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focused ion beam imaging

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Published: 15 December 2019
Fig. 48 Helium focused ion beam image of graphene supported by gallium nitride pillars. Courtesy of M. Latzel, M. Heilmann, G. Sarau, and S.H. Christiansen, Max Planck Institute for the Science of Light, Erlangen, Germany More
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Published: 15 December 2019
Fig. 51 Cesium focused ion beam images of pencil lead taken with a 20 μm field of view with a foreign particle at the center. The secondary electron image (a) offers topographic information, while the positive secondary ion image (b) provides striking contrast arising from the compositional More
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Published: 15 December 2019
Fig. 39 (a) Ion beam and (b) electron beam images of a plasma focused ion beam serial-sectioning tomography acquisition on an aluminum alloy showing key geometric features, including the cross-sectional face, redeposition trench, fiducial marks, and protective pad on the top surface. In (b More
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Published: 15 December 2019
Fig. 26 (a) Secondary electron yield increases dramatically for glancing angles because an appreciable fraction of the collision cascade is near the surface. (b) The resulting focused ion beam image shows these edges as bright, making the topography of the sample easily recognized. More
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Published: 01 August 2013
Fig. 10 High-resolution images of focused ion beam (FIB)-sectioned powder particles. (a) Scanning electron microscope/scanning electron detector image. (b) FIB-charged device model image. Source: Ref 4 More
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Published: 31 December 2017
Fig. 5 Scanning electron microscopy images of a focused ion beam cross-sectioned electroplating sample prepared from (a) low current density plating of gold, resulting in large, dense grain deposits on top of the porous rhenium, and (b) high current density plating of gold, resulting in small More
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Published: 15 December 2019
Fig. 42 Focused ion beam cross section of the defect. (a) Secondary electron image. (b) Color Auger images of silicon in the oxide form (red), silicon in the elemental form (green), and tungsten (blue). Courtesy of Physical Electronics, USA More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... is presented. ion beam interaction focused ion beam imaging focused ion beam milling Overview Introduction Focused ion beam (FIB) instruments can be thought of as the tools that can help humans to see, manipulate, and analyze matter at the smallest length scales. At the most fundamental...
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Published: 15 June 2020
Fig. 7 (a) Schematic of the fabrication of battery electrodes; mg, force of gravity on the drops (b) formation of the microlattice in 3D (c) scanning electron microscopy images of 3D-printed Li-ion electrode lattices and focused ion beam (FIB) image of porosity. Source: Ref 24 . More
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Published: 01 November 2010
( Fig. 14a ) from a dual-beam focused ion beam-scanning electron microscope. Source: Ref 1 More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
..., the quadrupole mass spectrometer and the ion detector are very standard. Dedicated SIMS Instrument A dedicated SIMS instrument often incorporates a more intense, finely focused primary ion beam suitable for probe imaging. Because it is unnecessary to provide the flexibility for performing analyses...
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Published: 15 December 2019
Fig. 63 MoSi 2 metal layers repaired by and imaged with an advanced gas field ion source focused ion beam instrument dedicated to mask repair. Adapted from Ref 143 . Reprinted with permission from SPIE and from F. Aramaki and T. Kozakai More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
..., finely focused primary ion beam suitable for probe imaging. Because it is unnecessary to provide the flexibility for performing analyses by Auger electron spectroscopy (AES) or x-ray photoelectron spectroscopy (XPS) in this type of instrument, sample orientation and the ion-collection system can also...
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Published: 31 December 2017
Fig. 8 Scanning electron microscopy images of a chromium electrodeposit on steel with uniform thickness, following the base material morphology. (a) Surface image of a sulfate-catalyst (Sargent bath)-deposited chromium film. Source: Ref 10 , with permission. (b) Focused ion beam cross More
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Published: 15 December 2019
Fig. 47 Aluminum posts on silicon substrate images by (a) scanning electron microscope (SEM) and (b) helium focused ion beam (FIB). The helium image offers surface-specific information, while the SEM-sample interaction produces a mix of surface and deeper information. More
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Published: 01 December 2004
Fig. 30 A low-magnification secondary electron image of an area sectioned using a focused ion beam More
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Published: 15 December 2019
Fig. 52 Hydroxyapatite minerals on a polymer substrate imaged with the (a) scanning electron microscope and (b) helium focused ion beam More
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Published: 15 December 2019
Fig. 23 Transmission Kikuchi diffraction maps of a worn nickel surface obtained at 30 kV by using the conventional arrangement and a 3 nm step size. (a) Scanning transmission electron microscope image of the thin focused-ion-beam-prepared sample. (b) Band contrast image of a small region More
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Published: 15 December 2019
Fig. 36 (a) Typical focused ion beam (FIB)/sample orientation for top-down delayering. (b) FIB image of newly exposed surface More
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Published: 15 December 2019
Fig. 43 H-bar geometry for transmission electron microscope (TEM) sample preparation. FIB, focused ion beam. Inset image courtesy of Fibics Incorporated, Ottawa, Canada More