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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... Abstract Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from...
Abstract
Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from a microscopic part of a solid specimen bombarded by a beam of accelerated electrons. It provides information on the various aspects of energy-dispersive spectrometry (EDS) and wavelength-dispersive spectrometry (WDS), and elucidates the qualitative analysis of the major constituents of EDS and WDS. The article includes information on the analog and digital compositional mapping of elemental distribution, and describes the strengths and weaknesses of WDS and EDS spectrometers in X-ray mapping. It also outlines the application of EPMA for solving various problems in materials science.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along...
Abstract
This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along with the significance of the raw analytical total. Sections on accuracy of the standards-based k-ratio/matrix corrections protocol with EDS and processes of analysis when severe peak overlap occurs are also included. The article provides information on low-atomic-number elements, iterative qualitative-quantitative analysis for complex compositions, and significance of standardless analysis in the EDS software. It ends with a section on the processes involved in elemental mapping for major and minor constituents.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Abstract
Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection threshold and precision, limitations, sample requirements, and the capabilities of related techniques.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Abstract
This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe.
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... Abstract This article focuses on the visual or macroscopic examination of damaged materials and interpretation of damage and fracture features. Analytical tools available for evaluations of corrosion and wear damage features include energy dispersive spectroscopy, electron probe microanalysis...
Abstract
This article focuses on the visual or macroscopic examination of damaged materials and interpretation of damage and fracture features. Analytical tools available for evaluations of corrosion and wear damage features include energy dispersive spectroscopy, electron probe microanalysis, Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed. The article concludes with a review of the evaluation of polymers and ceramic materials in failure analysis.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Abstract
This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.
Image
Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering
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Image
Published: 01 December 2004
Fig. 29 Secondary electron microscopy image of dendrites and eutectic from an Al-12.7Si cast specimen. Silicon microsegregation between the dendrites of solid solution and eutectic revealed by electron probe microanalysis
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Image
Published: 31 October 2011
Fig. 3 Comparison of weld-metal dilution determined from geometric measurements and direct chemical composition measurements made by electron probe microanalysis (EPMA). Source: Ref 1
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Image
Published: 31 October 2011
Fig. 28 Example of microsegregation in a weld of a niobium-bearing nickel-base superalloy. (a) Micrograph showing position of composition trace. (b) Corresponding electron probe microanalysis results showing niobium microsegregation. Source: Ref 33 , 42
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Image
Published: 01 December 2004
Fig. 30 Microstructure at a midthickness location. Direct-chill semicontinuous cast 610 × 1372 mm (24 × 54 in.) 2124 alloy ingot. Etchant: (a) 0.5% HF. (b) Copper and magnesium microsegregation (revealed by electron probe microanalysis) across the dendrites. Source: Ref 4
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Image
Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy
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Image
Published: 01 August 2013
Fig. 25 Nitrogen concentration-depth profiles of nitrided Fe-7wt%Cr alloy and Fe-20wt%Cr alloy specimens nitrided for 7 and 15 h, respectively, at 580 °C (853 K) with r N = 0.1 atm −1/2 . The experimental data (points in the figure) were obtained by electron probe microanalysis. The full
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Book: Powder Metallurgy
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Abstract
This article discusses the capabilities and limitations of various material characterization methods that assist in the selection of a proper analytical tool for analyzing particulate materials. Commonly used methods are microanalysis, surface analysis, and bulk analysis. The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques, such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed.
Image
Published: 01 August 2013
) as determined by electron probe microanalysis. The presence of carbide (cementite) at grain boundaries is revealed by the abrupt rise of the carbon content (see the arrows and dashed lines in the figure); also, the occurrence of a carbon-rich zone underneath the nitrogen diffusion zone is exposed. Source: Ref
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Image
Published: 01 August 2013
Fig. 27 Nitrogen concentration-depth profiles of nitrided Fe-2wt%V alloy specimens nitrided at r N = 0.103 atm −1/2 . The experimental data (points in the figure) were obtained by electron probe microanalysis. The full lines through the data are the results of fits of the model described
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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b) Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Surface Scanning Auger...
Abstract
This article provides a general introduction of materials characterization and describes the principles and applications of a limited number of techniques that are most commonly used to characterize the composition and structure of metals used in engineering systems. It briefly describes the classification of materials characterization methods including, bulk elemental characterization, bulk structural characterization, microstructural characterization, and surface characterization. Further, the article reviews the selection of materials characterization methods most commonly used with metals.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... for characterizing chemical inhomogeneities on a spatial resolution scale midway between the ∼1 cm range of “bulk XRF” and the ∼1 μm scale of electron probe microanalysis, for example, characterizing segregation patterns in cross-sectioned ingots. Capabilities of Related Techniques Optical Emission Spectroscopy...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and precision methods, and sample requirements. The amount of material that needs to be sampled, operating principles, and limitations of the stated methods are also discussed.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... that have not been included in this division include: Glow discharge optical emission spectroscopy, a surface-sensitive technique (covered in Division 2, “Spectroscopy,” in this Volume) Electron energy loss spectroscopy (covered in Division 9, “Microscopy and Microanalysis,” in this Volume) Ion...
Abstract
This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm. A quick reference summary of surface-analysis methods is presented in this article.
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003727
EISBN: 978-1-62708-177-1
... are quaternary sigma (σ) phase (Al,Cu,Zn) 2 Mg, ternary S phase (Al 2 MgCu), or/and binary θ phase (Al 2 Cu). These phases were identified using optical metallography, scanning electron microscopy (SEM), x-ray map, and electron probe microanalysis (EPMA) techniques. The dendrite arms are separated by sigma, S...
Abstract
The most common aluminum alloy systems are aluminum-silicon, aluminum-copper, and aluminum-magnesium. This article focuses on the grain structure, eutectic microstructure, and dendritic microstructure of these systems. It provides information on microsegregation and its problems in casting of alloys. The article also illustrates the casting defects such as macroporosity, microshrinkage, and surface defects, associated with the alloys.
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