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design for testability

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Series: ASM Handbook
Volume: 20
Publisher: ASM International
Published: 01 January 1997
DOI: 10.31399/asm.hb.v20.a0002434
EISBN: 978-1-62708-194-8
... Abstract This article describes how design can unfavorably affect product quality. It provides information on the total quality management philosophy, emphasizing the principles of quality management. The article discusses various methods for evaluating a product design for quality. It presents...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001395
EISBN: 978-1-62708-173-3
... complete melting, as well as good solder flow, and to aid fillet formation. This is designated T 1 in Fig. 3 . The supplier should be consulted to provide the actual temperature for a particular formulation. The duration of time at which a solderable interconnect resides above the melting point...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003503
EISBN: 978-1-62708-180-1
... Abstract This article describes the methodology for performing a failure modes and effects analysis (FMEA). It explains the methodology with the help of a hot water heater and provides a discussion on the role of FMEA in the design process. The article presents the analysis procedures and shows...
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0007021
EISBN: 978-1-62708-439-0
... of this writing (2023), certification requirements from these agencies continue to evolve and can be subject to point design, or one-off, certification requirements for each part. Depending on the application, these requirements include significant qualification of materials, machine, and process; development...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... electron microscope. The lenses are designed to allow focusing of the beam to a diameter of 2 nm or less, An electron-diffraction pattern can be generated using this small probe. This technique is referred to as a type of electron microdiffraction. Because the finely focused beam is highly convergent...