1-20 of 375 Search Results for

electron diffraction

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... of constructive interference between these waves. The mirror reflection [(00) beam] and the first- and second-order diffracted beams are shown. Fig. 6 Reciprocal lattice and Ewald construction corresponding to low-energy electron diffraction and comparison to real-space picture. (a) Real-space schematic...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001769
EISBN: 978-1-62708-178-8
.... The mirror reflection [(00) beam] and the first- and second-order diffracted beams are shown. Fig. 6 Reciprocal lattice and Ewald construction corresponding to LEED and comparison to real-space picture. (a) Real-space schematic diagram of diffraction from a surface. The electron beam is incident...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... Fig. 1 Inverse pole figure orientation map and pole figures from a grain-oriented electrical steel transformer. (a) Inverse pole figure orientation map with respect to the rolling direction. (b) {001}, {110}, and {111} pole figures extracted from the electron backscatter diffraction map data...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... √ … … Fig. 24 (a) Real and (b) reciprocal lattices of a body-centered cubic structure. (c) Simulated electron diffraction patterns for a body-centered cubic structure in the [001], [011], [111], and [112] directions Fig. 15 Schematic diagrams of (a) a charge-coupled device (CCD)-based electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... in which it can be used. It begins with a discussion on the principles of diffraction and scattering and the effectiveness of x-ray, neutron, and electron energy sources for different types of measurements. It provides information on data collection and reduction and explains how to create atomic...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005532
EISBN: 978-1-62708-197-9
... include pole figure measurement and electron backscatter diffraction (EBSD). The article describes the process considerations for pole figure measurement, including X-ray diffraction, neutron diffraction, stereographic projection, equal area projection, graphing pole figures, typical textures...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001300
EISBN: 978-1-62708-170-2
.... The experimental techniques for microstructural characterization include metallographic technique, X-ray diffraction, electron, microscopies, and porosimetry. coating structure electrodeposition electron microscopy metallographic technique microstructural characterization plasma spraying porosimetry...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... and that the sequence of phase changes occurring during the approach to equilibrium be investigated as a function of time. This involves use of a wide variety of techniques, including phase identification by x-ray or electron diffraction, spectroscopic methods, and thermal analysis methods. Because phase diagrams...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... of ∼20 kV (much better resolution, ∼100 nm, can be obtained using low voltage beams) Electron diffraction characterization of crystal structure and orientation: ∼1 μm Threshold sensitivity for elemental analysis using EDS detector: ∼1% Precision of quantitative elemental analysis using EDS...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... characterization of elemental chemistry: ∼2 μm using typical beam voltages of ∼20 kV (much better resolution, ∼100 nm, can be obtained using low voltage beams) Electron diffraction characterization of crystal structure and orientation: ∼1 μm Threshold sensitivity for elemental analysis using EDS...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 4A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v04a.a0005800
EISBN: 978-1-62708-165-8
... the parameters associated with resistance spot welding, laser welding, and metal active gas welding. It also provides useful information of retained austenite volume fraction measured by x-ray diffraction and electron backscatter diffraction. The article also examines microstructure evolution during tensile...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
..., SCM, EFM, SKPM, EDS, EELS, XPS, SIMS, LEAP, ARPES EPMA: electron microprobe analysis; IR/FTIR: infrared spectrometry, Fourier-transform infrared spectrometry; PL/tr:PL: photoluminescence/time-resolved photoluminescence; XRD: x-ray diffraction; XRF: x-ray fluorescence; TEM: transmission electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
..., oxidation, surface chemical reaction, surface contamination, wear, depth profile of each element with ion gun sputtering Low-energy electron diffraction (LEED) Electrons Diffraction electrons Surface crystallography and microstructure 10 μm 0.4–2 nm Adsorption, catalysis, chemical reactions...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003744
EISBN: 978-1-62708-177-1
... showing the cross-section view. Shaded grains are near-{111} oriented. Also shown is a chart plotting the angular deviation from {100} as a function of position through the plate thickness. Fig. 3 Orientation image (obtained by mapping of automated electron backscatter diffraction data...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... microscope LCT low coiling temperature LDPE low-density polyethylene LEED low-energy electron diffraction ln natural logarithm (base e ) log common logarithm (base 10) LPCVD low-pressure chemical vapor deposition LSI large-scale integrated (circuit...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... longitudinal, liter lb pound lbf pound force LBW laser beam welding LCL lower control limit LEED low-energy electron diffraction LEFM linear elastic fracture mechanics LME liquid metal embrittlement LMP Larson-Miller parameter ln natural logarithm (base e ) LNG...