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electron probe microanalysis

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... Abstract Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... Abstract This article focuses on the visual or macroscopic examination of damaged materials and interpretation of damage and fracture features. Analytical tools available for evaluations of corrosion and wear damage features include energy dispersive spectroscopy, electron probe microanalysis...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
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Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More
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Published: 01 December 2004
Fig. 29 Secondary electron microscopy image of dendrites and eutectic from an Al-12.7Si cast specimen. Silicon microsegregation between the dendrites of solid solution and eutectic revealed by electron probe microanalysis More
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Published: 31 October 2011
Fig. 3 Comparison of weld-metal dilution determined from geometric measurements and direct chemical composition measurements made by electron probe microanalysis (EPMA). Source: Ref 1 More
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Published: 31 October 2011
Fig. 28 Example of microsegregation in a weld of a niobium-bearing nickel-base superalloy. (a) Micrograph showing position of composition trace. (b) Corresponding electron probe microanalysis results showing niobium microsegregation. Source: Ref 33 , 42 More
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Published: 01 December 2004
Fig. 30 Microstructure at a midthickness location. Direct-chill semicontinuous cast 610 × 1372 mm (24 × 54 in.) 2124 alloy ingot. Etchant: (a) 0.5% HF. (b) Copper and magnesium microsegregation (revealed by electron probe microanalysis) across the dendrites. Source: Ref 4 More
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Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy More
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Published: 01 August 2013
Fig. 25 Nitrogen concentration-depth profiles of nitrided Fe-7wt%Cr alloy and Fe-20wt%Cr alloy specimens nitrided for 7 and 15 h, respectively, at 580 °C (853 K) with r N = 0.1 atm −1/2 . The experimental data (points in the figure) were obtained by electron probe microanalysis. The full More
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Published: 01 August 2013
) as determined by electron probe microanalysis. The presence of carbide (cementite) at grain boundaries is revealed by the abrupt rise of the carbon content (see the arrows and dashed lines in the figure); also, the occurrence of a carbon-rich zone underneath the nitrogen diffusion zone is exposed. Source: Ref More
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Published: 01 August 2013
Fig. 27 Nitrogen concentration-depth profiles of nitrided Fe-2wt%V alloy specimens nitrided at r N = 0.103 atm −1/2 . The experimental data (points in the figure) were obtained by electron probe microanalysis. The full lines through the data are the results of fits of the model described More
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b) Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Surface Scanning Auger...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... that have not been included in this division include: Glow discharge optical emission spectroscopy, a surface-sensitive technique (covered in Division 2, “Spectroscopy,” in this Volume) Electron energy loss spectroscopy (covered in Division 9, “Microscopy and Microanalysis,” in this Volume) Ion...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... for characterizing chemical inhomogeneities on a spatial resolution scale midway between the ∼1 cm range of “bulk XRF” and the ∼1 μm scale of electron probe microanalysis, for example, characterizing segregation patterns in cross-sectioned ingots. Capabilities of Related Techniques Optical Emission Spectroscopy...
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Published: 01 January 2002
Fig. 6 Schematic of a complete energy-dispersive x-ray spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor More