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electron diffraction

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... Abstract Low-energy electron diffraction (LEED) is a technique for investigating the crystallography of surfaces and overlayers adsorbed on surfaces. This article provides a brief account of LEED, covering the principles and measurements of diffraction from surfaces. Some of the processes...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001769
EISBN: 978-1-62708-178-8
... Abstract Low-energy electron diffraction (LEED) is a technique for investigating the crystallography of surfaces and overlayers adsorbed on surfaces. This article describes the principles of diffraction from surfaces, and elucidates the method of sample preparation to achieve diffraction...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... Abstract The electron backscatter diffraction (EBSD) technique has proven to be very useful in the measurement of crystallographic textures, orientation relationships between phases, and both plastic and elastic strains. This article focuses on backscatter diffraction in a scanning electron...
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Published: 01 January 1986
Fig. 37 Effect of tilting on electron-diffraction pattern. Diffraction pattern (a) and indexed schematic (b) after tilting about [1 1 0] γ . The zone axes are [11 1 ] γ and [111] σ . Compare with Fig. 38 . More
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Published: 01 January 1986
Fig. 38 Effect of tilting on electron-diffraction pattern. Diffraction pattern (a) and indexed schematic (b) after further tilting about [1 1 0] γ . The zone axes are [11 2 ] γ and [110] σ . Compare with Fig. 37 . More
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Published: 15 December 2019
Fig. 11 Diffraction patterns from GaAs (110). (a) Low-energy electron diffraction pattern near normal incidence, E p = 100 eV. (b) Reflection high-energy electron diffraction pattern, incident beam along [100] azimuth at grazing angle of incidence of 4.5°, E p = 10 keV. The lowest More
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Published: 01 January 1986
Fig. 102 AEM analysis of ion-implanted stainless steel. (a) Electron-diffraction pattern from bcc particles (inner reflections) in an fcc matrix (outer reflections) of 304 stainless steel implanted with 3 × 10 16 Fe/cm 2 at 160 keV. (b) Dark-field micrograph, showing the bcc particles More
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Published: 01 December 1998
Fig. 14 Electron diffraction ring pattern obtained from numerous grains in a polycrystalline aluminum sample. Starting with the innermost ring, the rings correspond to {111}, {200}, {220}, {311}, and {222} planes. Source: Ref 3 More
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Published: 01 December 1998
Fig. 15 Electron diffraction spot pattern from a single grain in a polycrystalline aluminum sample. The spots are indexed in the accompanying computer-generated drawing. Source: Ref 3 More
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Published: 01 December 1998
Fig. 23 Combined TEM imaging, electron diffraction identification, and elemental microanalysis of P, σ, and μ intermetallic phases of alloy 22 weld metal. Source: Ref 3 More
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Published: 15 December 2019
Fig. 9 Reflection high-energy electron diffraction system that uses a fluorescent screen to display and a photomultiplier to record the diffraction pattern. A heater is shown behind the sample. The incident beam (top) strikes the surface at grazing angles. (Arrows represent electrons.) More
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Published: 15 December 2019
Fig. 32 Selected-area electron diffraction pattern from a body-centered cubic (bcc)-Fe/face-centered cubic (fcc)-Ni interface showing the Nishiyama-Wassermann orientation relationship. Courtesy of K. Lorcharoensery More
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Published: 15 December 2019
Fig. 36 Concept of convergent beam electron diffraction (CBED) pattern formation. Electron rays of (a) nontilted and (b) tilted incident beams More
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Published: 15 December 2019
Fig. 37 Comparison of (a) selected-area electron diffraction and (b) convergent beam electron diffraction patterns from a [011]-projected stainless steel specimen. Courtesy of J.P. Cline More
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Published: 15 December 2019
Fig. 40 Convergent beam electron diffraction (CBED) patterns from [111]-projected BaBiO 3 . (a) Complete CBED pattern including higher-order Laue zone rings (both first-order Laue zone, or FOLZ, and second-order Laue zone, or SOLZ). (b) Zero-order Laue zone disks. Reprinted with permission More
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Published: 15 December 2019
Fig. 41 (a) Schematic diagram for the precession electron diffraction (PED) method, illustrating tilting and detilting of the beam before and after the specimen. (b) Conventional selected-area electron diffraction pattern from Er 2 Ge 2 O 7 . (c, d) PED patterns with tilt angles of 20 and 47 More
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Published: 15 December 2019
Fig. 42 (a) Precession electron diffraction (PED) patterns from various LiBH 4 particles acquired in very low-dose conditions. (b) Refined crystalline structure of LiBH 4 using the PED patterns. Reprinted with permission from Ref 28 . Copyright 2012 American Chemical Society More
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Published: 01 December 2004
Fig. 12 Electron backscatter diffraction (EBSD) geometry showing the position of the phosphor screen relative to the specimen-beam interaction position More
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Published: 01 December 2004
Fig. 34 Transmission electron micrograph and diffraction pattern of high-pressure die cast AJ52. The eutectic phase has a lamellar structure consisting of alternating layers of magnesium and Al 4 Sr. The lamellar structure is similar to that of AE42 and AXJ530. Courtesy of Éric Baril, Noranda More
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Published: 01 December 2004
Fig. 7 Electron backscattered diffraction orientation micrographs of UNS S30400 stainless steel strip. (a) As-solidified surface cast on a smooth substrate. (b) Through-thickness structure of (a). (c) As-solidified surface cast on a ridged substrate. (d) Through-thickness structure of (c More