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elemental mapping

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Published: 01 December 1998
Fig. 11 Electron microprobe elemental map showing distributions of elements in stranded wire soldered to a terminal pin. (a) Backscattered electron image. (b–h) Elemental maps showing locations and concentrations of iron, nickel, copper, silver, tin, gold, and lead, respectively. Source: Ref More
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Published: 01 January 1986
Fig. 17 Photographs of the SEM image (a) and seven element maps taken over an area chosen to include a terminal pin, the wires wrapped around it, and the solder joining them. (b) Iron, 55 wt%. (c) Nickel, 27 wt%. (d) Copper, 97 wt%. (e) Silver, 10 wt%. (f) Tin, 84 wt%. (g) Gold, 20 wt%. (h More
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Published: 01 January 2006
Fig. 8 Scanning electron microscopy image and elemental maps of scale on 310 (UNS S31000) stainless steel after 17,000 h exposure in a syngas cooler. (a) Backscattered electron image. (b) Oxygen map. (c) Sulfur map. (d) Chlorine map. (e) Chromium map. (f) Iron map distribution More
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Published: 01 January 2006
Fig. 22 Elemental maps obtained by energy-dispersive spectroscopy of the high-copper amalgam shown in Fig. 21 . (a) Energy-dispersive spectroscopy (EDS) mapping for silver. (b) EDS mapping for mercury. (c) EDS mapping for tin. (d) EDS mapping for copper More
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Published: 15 January 2021
Fig. 14 Elemental maps showing areas of sulfur-rich and iron-rich scale on a corroded steel pipe. BEI, backscattered electron imaging More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... analysis for complex compositions, and significance of standardless analysis in the EDS software. It ends with a section on the processes involved in elemental mapping for major and minor constituents. electron probe X-ray microanalysis energy dispersive spectrometry wavelength dispersive...
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Published: 01 January 2006
Fig. 5 Composition of the electrochemical migration product of the capacitor shown in Fig. 4 . Energy-dispersive x-ray analysis elemental maps are Ba, Ti, O, Sn, and Ni. These maps show the presence of tin electrochemical migration between the terminations and exposure of the nickel barrier More
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Published: 01 January 2006
Fig. 2 Corrosion of gold-plated connector along with energy-dispersive x-ray analysis elemental maps of Au, Cu, O, Ni, and Cl More
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Published: 15 December 2019
, hexagonal close-packed. (b) Backscattered electron micrograph of the region highlighted by dotted lines in (a). White circles in (b) denote iron-depleted and chromium-rich regions, as confirmed by (c), which is EDS elemental mapping. Reprinted from Ref 58 under a Creative Commons Attribution 4.0 More
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Published: 15 January 2021
Fig. 34 (a) Photograph of fractured austenitic stainless steel cross-linked polyethylene clamp. Box identifies a crack branch. (b) Elemental maps for chlorine and zinc are of the area identified with a box in (a). More
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Published: 01 January 2005
Fig. 12 Polished cross section showing microstructure for sintered SiC (boron, carbon additives) plus one-time deposition of Na 2 CO 3 as a source of Na 2 O after 48 h at 1000 °C (1830 °F) in 0.1% CO 2 /O 2 . The elemental maps indicate a layered Na 2 O · x(SiO 2 )/SiO 2 /SiC structure More
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Published: 31 December 2017
Fig. 8 (a, b) Transmission electron microscope imaging and (c) energy-dispersive spectroscopy element mapping on the cross section of the near-surface zone of a cast iron worn surface lubricated by SAE 5W-30 engine oil. (b) and (c) correspond to the dash line box and dot line box, respectively More
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Published: 09 June 2014
Fig. 21 Pyramidal elements made to connect mapped mesh with tetrahedral elements More
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Published: 01 January 2002
Fig. 5 X-ray elemental composition maps made with the electron microprobe of a copper penetration crack in a failed locomotive axle. 270× More
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Published: 01 January 2002
Fig. 9 X-ray elemental dot maps for copper and tin taken at three typical areas exhibiting penetration of the bearing elements. The three regions shown in the specimen current images (left) were quantitatively analyzed for copper and tin; results are given under the concentration maps. All 320× More
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Published: 01 January 2002
Fig. 18 X-ray elemental composition maps made with the electron microprobe using a region of copper penetration shown in Fig. 16 and 17 . All 270× More
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Published: 01 December 1998
Fig. 5 Scanning Auger mapping of elements, including some of low atomic number, in a foreign particle on an integrated circuit. Note also the ability to distinguish between elemental silicon and silicon oxide due to bonding effects on Auger energies. (a) Secondary electron image of particle More
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Published: 15 January 2021
Fig. 6 X-ray elemental composition maps made with the electron microprobe of a copper penetration crack in a failed locomotive axle. Original magnification: 270× More
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Published: 01 December 2004
Fig. 31 X-ray dot maps showing the chemical elements in each constituent of a similar roll as in Fig. 30 . BEI, backscattered electron image. Original magnification 1000× More
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... the x-ray detector to the display system of an SEM allows chemical “maps” to be obtained that can provide excellent visual representations of elemental and/or phase segregation. The need by industry for a quick and easy method to test chemical compositions for quality-control purposes has resulted...