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electron probe X-ray microanalysis

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... of the components of a wavelength-dispersive x-ray spectrometer. Courtesy of Cameca Instruments Abstract Abstract Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... … N … • N … … • • • • … … • Auger electron spectroscopy • … … … • • … … • • • • … … … Electron probe x-ray microanalysis N … … … N N N … N … N N N … … Electron spin resonance N N … … N N N N … … … N N N … Elemental and functional...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... spectroscopy (EDS), electron probe microanalysis (EPMA), Auger electron spectroscopy (AES), secondary ion mass spectroscopy (SIMS), and x-ray powder diffraction (XRPD). Energy-Dispersive X-Ray Analysis Energy-dispersive x-ray analysis is normally conducted using a SEM fitted with an x-ray detector...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... microscopy; COMB, high-temperature combustion; EFG, elemental and functional group analysis; EPMA, electron probe x-ray microanalysis; ESR, electron spin resonance; FTIR; Fourier transform infrared spectroscopy; GC, gas chromatography; GC/MS, gas chromatography/mass spectrometry; IA, image analysis; IC, ion...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... electron microscopy, electron probe x-ray microanalysis, and Auger electron spectroscopy, by which inclusion chemistries can be determined. Again, it should be emphasized that this Handbook is meant as a tool to familiarize the nonanalytical specialist with modern analytical techniques and to help him...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... spectrometer and was the model for the first commercial systems (see the article “Electron Probe X-Ray Microanalysis” in Materials Characterization Volume 10 of ASM Handbook. These systems consisted of an x-ray detector and single-crystal diffractometers that moved synchronously around the sample...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001725
EISBN: 978-1-62708-178-8
... Electron Microscopy,” “Electron Probe X-Ray Microanalysis,” and “Low-Energy Electron Diffraction.” Each article begins with a summary of general uses, applications, limitations, sample requirements, and capabilities of related techniques, which is designed to give the reader a quick overview...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... ● … … ● ● … … ● ● ● ● S … … S Electron probe x-ray microanalysis ● … … ● ● ● … ● … ● ● S S … ● Image analysis … … … … … … ● ● … … … … … … ● Ion chromatography D, N … … D, N D, N D, N D, N … … D, N D, N D, N … … … Inductively coupled plasma atomic emission...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... , p 71 12. Barbi N.C. , Electron Probe Microanalysis Using Energy Dispersive X-ray Spectroscopy , PGT, Inc. , 1981 13. Reed S.J.B. , Electron Microprobe Analysis , Cambridge University Press , 1975 14. Goldstein J.I. et al. , Scanning Electron Microscopy...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000600
EISBN: 978-1-62708-181-8
... five line drawings, two of which are graphs containing superimposed electron fractographs. Information on the principles, instrumentation, and applications associated with AES and EDS is provided in the articles “Auger Electron Spectroscopy” and “Electron Probe X-Ray Microanalysis,” respectively...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... Microscopy and X-Ray Microanalysis , 4th ed. , Springer , 2018 , 10.1007/978-1-4939-6676-9 • Newbury D.E. and Ritchie N.W.M. , Electron Probe X-Ray Microanalysis , Materials Characterization , Vol 10 , ASM Handbook , ASM International , 2019 , 10.31399/asm.hb.v10.a0006638...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... to realize that the x-ray sample volume and shape vary with the electron beam voltage and the sample atomic number, effects that are discussed in Ref 3 and in the article “Electron Probe X-Ray Microanalysis” in this Volume. In general, higher voltages, lower density, and lower atomic number elements...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... of the electron beam increases, smaller electron probe sizes can be used, and the resolution attainable in the analysis (imaging, electron diffraction, and x-ray microanalysis) increases; that is, the region under analysis decreases. Analytical electron microscopy electron sources are discussed further in Ref 4...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006649
EISBN: 978-1-62708-213-6
... spectroscopy ● ● ● ● … ● ● ● ● ● … … … … Electron probe x-ray microanalysis ● ● ● ● ● … ● ● ● ● … S … … Flowability analyzer … … … … ● ● … … … … … … … … Image analysis … … … … … ● ● ● … … … S … ● Ion chromatography D … D D D D … … D...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Microscope , J. Phys. E. , Vol 8 (No. 12 ), Dec 1975 , p 1037 – 1041 , 10.1088/0022-3735/8/12/018 4. Goldstein J.I. et al. , The SEM and Its Modes of Operation , Scanning Electron Microscopy and X-Ray Microanalysis , Springer US , Boston, MA , 2003 , p 21 – 60 10.1007/978-1...