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electropolishing procedures

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003748
EISBN: 978-1-62708-177-1
... electrolytes and is readily removable from the specimen after electropolishing. Most commercially available equipment features plastic tops with different sized apertures that are placed over the polishing cell. The surface to be polished is clamped face down over the aperture. Apparatus and Procedure...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001305
EISBN: 978-1-62708-170-2
..., and buffing, are reviewed. The article also explains the procedures of electrocleaning, electropolishing, electroplating, painting, surface blackening, coloring, terne coatings, and thermal spraying. It includes useful information on the surface modification of stainless steels, namely, ion implantation...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003775
EISBN: 978-1-62708-177-1
... Abstract This article explains how to prepare nickel-base alloys for metallographic examination and identifies related processing and imaging challenges. It describes sectioning, mounting, grinding, and polishing procedures along with alternative electropolishing processes. It also provides...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... and describes several methods for film formation, namely, heat tinting, color etching, anodizing, potentiostatic etching, vapor deposition, and film deposition by sputtering. It provides information on the general procedures and precautions for etchants and reagents used in metallographic microetching...
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Published: 01 December 2004
Fig. 59 Differential interference contrast (DIC) light micrograph of U-6.0Nb showing chemical banding. Electropolished using 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . Followed by a second (as above) electropolish that defines chemical banding. 250×. Courtesy of A. Kelly More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... concentration on structure and properties of quenched alloys Fig. 3 Polarized light micrograph of U-0.3Mo quenched from 800 °C (1470 °F) showing highly twinned, irregular grains of supersaturated α phase. Electropolished using procedure 1 in Table 1 and anodized using procedure 2 in Table 4 . 200...
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Published: 01 December 2004
Fig. 35 Polarized light micrograph of cast U-0.3Mo showing irregular grain structure similar to that of unalloyed uranium. Electropolished using procedure 1 in Table 1 and anodized using procedure 2 in Table 4 . 200×. Courtesy of M.M. Lappin More
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Published: 01 December 2004
Fig. 3 Polarized light micrograph of U-0.3Mo quenched from 800 °C (1470 °F) showing highly twinned, irregular grains of supersaturated α phase. Electropolished using procedure 1 in Table 1 and anodized using procedure 2 in Table 4 . 200×. Courtesy of M.M. Lappin More
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Published: 01 December 2004
Fig. 41 Polarized light micrograph of U-0.75Ti cooled from 800 °C (1470 °F) at >200 °C/s (>360 °F/s) showing acicular martensite. Electropolished using procedure 1 in Table 1 and anodized using procedure 2 in Table 4 . 200×. Courtesy of M.E. McAllaster More
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Published: 01 December 2004
Fig. 26 Polarized light micrograph showing grinding artifacts in unalloyed uranium. Bands of fine twins are due to deformation from coarse grinding steps that was not removed by subsequent fine grinding and polishing. Electropolished using procedure 1 in Table 1 and anodized using procedure More
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Published: 01 December 2004
Fig. 5 Polarized light micrograph of U-2.0Mo cooled from 800 °C (1470 °F) at >100 °C/s (>180 °F/s) showing internally twinned thermoelastic martensite, α b ′ . Electropolished using procedure 1 in Table 1 and anodized using procedure 2 in Table 4 . 100×. Courtesy of M.E More
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Published: 01 December 2004
Fig. 46 Polarized light micrograph of U-2.0Mo quenched from 800 °C (1470 °F) and overaged at 400 °C (750 °F) for 90 h showing colonies of fine (optically unresolvable) α + γ produced by cellular decomposition of the thermoelastic martensite. Electropolished using procedure 1 in Table 1 More
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Published: 01 December 2004
Fig. 49 Polarized light micrograph of U-2.0Mo quenched from 800 °C (1470 °F) and fully overaged at 500 °C (930 °F) for 90 h showing crystallographic orientation of the α phase in parallel bands reminiscent of the preexisting α b ′ martensite. Electropolished using procedure 1 More
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Published: 01 December 2004
Fig. 47 Polarized light micrograph of U-2.0Mo quenched from 800 °C (1470 °F) and overaged at 450 °C (840 °F) for 5 h showing beginning of discontinuous transformation of α + γ (irregular equiaxed colonies) to α + U 2 Mo (long, parallel features). Electropolished using procedure 1 in Table 1 More
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Published: 01 December 2004
Fig. 22 Differential interference contrast (DIC) light micrograph of rolled unalloyed uranium showing elongated grains. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . Courtesy of A. Kelly More
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Published: 01 December 2004
Fig. 55 Differential interference contrast (DIC) light micrograph of U-6.0Nb solution annealed material. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . 250×. Courtesy of A. Kelly More
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Published: 01 December 2004
Fig. 7 Differential interference contrast (DIC) light micrograph of as quenched U-6.0Nb showing transformation twinning. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . 1000×. Courtesy of A. Kelly More
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Published: 01 December 2004
Fig. 18 Differential interference contrast (DIC) light micrograph of as-cast unalloyed uranium showing subgrain boundaries. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . 250×. Courtesy of A. Kelly More
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Published: 01 December 2004
Fig. 34 Differential interference contrast (DIC) light micrograph of unalloyed uranium showing uranium carbide inclusions. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . 1000×. Courtesy of A. Kelly More
Image
Published: 01 December 2004
Fig. 57 Differential interference contrast (DIC) light micrograph of U-6.0Nb showing grain delination and twinning. Electropolished with 5% H 3 PO 4 , electroetched using procedure 2 in Table 5 . 1000×. Courtesy of A. Kelly More