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energy-dispersive X-ray spectrophotometry

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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
..., which is scattering from a crystal, or energy dispersion, which involves direct conversion of x-ray energy into electronic pulses in silicon or germanium diodes. Scientists in various fields are continuously finding new uses for PIXE. From polymer testing and failure analysis to deformulation...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
..., to create inner electron shell vacancies. Regarding detection, the most widely used methods involve wavelength dispersion, which is scattering from a crystal, or energy dispersion, which involves direct conversion of x-ray energy into electronic pulses in silicon or germanium diodes. These methods all...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
... generates signals proportional to the absorbance, A, and the transmittance T. The output is usually displayed as a function of wavelength on an x - y plotter or a strip-chart recorder. Fig. 11 Block diagram of a double-beam spectrophotometer. Because a double-beam instrument continuously...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006939
EISBN: 978-1-62708-395-9
...: styrene maleic anhydride (SMA) The thin bilayer film of SMA/SAN was attached to the PA, and then the interfacial thickness was measured. Compatibilizer increases the interfacial thickness from 2 to 30 nm. 106 Small-angle x-ray scattering Direct method for the measurement of interfacial layer...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006360
EISBN: 978-1-62708-192-4
...-edge ( Ref 8 , 16 ) as well as radial distribution function analysis of amorphous matrix phases using extended energy-loss fine structure (EXELFS) methods ( Ref 28 ). X-ray photoelectron spectroscopy is very surface sensitive and is particularly useful for evaluating alloyed DLC films for composition...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... magnifications attainable, typically 5000 to 10,000├Ś. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray spectroscopes (EDS). Chemical analysis can be helpful in confirming...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... of detector was developed that, with no moving parts, could simultaneously count and determine the energy of the x-rays ( Fig. 6 ). These detectors are the ones used for EDS modules on SEM devices. Fig. 5 Schematic diagram of the components of a wavelength-dispersive x-ray spectrometer Fig. 6...