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diffractometers
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Image
Published: 15 December 2019
Fig. 5 Single-crystal diffractometers: (a) combination of four-circle kappa goniometer and charge-coupled device detector (image of Rigaku Oxford Diffraction instrument; source: Ref 14 ); (b) combination of three-circle goniometer and image plate detector (image of STOE IPDS II instrument
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Image
Published: 15 December 2019
Fig. 5 Schematic representations of state-of-the-art neutron diffractometers. (a) Reactor-based instrument, D20 at the Institut Laue-Langevin in France, allowing access to multiple incident wavelengths through gaps in the biological shielding of heavy concrete. These are placed to match
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
... devices, including pinhole/Laue cameras, Debye-Scherrer/Gandolfi cameras, Guinier cameras, glancing angle cameras, conventional diffractometers, thin film diffractometers, Guinier diffractometers, and micro diffractometers. The article then describes several quantitative measurement methods...
Abstract
X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders or aggregates of finely divided material that readily diffract x-rays in specified patterns. This article provides an introduction to XRPD, beginning with a review of sensing devices, including pinhole/Laue cameras, Debye-Scherrer/Gandolfi cameras, Guinier cameras, glancing angle cameras, conventional diffractometers, thin film diffractometers, Guinier diffractometers, and micro diffractometers. The article then describes several quantitative measurement methods, such as lattice parameter, absorption diffraction, spiking, and direct comparison, explaining where each may be used. It also identifies potential sources of error in XRPD measurements.
Image
Published: 01 January 1986
Fig. 8 Geometry of the Bragg-Brentano diffractometer. F, line source of x-rays from the anode of the x-ray tube; P, soller slits (collimator); D, divergent slit; A, axis about which sample and detector rotate; S, sample; R, receiving slit; RP, receiving soller slits; SS, scatter slit
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Image
Published: 01 January 1986
Fig. 9 Schematic of a thin film diffractometer. A, line source of x-rays; B, axial divergence of soller slit; C, glancing angle; D, sample; E, equatorial divergence soller slit; F, detector
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Image
Published: 01 January 1986
Fig. 12 Conventional four-circle diffractometer. Source: Ref 7
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Image
Published: 01 January 1986
Fig. 6 Eulerian cradle mounted on the ω-axis of a diffractometer. The unit vectors S 0 and S depict the source and diffracted beams, respectively. The angles χ and η correspond to those shown in Fig. 2 .
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Image
Published: 01 January 1986
Fig. 18 Double crystal diffractometer arrangements. (a) (+, −) setting. (b) (+, +) setting. Source: Ref 27
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Image
Published: 01 January 1986
Fig. 20 Double crystal diffractometer (a) and beam expansion by reflection from two asymmetrically cut crystals in succession (b). Source: Ref 24 , 38
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Image
Published: 01 January 1986
Fig. 22 Double crystal diffractometer for polycrystalline samples. Source: Ref 40 , 41
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Image
Published: 01 January 1986
Fig. 1 Schematic diagram of a neutron powder diffractometer equipped with a multidetector bank. M, monochromator
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Image
Published: 01 January 1986
Fig. 3 Schematic diagram for a time-of-flight powder diffractometer. Incident wavelength is a function of time (rotor velocity) and detectors are stationary.
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Image
Published: 01 January 1986
Fig. 4 Time-of-flight single-crystal diffractometer at a pulsed neutron source. Detector is usually fixed at 90° 2θ, and diffraction is recorded in Laue's geometry. The sample (a single crystal) is positioned by Eulerian angle motions.
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Image
Published: 01 January 1986
Fig. 8 LEED diffractometer. The vidicon camera can be interfaced with a computer to record the diffraction pattern displayed on the fluorescent screen.
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Image
Published: 01 January 2000
Fig. 14 Photograph of a miniature x-ray diffractometer for the one angle technique arrangement of XRD stress measurement. This device incorporates a Ruud-Barrett position sensitive scintillation detector and is capable of being inserted in a 101.60 mm (4 in.) inside diameter for measuring
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Image
Published: 01 December 1998
Fig. 8 Schematic of x-ray diffractometer. Typically, the x-ray tube remains stationary while the detector mechanically scans a range of θ angles. The sample also rotates with the detector such that diffraction is recorded from planes parallel to the sample surface.
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Image
Published: 15 December 2019
Fig. 8 Low-energy electron diffractometer. The Vidicon camera can be interfaced with a computer to record the diffraction pattern displayed on the fluorescent screen. The goniometer can be tilted in all three directions.
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Image
Published: 01 November 1995
Fig. 5 Schematic showing key components of an x-ray powder diffractometer
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Image
Published: 15 December 2019
Fig. 13 Single-crystal diffractometer. (a) Euler and (b) kappa geometries
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Image
Published: 15 December 2019
Fig. 3 Schematic of x-ray diffractometer. Typically, the x-ray tube remains stationary while the detector mechanically scans a range of θ angles. The sample also rotates with the detector such that diffraction is recorded from planes parallel to the sample surface.
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