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energy-filtered transmission electron microscopy

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Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of metal powders, surface analysis should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006387
EISBN: 978-1-62708-192-4
... microscopy scanning electron microscopy transmission electron microscopy wear measurement FRICTION leads to energy dissipation and wear, which can cause device failure, resulting in massive economic and environmental costs. Therefore, it is crucial to detect the wear mechanism and to develop new...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... in the early 2000s by developing improved optics, that is, aberration correctors. The resolution is now as good as 0.5 Å in aberration-corrected TEM instruments ( Ref 3 ), as shown in Fig. 4 . Transmission Electron Microscopy Specimens: Dimensions Much higher-energy electrons are used in TEM compared...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... a sam- bombardment. See also neutron activation analytical electron microscopy (AEM). ple due to regions of different mass den- analysis. The technique of materials analysis in the sity and thickness. transmission electron microscope adsorption chromatography. Chromatog- equipped to detect and quantify...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006456
EISBN: 978-1-62708-190-0
... demonstrated with a number of different types of energy beams, such as ultrasound, electrons, protons, α-particles, lasers, and microwaves. In industrial nondestructive evaluations (NDEs), however, only x-ray computed tomography (XCT) is considered to have widespread value. For this reason, XCT is also...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... microscope) of the sample by scanning an electron beam over a raster and analyzing the various signals generated. The scanning transmission electron microscope is closely related to the conventional transmission electron microscope and is discussed in the article “Analytical Transmission Electron Microscopy...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003757
EISBN: 978-1-62708-177-1
... to microscopy of materials. The article describes the basic concepts of sampling and resolution and quantization of light microscopy, scanning electron microscopy, and transmission electron microscopy. It discusses the acquisition of a digital image that accurately represents the sample under observation...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... be solved, at least in part, with AEM. analytical electron microscopes analytical transmission electron microscopy bright-field microscopy data analysis defect analysis deformation dislocations electron diffraction electron energy loss spectroscopy electron guns grain-boundary segregation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... arrows). STEM, scanning transmission electron microscopy; DF, dark field; BF, bright field Another common method for BE detection in this geometry is using semiconductor-based solid-state detectors, which are often segmented so the BE signal to different regions of the detector can be isolated...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... elastic scattering (diffraction) from a given set of crystal planes into cones of intensity, with the cone axis normal to the diffraction plane. Because the Bragg angle for the diffraction of low- to medium-energy electrons is on the order of 2°, the apex semiangle of the cone is 90° minus the Bragg angle...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
..., practices, and instrumentation developments are common to electron microscopy and electron microprobe analysis. Electromagnetic Radiation Electromagnetic radiation is an energy form that may be propagated through space and may interact with atoms and molecules to alter their energy state. Both...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... that magnify images obtained by the transmission or reflection of either light or electrons. The choice of method depends on several factors, such as the type of specimen and the imaging requirements. For example, reflected light microscopy is common in the imaging of metallic microstructures, while...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 2024
DOI: 10.31399/asm.hb.v12.a0006847
EISBN: 978-1-62708-387-4
... Abstract The introduction of focused ion beam (FIB) microscopy in the 1990s added the capability of studying fracture surfaces in the third dimension and making site-specific and stress-free transmission electron microscope (TEM) specimens in situ. This article reviews the methods for preparing...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... conditions), thus bridging the gap between optical (light) microscopy and transmission electron microscopy. In addition to the higher lateral resolution, SEM also has a much greater depth of field compared to optical microscopy, due to the small size of the final lens aperture and the small working distance...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
... spectrometers. Various electrostatic energy filters are available for use with quadrupoles, including grids, apertures, Bessel boxes, and spherical or hemispherical plates ( Ref 10 ); the collection efficiency, selectivity, resolution, and transmission of these filters vary and will influence the overall...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... method is the bombardment of a target element with high-energy electrons. This method requires a vacuum to avoid energy loss of the electron beam. In scanning electron microscopy (SEM) and electron microprobe analysis, for example, an electron beam impinges directly on the sample in a vacuum chamber...
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006970
EISBN: 978-1-62708-439-0
... microscopy; AEM, analytic electron microscopy; LM, light microscopy; TEM, transmission electron microscopy; MQD, multiplex-quadrature detection; DSC, differential scanning calorimetry; SEM, scanning electron microscopy; EDS, energy-dispersive spectroscopy. Source: Ref 13 Using a materials by design...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... transmission electron microscopy) in the same FIB-SEM instrument. There also are specialized stages that offer long-range nanometer accuracy in X , Y positioning through the use of laser interferometers. Such precision is essential for lithographic applications when multiple write fields must be matched...