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electron energy loss spectroscopy

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Image
Published: 01 January 1994
spectroscopy. SAM, scanning Auger microscopy. SIMS, secondary ion mass spectroscopy. TEELS, transmission electron energy loss spectroscopy. TEM, transmission electron microscopy. More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... that have not been included in this division include: Glow discharge optical emission spectroscopy, a surface-sensitive technique (covered in Division 2, “Spectroscopy,” in this Volume) Electron energy loss spectroscopy (covered in Division 9, “Microscopy and Microanalysis,” in this Volume) Ion...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
.... FIM-AP, field ion microscopy - atom probe. ISS, ion scattering spectroscopy. SAM, scanning Auger microscopy. SIMS, secondary ion mass spectroscopy. TEELS, transmission electron energy loss spectroscopy. TEM, transmission electron microscopy. The principal components of an analytical surface...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... EELS electron energy loss spectroscopy EHD elastohydrodynamic EHL elastohydrodynamic lubrication ELI extra-low interstitial emf electromotive force EP extreme pressure EPA Environmental Protection Agency EPMA electron probe microanalysis...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of metal powders, surface analysis should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0005663
EISBN: 978-1-62708-173-3
... welding EDXA energy-dispersive x-ray analysis which cementite completes solution in CBN cubic boron nitride EELS electron energy loss spectroscopy austenite CCD charge-coupled device EERC Earthquake Engineering Research CCT continuous-cooling transformation ACt temperature at which austenite begins to cd...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... the specimen with no energy is the material indicated by the name. For beams. loss or some energy loss. The backscattered example, for an assay of FeSO4, the analyst Auger chemical shift. The displacement in electron yield is strongly dependent on would determine both iron and SO24À in the energy of an Auger...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of electrolyte in which it is immersed. Elec- source and observer. See also Doppler trode potentials are referred to a standard electron energy loss spectroscopy (EELS). shift. electrode, such as the hydrogen electrode. A spectrographic technique in the electron microscope that analyzes the energy dis- Doppler...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... of each element at friction surface (+ ion gun) CL Cathode luminescence Electron Photon Illumination spectrum, composition ≈5 µm Lattice defects and compression analysis (+ electron probe microanalysis) EELS Electron energy loss spectroscopy Electron Electron (scattered) Electronic status...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... of escape depths that gives AES its surface sensitivity. Those electrons that are close enough to the surface to escape without loss of energy will be detected as Auger electron peaks. Those electrons that lose energy before leaving the sample surface will add to the background of the spectrum. Scanning...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Understanding the various analytical...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006657
EISBN: 978-1-62708-213-6
.... Exposing a sample to high-energy electrons emits a variety of electrons, including secondary electrons, backscattered electrons, and Auger electrons. Auger electron spectroscopy involves precise measurement of the number of emitted Auger electrons as a function of kinetic energy. Auger electrons...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... photoelectron spectroscopy surface analysis Overview Introduction Study of the interaction between the photon and the electron began in the early part of the 19th century, emanating from the photoelectric effect described by Albert Einstein in 1905 ( Ref 1 ) and the redistribution of kinetic energy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... photoluminescence; XRD: x-ray diffraction; XRF: x-ray fluorescence; TEM: transmission electron microscopy; EELS: electron energy loss spectroscopy; EBIC/LBIC: electron-beam-induced current/light-beam-induced current; CL: cathodoluminescence; SEM: scanning electron microscopy; SKPM: scanning Kelvin probe microscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
...</italic> sample approximately 5 mg/cm<sup>2</sup> thick Table 1(b) Transmission of secondary radiation through a low- Z sample approximately 5 mg/cm 2 thick Secondary radiation Energy Criterion Photons 3 keV 10% attenuation Electrons 140 keV 10% energy loss Protons 4 MeV 10% energy...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001771
EISBN: 978-1-62708-178-8
... measurement of the atomic binding energies of many elements with improved accuracy. The chemical environment was observed to affect core-level binding energies, originating the term electron spectroscopy for chemical analysis (ESCA) ( Ref 4 ). Commercial x-ray photoelectron spectrometers appeared in 1969...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... structure at atomic resolution Optical microscopy Reflected light is used to generate a magnified image. Macroscopic surface structure details Chemical identity and composition techniques Energy dispersive x-ray spectroscopy (EDS) Incident electron beam generates emission of x-rays...