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fluorescence microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi-fluorescence. The article also provides information on transmitted light microscopy. References References 1. Mallick P.K. , Fiber-Reinforced Composites, Materials...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
...Abstract Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... electron microscopy; XRF, x-ray fluorescence; XPS, x-ray photoelectron spectroscopy; WDS, wavelength dispersion spectrometry; Z , atomic number; TEM, transmission electron microscopy. Source: Ref 8 X-Ray Fluorescence Spectrometry (XRFS) X-ray fluorescence spectrometry (XRFS) is an instrumental...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
... formed from the same material, a dye was applied to the sample surface and viewed using epi-fluorescence. First, the sample was immersed in a solution of Rhodamine B dye (see the article, “Viewing the Specimen Using Reflected-Light Microscopy,” for dyes). The sample was then ultrasonically cleaned...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009079
EISBN: 978-1-62708-177-1
... after the application of a fluorescing dye (Magnaflux Zylgo, Magnaflux Corp.) and epi-fluorescence. (a) Bright-field illumination, 10× objective, with an inset showing the crack using epi-fluorescence. (b) Epi-fluorescence, 390–440 nm excitation, 25× objective Fig. 12 Intraply microcracks...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009081
EISBN: 978-1-62708-177-1
... epoxy casting resin. The use of epi-bright-field illumination does not allow the dye to fluoresce, and therefore, the cracks are hard to distinguish. Bright-field montage, 5× objective Fig. 4 Impact damage of a carbon fiber composite material that has a toughened matrix. (a) Montage...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... copystand setup. (b) Resulting fiber optic ring light photograph of a fatigue fracture Fig. 11 Fracture surface fluorescent lighting. (a) Single-side fluorescent copystand lighting setup. (b) Resulting single-side fluorescent lighting photograph of a fatigue fracture Fig. 12 Fracture...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009072
EISBN: 978-1-62708-177-1
... of the microscope used. The polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The viewing of dyed specimens is discussed in the article, “Viewing the Specimen Using Reflected-Light...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... the precision of the quantitative analytical results. Nonconductive samples or samples with marginally conductive surface regions must be coated with a thin layer of conductive material, typically carbon. X-Ray Fluorescence Spectroscopy (XRF) Transmission Electron Microscopy (TEM) Scanning Auger...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... fluorescence spectroscopy (XRF) provides bulk elemental analysis. X-ray fluorescence spectroscopy instruments equipped with fine beam and x-y scanning capabilities provide elemental mapping on much larger samples but with much poorer spatial resolution. Transmission electron microscopy (TEM) provides...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009085
EISBN: 978-1-62708-177-1
... handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including the type of lightning strike...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... Acronyms: Techniques APM atom probe microanalysis AAS atomic absorption spectrometry AEM analytical electron microscopy AES Auger electron spectroscopy; atomic emission spectrometry AFS atomic fluorescence spectrometry ATEM analytical transmission...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
...–1000 nm Specimen current No external detector necessary Complementary contrast to backscattered plus secondary electron signal Same as backscattered electrons Same as backscattered electrons Characteristic x-rays (primary fluorescence) Semiconductor detector (energy-dispersive) or crystal...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
..., semiconductors Table 1 Inorganic solids: metals, alloys, semiconductors Wet analytical chemistry, electrochemistry, ultraviolet/visible absorption spectroscopy, and molecular fluorescence spectroscopy can generally be adapted to perform many of the bulk analyses listed. ● = generally usable; N...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
.... Although the experiment is very simple, a coherent source is required to detect the interference. Fig. 40 Multilayer isotropic coatings (TRISO) fuel element. After Ref 61 Fig. 41 Key elements of an x-ray fluorescence tomography arrangement. I 0 monitor measures the incident-beam...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
.... Fig. 6 (a) There are three parts to a probe used in a light lever atomic force microscope (AFM). They are the chip, cantilever, and tip. (b) Scanning electron microscopy image of a microfabricated tip used in an AFM Fig. 7 A 2 × 2 μm vibrating-mode image of a biaxially oriented...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005655
EISBN: 978-1-62708-198-6
... in surface roughness is linked to an increased degree of resorption of a bioceramic ( Ref 77 ). As a result, the extent of resorption can be measured by microscopic observation of the surface, using analyses such as scanning electron microscopy, confocal and fluorescent microscopy, contact and laser...