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electron energy loss spectroscopy

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... technique (covered in Division 2, “Spectroscopy,” in this Volume) Electron energy loss spectroscopy (covered in Division 9, “Microscopy and Microanalysis,” in this Volume) Ion-scattering spectrometry (covered in Division 3, “Mass and Ion Spectrometry,” in this Volume) Contact angle, a surface...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... EELS electron energy loss spectroscopy EHD elastohydrodynamic EHL elastohydrodynamic lubrication ELI extra-low interstitial emf electromotive force EP extreme pressure EPA Environmental Protection Agency EPMA electron probe microanalysis...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... in very fine regions (+ energy-dispersive x-ray analysis, + electron energy loss spectroscopy TA Thermal analysis Thermal energy Heat dissipation Microscopic surface structure … Adsorption energy, lubricant deterioration, etc. TEM Transmission electron microscopy Electron Electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... microscopy; EELS: electron energy loss spectroscopy; EBIC/LBIC: electron-beam-induced current/light-beam-induced current; CL: cathodoluminescence; SEM: scanning electron microscopy; SKPM: scanning Kelvin probe microscopy; SIMS: secondary ion mass spectroscopy; RBS: Rutherford backscattering spectrometry; XPS...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
..., electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering spectroscopy. SAM, scanning Auger microscopy. SIMS, secondary ion mass spectroscopy. TEELS, transmission electron energy loss spectroscopy. TEM, transmission...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003441
EISBN: 978-1-62708-195-5
...-ray photoelectron spectroscopy + + + Electron energy loss spectroscopy + + + Secondary ion mass spectroscopy + + + Scanning electron microscopy + Thermal desorption mass spectroscopy + + Fourier transform infrared spectroscopy...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001348
EISBN: 978-1-62708-173-3
... the Miedema technique ( Ref 28 ). High-resolution electron microscopy (HREM), electron energy loss spectroscopy (EELS), microspectroscopy, and microdiffraction have been used to analyzed the chemical distributions on or near interface planes ( Ref 43 ). This information can be used to support models requiring...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis of metal particles...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Auger electron spectroscopy atomic...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... sensitivity. Those electrons that are close enough to the surface to escape without loss of energy will be detected as Auger electron peaks. Those electrons that lose energy before leaving the sample surface will add to the background of the spectrum. Scanning Auger microscopy is accomplished by scanning...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006657
EISBN: 978-1-62708-213-6
... energy (Ω CuS ), kJ/mol … … Source: Ref 80 Beryllium and carbon peak positions in x-ray photoelectron spectroscopy and Auger electron spectroscopy Table 1 Beryllium and carbon peak positions in x-ray photoelectron spectroscopy and Auger electron spectroscopy Peak Photoelectrons...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... ) Fig. 4 Surface and bulk plasmon lines associated with Al 2s at normal and grazing takeoff angles ( Ref 8 ) Fig. 5 Relative binding energies in electron volts ( x -axis) for a uranium atom ( Ref 8 ) Fig. 6 XPS emission process for a model atom. An incoming photon causes...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
.... (a) Recorded without a voltage offset. (b) Recorded with a voltage offset to reject low-energy molecular secondary ions Fig. 9 Positive secondary ion mass spectroscopy spectra for an organometallic silicate film deposited on a silicon substrate acquired using a scanning ion microprobe under inert...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
... radiation Energy Criterion Photons 3 keV 10% attenuation Electrons 140 keV 10% energy loss Protons 4 MeV 10% energy loss Deuterons 5.5 MeV 10% energy loss Tritons 6.5 MeV 10% energy loss 3 He 14.4 MeV 10% energy loss 4 He 16 MeV 10% energy loss Neutrons Thermal...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001771
EISBN: 978-1-62708-178-8
... analyzer used for XPS. Source: Ref 8 Fig. 1 Energy-level diagrams showing the electron transitions that form the basis for three techniques. (a) XPS. (b) X-ray analysis. (c) AES (Auger electron spectroscopy). ϕ, spectrometer work function Fig. 2 Energy-level diagram of an atom...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001770
EISBN: 978-1-62708-178-8
... of Primary Excitation Electron Energy Distribution Electron Escape Depths Chemical Effects in Auger Electron Spectroscopy Quantitative Analysis Instrumentation Data Acquisition Elemental Detection Sensitivity Electron Beam Artifacts Sample Charging Spectral Peak Overlap High...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... of KTA-Tator, Inc. Fig. 26 Scanning electron microscope. Courtesy of KTA-Tator, Inc. Fig. 27 Resolved image acquired by scanning electron microscopy-energy dispersive x-ray spectroscopy, with associated spectrum. Courtesy of KTA-Tator, Inc. Fig. 28 Spectrum obtained using...