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electron optical column

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... the development of SEM technology and operating principles of basic systems of SEM. The basic systems covered include the electron optical column, signal detection and display equipment, and the vacuum system. The processes involved in the preparation of samples for observation using an SEM are described...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... discussed. display equipment electron optical column fractography microstructure sample preparation scanning electron microscopy signal detection vacuum system THE SCANNING ELECTRON MICROSCOPE (SEM) is one of the most versatile instruments for investigating the microstructure of metallic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... of a typical SEM include an electron-optics column, specimen chamber, support system, and control and imaging system. The electron beam is generated at an electron gun and accelerated toward the sample housed inside a specimen chamber, typically below the electron-optics column. Electromagnetic lenses below...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... using various SEM modes Figure 1 illustrates the basic components of a typical SEM. The components can be categorized as the electron-optics column, the specimen chamber, the support system, and the control and imaging system. The electron beam is generated at an electron gun and accelerated...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... on TEM and AEM can be found in Ref 1 , 2 , 3 , 4 , 5 , 6 , and 7 . The analytical electron microscope is a classical electron optical instrument. The instrument is built around the electron column, which can be divided into two principal subassemblies: the electron gun, or source of high...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... of stainless. Referring to Table 1 , the engineer can look down the list of analytical methods for one having a closed circle (●) under the “Macro/Bulk” column, the “Quant” column, and the “Major” and “Minor” columns. This quickly shows that optical emission spectroscopy, spark source mass spectrometry...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
.... A basic IC column and IC program that are capable of resolving the anions and weak organic acids of interest are commercially available as a turn-key solution. Optical emission spectroscopic (OES) methods are some of the most commonly used techniques in elemental analysis and alloy identification...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... the essential components, and explains their function only to the extent that it helps the operator obtain the desired results. An explanation of how the components of ion optical column shape and steer the ion beam to the desired target locations is then provided. The article also reviews the many diverse...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
..., and spectrometry techniques with data analysis. electron diffraction transmission electron microscopy crystal structure References 1. Hecht E. , Optics , 3rd ed., Addison-Wesley , 1988 2. Muller D.A. , Structure and Bonding at the Atomic Scale by Scanning...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003240
EISBN: 978-1-62708-199-3
...Abstract Abstract Holography is basically a two-step process for creating a whole three dimensional image of a diffusely reflecting object having some arbitrary shape. This article discusses the advantages, disadvantages and applications of using the optical holography method in nondestructive...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001300
EISBN: 978-1-62708-170-2
... provide the same information. Table 1 Techniques for microstructural analysis Coating property Technique Phase composition X-ray or electron diffraction Phase distribution Metallographic sections, SEM, TEM, optical microscopy Grain size X-ray diffraction, SEM, TEM (plus image...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003240
EISBN: 978-1-62708-199-3
... Abstract Holography is basically a two-step process for creating a whole three dimensional image of a diffusely reflecting object having some arbitrary shape. This article discusses the advantages, disadvantages and applications of using the optical holography method in nondestructive...
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.a0006545
EISBN: 978-1-62708-290-7
... at Submillimeter Wavelengths , Appl. Opt. , Vol 27 , 1988 , p 1203 – 1209 , 10.1364/AO.27.001203 39. Mash I.D. and Motulevich G.P. , Optical Constants and Electronic Characteristics of Titanium , Sov. Phys. JETP , Vol 36 , 1973 , p 516 – 520 40. Bendow B. and Gianino P.D...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001286
EISBN: 978-1-62708-170-2
... deposited films of oxides and nitrides are commonly used in the optics, electronics, decorative, and mechanical applications, with TiN being one of the more common film materials. There are a number of techniques for performing reactive atomistic film deposition. The simplest way is to thermally evaporate...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005615
EISBN: 978-1-62708-174-0
... assembly-to-workpiece distance Characteristics of the electron beam gun/column assembly (gun and electron optics) Vacuum level Filament design and peaking Each of these variables, separately and jointly, affects final beam spot size. With the advent of electron beam characterization...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
...-rays, and heat phonons. The scanning electron microscope optical column and specimen chamber are operated under high-vacuum conditions (≤10 −4 torr), to improve the quality of imaging, minimize contamination, and, in general, extend the service lives of all components. A typical scanning electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
... Standards , Vol 03.05 , ASTM , Philadelphia , 1985 14. “Standard Methods for Chemical Analysis of Copper-Beryllium Alloys,” E 106, Sections 19–26, Annual Book of ASTM Standards , Vol 03.05 , ASTM , Philadelphia , 1985 15. “Standard Methods for Chemical Analysis of Electronic Nickel...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006096
EISBN: 978-1-62708-175-7
... mils Mechanical or ultrasonic agitation Sieving 5 ∼ 125 mm 0.2 to 4.9 in. Microscopy Optical 0.5 ∼ 100 0.02 to 4 Electron 0.001 ∼ 50 4 × 10 −5 to 2 Electrical resistivity Coulter counter 0.5 ∼ 800 0.02 to 32 Electrozone 0.1 ∼ 2000 4 × 10 −3 to 79 Sedimentation...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8