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electron microprobe analysis

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003520
EISBN: 978-1-62708-180-1
... Abstract This article outlines the basic steps to be followed and the range of techniques available for failure analysis, namely, background data assembling, visual examination, microfractography, chemical analysis, metallographic examination, electron microscopy, electron microprobe analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
... Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural parameters...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
.... This instrument and method will be described in some detail, and the operation and capabilities of several other surface analysis methods will be more briefly described in comparison to it. electron probe microanalysis scanning auger microprobe scanning electron microscopy secondary ion mass spectroscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
.... It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe. electron probe microanalysis scanning auger microprobe scanning electron...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003227
EISBN: 978-1-62708-199-3
... of a part to fracture can be answered through fractography; others require additional materials characterization techniques, such as mechanical testing, metallography, chemical analysis, electron microprobe analysis, x-ray diffraction analysis, and Auger spectroscopy. When these investigations are performed...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003227
EISBN: 978-1-62708-199-3
..., electron microprobe analysis, x-ray diffraction analysis, and Auger spectroscopy. When these investigations are performed by auxiliary equipment on either a scanning or a transmission electron microscope, they may be considered to be fractographic procedures. Brittleness or ductility may be revealed...
Series: ASM Handbook
Volume: 1A
Publisher: ASM International
Published: 31 August 2017
DOI: 10.31399/asm.hb.v01a.a0006343
EISBN: 978-1-62708-179-5
... and Electron Microprobe Analysis , Mater. Charact. , Vol 104 , 2014 , p 132 – 138 10.1016/j.matchar.2014.09.008 17. Domeij B. , Hernando J.C. , and Diószegi A. , Quantification of Dendritic Austenite after Interrupted Solidification in a Hypoeutectic Lamellar Graphite Iron...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... have contributed to the fracture may become obvious. If the sample cannot be directly evaluated in the SEM, the fracture surface and vicinity can be sampled to later perform chemical analysis using other methods. Electron microprobe analysis or electron probe microanalysis is an alternative to scanning...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... 3. Reed S.J.B. , Electron Microprobe Analysis , 2nd ed. , Cambridge University Press , 1993 4. Reed S.J.B. , Electron Microprobe Analysis and Scanning Electron Microscopy in Geology , Cambridge University Press , 1996 5. Newbury D.E. , Joy D.C. , Echlin...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
... the applications of PIXE in three areas, namely, atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes. calibration data reduction particle-induced X-ray emission spectroscopy quality assurance X-ray fluorescence spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... emission and XRF are types of x-ray analysis. Although the excitation modes differ, neither generates the massive bremsstrahlung of the direct electron beam excitation used in electron microprobes or scanning electron microscopes. Thus, both reach parts per million detection levels, as opposed to 0.1...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003209
EISBN: 978-1-62708-199-3
.... The microstructure of the metals at the bond zone shows clearly that the metals did not melt, but flowed plastically during the process. Electron microprobe analysis across such plastically deformed areas showed that no diffusion occurred due to extremely rapid self-quenching of the metals. Explosion welding...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003209
EISBN: 978-1-62708-199-3
... the pressures in this region are many times higher than the dynamic yield strength of the metals, they flow plastically in a manner similar to fluids. The microstructure of the metals at the bond zone shows clearly that the metals did not melt, but flowed plastically during the process. Electron microprobe...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... Principles and Instrumentation The electron microprobe and scanning electron microscope operate on identical principles. The key differences are that electron microprobes are typically equipped with several crystal spectrometers to facilitate wavelength dispersive x-ray analysis. Qualitative analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... principles. The key differences are that electron microprobes are typically equipped with several crystal spectrometers to facilitate wavelength dispersive x-ray analysis. Qualitative analysis is typically performed using an energy dispersive x-ray analysis. Qualitative analysis is typically performed using...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
... and molecules. This article focuses on the principles and applications of high sputter rate dynamic SIMS for depth profiling and bulk impurity analysis. It provides information on broad-beam instruments, ion microprobes, and ion microscopes, detailing their system components with illustrations. The article...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... on the effects of ion implantation and electronic excitation on the charge of the sputtered species. The design and operation of the various instrumental components of SIMS is then reviewed. Details on a depth-profiling analysis of SIMS, the quantitative analysis of SIMS data, and the static mode of operation...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
...) Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Surface Scanning Auger microprobe (SAM) … Scanning Auger microprobe (SAM) (a) SEM has not historically been capable of this type of analysis, but recent developments are extending SEM...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... with metals Type of analysis Information obtained/method Elemental Structural Morphological Bulk X-ray fluorescence spectroscopy (XRF) Optical emission spectroscopy (OES) Combustion/inert fusion analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron...