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electron probe microanalyzers

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Published: 01 January 1986
Fig. 1 Schematic diagram of electron probe microanalyzer and associated circuitry. 1, Meters; 2, operating potential; 3, gun current; 4, monitor current; 5, vacuum; 6, sample current More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... a scheme for reducing the observed x-ray intensities to quantitative elemental concentrations ( Ref 1 ). Duncumb, studying with Cosslett at Cambridge, applied to the electron probe microanalyzer the scanning capabilities of the scanning electron microscope. Thus, an instrument was obtained that permits...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
...” for discussion of the strengths and weaknesses of these different types of x-ray detectors.) Scanning electron microscopes are occasionally equipped with a wavelength dispersive detector to facilitate x-ray mapping, but more often such mapping is done using an electron probe microanalyzer, as will be described...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... microscopes for chemical analysis of micron-size areas of a surface. When used in this mode, the scanning electron microscope is called an electron micro-probe or an electron probe microanalyzer. This topic is covered briefly in the section “Electron Probe X-Ray Microanalysis” in this article. General...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... that can simultaneously count and determine the energy of emitted x-rays. Such an energy-dispersive detector contrasts with the wavelength-dispersive spectrometers used on the original electron probe microanalyzer developed by Castaing in 1948. The x-rays are generated when a sample of the area of interest...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... probe microanalyzer developed by Castaing in 1948. The x-rays are generated when a sample of the area of interest is bombarded with a beam of electrons. Light elements to boron (atomic number 5) can be detected, and semiquantitative analysis can be made for atomic numbers of 11 (sodium) and higher...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... it is possible to perform quantitative chemical analysis for elements as heavy as or heavier than sodium, the ability to perform quantitative analysis for lighter elements using the EDS ultrathin window detector has yet to be developed. As with the scanning electron microscope or the electron probe microanalyzer...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... an electron probe microanalyzer. This function is covered briefly in this article; additional information is provided in the article “Electron Probe X-Ray Microanalysis” in this Volume. In addition to image formation and microchemical analysis, the scanning electron microscope provides several...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005229
EISBN: 978-1-62708-187-0
... of a scanning electron microscope with an x-ray microanalyzer (energy-dispersive x-ray spectroscope, or EDS). Figure 2 shows typical EDS scattered data of solute distributions across a dendrite due to microsegregation of chromium and molybdenum. However, this method has a limitation and becomes unreliable...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003751
EISBN: 978-1-62708-177-1
... the replica only reveals the topographic features at the surface. However, there are extraction replication techniques used for electron microscopy that can physically pull precipitates and particles from the component surface for analysis in the scanning electron microscope (SEM) or electron probe...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 2024
DOI: 10.31399/asm.hb.v12.a0006841
EISBN: 978-1-62708-387-4
...-dispersive x-ray analysis and electron probe microanalyzer wavelength-dispersive x-ray analysis. Trace elements were determined using inductively coupled plasma mass spectrometry. The bulk composition was Au-11.5wt%Ag-0.51wt%Cu, which is essentially a gold-silver high-karat (21K) alloy. The highest...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003763
EISBN: 978-1-62708-177-1
... steel bar with decarburization at the surface. 4% picral etch. Original magnification 100× Another important consideration is whether the specimen will be further analyzed in the electron probe microanalyzer (EMPA). If so, it is advisable not to use oxide-containing grinding/polishing materials...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003747
EISBN: 978-1-62708-177-1
...; this may be determined by variations in topography or composition. Scanning electron microscopes and electron probe microanalyzers are examples of investigative techniques operating on these principles. It is possible also to use x-rays to determine variations in composition, as in x-ray fluorescent...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003761
EISBN: 978-1-62708-177-1
... in.). Epoxy is then poured into the recess to a depth of approximately 1.5 mm (0.0625 in.), and a vacuum is used to remove air from the voids, allowing the epoxy to flow between the compression medium and the specimen. In using castable epoxy mounts in the scanning electron microscope or electron probe...
Book Chapter

Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003786
EISBN: 978-1-62708-177-1
... is desired. Significant electrical conductance is desirable if, for example, the specimen is to be electrolytically polished or etched or examined with a scanning electron microscope or an electron probe microanalyzer. Sufficient transparency to permit recognition of features on the side surfaces...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.9781627082006
EISBN: 978-1-62708-200-6
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003068
EISBN: 978-1-62708-200-6
... in which incident thermal energy is expended determine the degree of uniformity of the material sup- reflecting object. The reflected sound wave is used to by sacrificial loss of material. plied by the vendor, or both. Compare with preproduc- build up a structural picture electronically. tion test...