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electron channeling pattern

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Image
Published: 01 January 1986
Fig. 25 Electron channeling pattern of vanadium taken in the ECP mode. Specimen current detector, no differentiation, γ/ D ′ = 1.2°/cm, 29 kV, magnification control of 20× More
Image
Published: 01 December 2004
Fig. 7 Selected area electron channeling pattern from a W-10Ni heavy metal alloy. The grain orientation can be determined from the pattern arising from the penetration and absorption of electrons at those locations where lattice planes in Bragg orientation cut the specimen surface More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... system. It discusses the contrasts mechanisms used for imaging and analyzing materials in the SEM. These include the topographic contrast, compositional contrast, and electron channeling pattern and orientation contrast. Special instrumentation and accessory equipment used at elevated pressures...
Image
Published: 15 December 2019
exhibiting channeling contrast that results in an electron channeling pattern. Vertical {220} planes with respect to the aluminum (111) surface are identified. Courtesy of J. Kamaladasa, Carnegie Mellon University More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... of the instrumentation and principles of SEM, broadly explaining its capabilities in resolution and depth of field imaging. It describes three additional functions of SEM, including the use of channeling patterns to evaluate the crystallographic orientation of micron-sized regions; use of backscattered detectors...
Image
Published: 15 December 2019
Fig. 36 (a) Illustration of beam rocking to produce a selected-area channeling pattern (SACP) from a single grain (grains denoted by A, B, and C). (b) Backscattered electron micrograph of a polished steel sample with four example SACPs acquired from individual grains. Courtesy of S. Singh More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Abstract This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... for imaging and the generation of channeling patterns, emitted x-ray spectra, and energy loss electrons. These signals can be used individually or in various combinations to characterize microstructure, crystallography, and compositional variations in engineering materials. Elastic Scattering When...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... at the surface is scanned in a suitably equipped SEM. When the electron beam is left stationary at one location on the specimen surface with a 20° incidence angle between the beam and the surface, the backscattered electrons diffract, giving rise to sets of cones of high and low intensity. To image the pattern...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006637
EISBN: 978-1-62708-213-6
... is extremely small. In a typical emission pattern of helium ions, three atoms at the needle apex contribute more than 90% of the emission. Fig. 5 Schematic of a helium ion microscope. Source: Ref 24 Major Steps of RBS Data Analysis This section discusses channel-energy conversion, energy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... magnified image of the specimen, and thus, it is called the first-image plane. In addition, parallel rays diffracted from the specimen via scattering are focused at the back focal plane. So, electron diffraction patterns form at the back focal plane as a result of scattering. The image of the specimen...
Series: ASM Handbook
Volume: 4C
Publisher: ASM International
Published: 09 June 2014
DOI: 10.31399/asm.hb.v04c.a0005895
EISBN: 978-1-62708-167-2
.... (a) Mechanical switching. (b) Electronic power distribution. Source: ABP Induction Fundamental Principles of Channel Induction Furnaces The channel induction furnace (CIF), as shown in Fig. 2 , is used for holding and casting of ferrous and nonferrous metals and, due to its good efficiency, also...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... by the precision of the deflection electronics and of the pattern generator or scan generator that control them. Other factors to consider are vibration and drift, both factors that introduce relative motion between the source and the sample. Vibration and drift can arise from some nanometer-scale flexure...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... lattice length along the c axis; velocity (speed of light) CARCA computer-assisted rocking curve analysis CBEDP convergent-beam electron diffraction pattern CDF centered dark-field (image) CHA concentric hemispherical analyzer CIRCLE cylindrical internal...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... back after elastic collision Atomic number contrast, channeling contrast, channeling patterns, and magnetic contrast in SEM Backscattered (inelastic) Energies less than beam energy Beam electron scattered back after inelastic collision Atomic number contrast, channeling contrast, channeling...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... channeling pattern ECR electron cyclotron resonance E d displacement energy EDM electrical discharge machining EDS energy-dispersive spectrometer EDX energy-dispersive spectroscopy EDXA energy dispersive x-ray analysis EEC erosion-enhanced corrosion...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
.... below ambient temperatures with laser tech- bright-edge effect. The effect seen in scan- niques before being ionized. ning electron microscopy or focused ion channeling pattern. A pattern of lines cold nger. A liquid-nitrogen-cooled cold trap beam images in which topographic edges observed...
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.a0006576
EISBN: 978-1-62708-290-7
... 16 – 19 ). Yan et al. conducted in-depth transmission electron microscopy (TEM) for phase identification in as-deposited H13 and their findings are summarized in Fig. 5 . Fig. 5 Shows TEM bright field and/or dark field images along with the selected area electron diffraction (SAED) patterns...
Series: ASM Handbook
Volume: 4C
Publisher: ASM International
Published: 09 June 2014
DOI: 10.31399/asm.hb.v04c.a0005841
EISBN: 978-1-62708-167-2
..., channel (slot), pancake, hairpin, butterfly, split-return, or internal coils. It discusses the variables pertinent to the design of inductors for brazing, soldering, or heat treating. The article presents various considerations for designing inductors for brazing of dissimilar materials that present...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... that the electron-generating portion was comprised of tungsten and the surrounding cup was comprised of tantalum, and that nothing had changed in the manufacturing process of the CRTs. Fig. 14 Cathode ray tube cathode. (a) Tungsten region. (b) Tantalum cup Micro-XRD patterns ( Fig. 15 ) were collected...