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fluorescence microscopy

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Published: 12 September 2022
Fig. 19 Fluorescence microscopy (live/dead assay of encapsulated chondrocytes in alginate gels) images of (a–d) single layer (alginate gel and PCL), (e–h) single layer (alginate gel and PCL) + one stacking layer of PCL, (i–l) alginate gel and PCL hybrid scaffold (3 by 3 by 1.8 mm). (a, e, i More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
...-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical...
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Published: 12 September 2022
Fig. 14 Histological sections of tissue-engineered skin constructs in vitro. Sections show cells using fluorescent microscopy and Masson’s trichrome staining, respectively. The keratinocytes (HaCaT-mCherry) exhibit red fluorescence while the fibroblasts (NIH 3T3-eGFP) appear in green (a–c More
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
...-fluorescence. The article also provides information on transmitted light microscopy. composite materials epi-bright-field illumination epi-dark-field illumination epi-fluorescence epi-polarized light failure analysis illumination methods mounting polishing quality control reflected light...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
...-light techniques. The reflected-light optical microscopy techniques that were used to enhance the contrast and show the morphology include the sample as polished, chemically etched, and using epi-fluorescence. All of these techniques were performed on the same cross section. In the as- polished...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... electron microscopy; XRF, x-ray fluorescence; XPS, x-ray photoelectron spectroscopy; WDS, wavelength dispersion spectrometry; Z , atomic number; TEM, transmission electron microscopy. Source: Ref 8 X-Ray Fluorescence Spectrometry (XRFS) X-ray fluorescence spectrometry (XRFS) is an instrumental...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009081
EISBN: 978-1-62708-177-1
... Abstract This article describes methods for analyzing impact-damaged composites in the aircraft industry. These include C-scan and x-radiography methods and optical microscopy. The article reviews brittle-matrix composite and tough-matrix composite failures. It explains the different types...
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Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
Image
Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of metals and alloys. AES: Auger electron spectroscopy; AFM: atomic force microscopy; COMB: high-temperature combustion; EDS: energy-dispersive x-ray spectroscopy; EFG: elemental and functional group analysis; EPMA: electron probe x More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... Abstract Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... or sectioning for scanning electron microscopy examination and/or metallography. It is important to photograph the component at each stage of the process to retain the visual information available and the component condition at each step. Field Photographic Documentation Composition Photographic...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009072
EISBN: 978-1-62708-177-1
... of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The viewing of dyed specimens is discussed in the article, “Viewing the Specimen Using Reflected-Light Microscopy,” in this Volume. Molds for Mounting Composite Materials The molds used...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009079
EISBN: 978-1-62708-177-1
... Abstract This article describes the microcrack analysis of composite materials using bright-field illumination, polarized light, dyes, dark-field illumination, and epi-fluorescence. bright-field illumination composite materials dark-field illumination dyes epi-fluorescence microcrack...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... Acronyms: Techniques APM atom probe microanalysis AAS atomic absorption spectrometry AEM analytical electron microscopy AES Auger electron spectroscopy; atomic emission spectrometry AFS atomic fluorescence spectrometry ATEM analytical transmission...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009085
EISBN: 978-1-62708-177-1
... will allow sectioning through the center of the strike and thus hold the fragile material in place, minimizing artifacts. The specimen can be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... Abstract This article outlines the beam/sample interactions and the basic instrumental design of a scanning electron microscopy (SEM), which include the electron gun, probeforming column (consisting of magnetic electron lenses, apertures, and scanning coils), electron detectors, and vacuum...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... Information obtained/method Elemental Structural Morphological Bulk X-ray fluorescence spectroscopy (XRF) Optical emission spectroscopy (OES) Combustion/inert fusion analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron microscopy (SEM) Electron probe...