods include serial sectioning by mechanical material removal method and focused ion beam tomography method. The article describes how these data sets are used in realistic 3-D simulations of microstructural evolution during materials processing and materials response. It also explains how the 3-D experimental data are actually input and used in the simulations using phase-field modeling and finite-element modeling.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
.... Secondary Ion Mass Spectroscopy (SIMS) Secondary ion mass spectroscopy (SIMS) directs a finely focused beam of energetic ions onto the sample surface, then it collects and analyzes the ionized atoms or clusters of atoms ejected from the sample surface by this beam. Information can be obtained...
Abstract
This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe.
Book Chapter
Glossary of Terms: Materials Characterization
Available to PurchaseSeries: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... or volumetric analysis. Bur- concerned and the energy levels involved. ity of light. ets are usually made from uniform-bore glass tubing in capacities of 5 to 100 mL, charging. In scanning electron microscopy blank. The measured value obtained when a the most common being 50 mL. See also and focused ion beam...
Abstract
This article is a compilation of terms and definitions related to materials characterization.
Book Chapter
Three-Dimensional Microscopy
Available to PurchaseSeries: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
... sectioning, focused ion beam tomography, atom probe tomography, and X-ray microtomography. Nine case studies are presented that represent the work of the various research groups currently working on 3D microscopy using serial sectioning and illustrate the variants of the basic experimental techniques...
Abstract
Three-dimensional microscopy can be used to reveal the shape, distribution, and connectivity of three-dimensional (3D) features that lie buried within an opaque material. This article discusses several experimental techniques that can be used to generate 3D images. These include serial sectioning, focused ion beam tomography, atom probe tomography, and X-ray microtomography. Nine case studies are presented that represent the work of the various research groups currently working on 3D microscopy using serial sectioning and illustrate the variants of the basic experimental techniques. The article also discusses the techniques for reconstruction and visualization of 3D microstructures with advanced computer software and hardware.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... adjacent to the hole are frequently thin enough to be electron transparent. If electropolishing or ion milling are continued too long, the thin electron transparent sections adjacent to the hole will be removed and the remaining material will likely be too thick to be penetrated by the electron beam...
Abstract
Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection threshold and precision, limitations, sample requirements, and the capabilities of related techniques.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001737
EISBN: 978-1-62708-178-8
... beam to evaporate a small amount of any material, regardless of its electrical conductivity. In this process, a certain number of ions are formed that can be accelerated into a mass spectrometer. The most common arrangement combines a neodymium-doped yttrium-aluminum-garnet (Nd:YAG) laser focused...
Abstract
Spark source mass spectrometry (SSMS) is an analytical technique used for determining the concentration of elements in a wide range of solid samples, including metals, semiconductors, ceramics, geological and biological materials, and air and water pollution samples. This article discusses the basic principles of spark source technique; SSMS instrumentation such as ion source, electric sector, and magnetic sector; sample preparation; and test procedures of SSMS. Some of the related techniques to SSMS are laser ionization mass spectrometry and laser-induced resonance ionization mass spectrometry. The ions produced in SSMS are detected by either the photometric method or electrical detection method and quantitatively measured by techniques such as internal standardization techniques, isotope dilution, multi element isotope dilution, and dry spike isotope dilution. The detected spark source spectrum contains all the elemental data of the tested sample. Finally, the article exemplifies the applications of SSMS.
Book
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Book Chapter
Imaging Methods for Fracture Surface Observation and Interpretation
Available to PurchaseBook: Fractography
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 June 2024
DOI: 10.31399/asm.hb.v12.a0006945
EISBN: 978-1-62708-387-4
... contrast DNG digital negative DOF depth of field DPI dots per inch DSLR digital single-lens reflex camera dual-beam SEM SEM with ion guns for milling, plating, and imaging EBSD electron backscattered diffraction EDX energy-dispersive x-ray analysis EPS Encapsulated...
Abstract
This article presents a basic overview of technology-driven advances in the imaging of primarily metallic fracture surfaces. It describes various types of microscopes, including scanning electron, dual-beam, ion source, and transmission electron microscopes, and their capabilities. It also covers other useful hardware, such as computer-aided tomography (CAT) and micro-computer-aided tomography (micro-CAT) instruments. The article introduces some of the fracture image postprocessing methods and software, including image registration or alignment, focus stacking, Z-stacking, focal plane merging, and image stitching.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... as analytical electron microscopy (AEM). In one specific operational configuration, the electron beam is focused to a fine probe and scanned over the thin specimen, generating an image on a cathode-ray tube (CRT) in a manner similar to that of a scanning electron microscope. In this configuration...
Abstract
Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can be solved, at least in part, with AEM.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... and images sample surfaces through controlled rastering of a highly focused electron beam across the area of interest. A variety of signals are produced, particularly backscattered and secondary electrons, as the electron beam interacts with the sample surface; these signals provide local topographic...
Abstract
This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents the details of SEM-based techniques and specialized SEM instruments. It ends with example applications of various SEM modes.
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003681
EISBN: 978-1-62708-182-5
... Abstract Surface modification is the alteration of the surface composition or structure using energy or particle beams. This article discusses two different surface modification methods. The first, ion implantation, is the introduction of ionized species into the substrate using kilovolt...
Abstract
Surface modification is the alteration of the surface composition or structure using energy or particle beams. This article discusses two different surface modification methods. The first, ion implantation, is the introduction of ionized species into the substrate using kilovolt to megavolt ion accelerating potentials. The second method, laser processing, is high-power laser melting with or without mixing of materials precoated on the substrate, followed by rapid melt quenching. The article also describes the advantages and disadvantages of the surface modification approach to promote corrosion resistance.
Book Chapter
Surface Examination and Analysis of Plastics
Available to PurchaseSeries: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... causes an electron to experience a radial force when passing through the magnetic field. The focusing is controlled by the objective lens as a result of increasing or decreasing the current passing through the coil copper windings. The condenser lens controls the beam intensity for a selected objective...
Abstract
This article discusses the operating principles, advantages, and limitations of scanning electron microscopy, atomic force microscopy, x-ray photoelectron spectroscopy, and secondary ion mass spectroscopy that are used to analyze the surface chemistry of plastics.
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