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Image
Published: 01 January 2002
Fig. 3 Illustration showing how depth of focus is dependent on specimen pixel size and aperture size
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Image
Published: 01 December 2004
Fig. 11 The depth of focus of an optical system, h , is the distance from the plane of optimal focus within which the beam diverges by no more than the spot diameter d 1 , d 1 will be limited by diffraction and aberrations.
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Image
Published: 15 January 2021
Fig. 3 Illustration showing how depth of focus is dependent on specimen pixel size and aperture size
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Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005641
EISBN: 978-1-62708-174-0
... = 1.488 F 2 λ where F equals f λ of the optics. One can see from the previous expression that as the F number of the focusing optics increases, depth of focus also increases. However, this is also accompanied by an increased beam diameter...
Abstract
This article provides an overview of the fundamentals, mechanisms, process physics, advantages, and limitations of laser beam welding. It describes the independent and dependent process variables in view of their role in procedure development and process selection. The article includes information on independent process variables such as incident laser beam power and diameter, laser beam spatial distribution, traverse speed, shielding gas, depth of focus and focal position, weld design, and gap size. Dependent variables, including depth of penetration, microstructure and mechanical properties of laser-welded joints, and weld pool geometry, are discussed. The article also reviews the various injuries and electrical and chemical hazards associated with laser beam welding.
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... Abstract This article introduces the concepts of electron and light microscopy with some general features of imaging systems and the ideas of magnification, resolution, depth of field, depth of focus, and lens aberrations as they apply to simple and familiar light-optical systems. In addition...
Abstract
This article introduces the concepts of electron and light microscopy with some general features of imaging systems and the ideas of magnification, resolution, depth of field, depth of focus, and lens aberrations as they apply to simple and familiar light-optical systems. In addition, it describes the differences between electron and light in the context of their respective microscopy techniques.
Image
Published: 01 June 2024
. The image was recorded as a 24-bit TIF color image, and the depth of focus was improved by stack focusing (see the section “ Stack Focusing, Focus Stacking, Z -Stacking, Focal Plane Merging, Deep Focus ” in this article). Source: Ref 9
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Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001445
EISBN: 978-1-62708-173-3
... the beam was focused 4 mm (0.16 in.) below the surface, the depth of penetration was almost the same as that for the 2 mm (0.08 in.) focus depth. The general consensus is that the optimum position for the focal point is below the surface, but the exact distance is dependent on the thickness...
Abstract
Laser-beam welding (LBW) is a joining process that produces coalescence of material with the heat obtained from the application of a concentrated coherent light beam impinging upon the surface to be welded. This article describes the steps that must be considered when selecting the LBW process. It reviews the individual process variables that influence procedure development of the LBW process. Joint design and special practices related to LBW are discussed. The article concludes with a discussion on the use of consumables and special welding practices.
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005610
EISBN: 978-1-62708-174-0
..., showing keyhole-type behavior at the respective sharp focus settings. However, differences in the characteristics of sharply focused beams also result in differences in the measured depth and width of each weld. The measured weld depths produced at the respective sharp focus settings show a difference...
Abstract
The primary goal of quality control in electron beam (EB) welding is to consistently produce defect-free and structurally sound welds. This article discusses the common procedures for controlling the EB welding process, the control of the essential machine parameters, and the introduction of closed-loop controls and diagnostic feedback systems in the EB welding systems. It reviews the beam diagnostic tools that interrogate the beam to produce a reconstruction of the power density distribution and provide additional information on the size and shape of the EB. Knowledge of these beam parameters can be used to improve process understanding and control. The article also describes the application areas of beam diagnostics: machine characterization, weld parameter transfer, and weld quality control.
Image
Published: 15 December 2019
Fig. 3 Relationship between the numerical aperture and the color of light on the depth of focus of a light microscope. Courtesy of the Carl Zeiss Co.
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Image
Published: 15 December 2019
Fig. 53 Palladium nanorods grown on a sacrificial template of ZnO nanowires. The depth of focus is evident in the high resolution in both the foreground and the background.
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Image
Published: 15 December 2019
Fig. 15 Effect of (left) longer working distance (WD) and (right) smaller objective aperture size on depth of field (DOF) and associated size of region in effective focus
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Image
Published: 01 June 2012
Fig. 3 Light microscopy image of as-cut surfaces of a stainless steel stent. This image was produced from multiple images combined using an extended depth-of-field technique to allow the surfaces of interest to be in focus in a single image.
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Image
Published: 15 December 2019
Fig. 16 Micrographs of tin spheres recorded by (a) optical microscope (OM) and (b) scanning electron microscope (SEM). Focusing the OM on the smallest spheres results in blurring of larger spheres, while spheres of all sizes are in focus with the SEM due to better depth of field.
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Image
Published: 01 August 2018
Fig. 23 C-mode scanning acoustic microscopy reflection-mode image at 50 MHz made by setting the gate and focus to approximately 1 mm (0.04 in.) below the surface. The white circular spots correspond to individual pores located at this depth. Field of view: 30 × 30 mm
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Book: Fractography
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 June 2024
DOI: 10.31399/asm.hb.v12.a0006945
EISBN: 978-1-62708-387-4
.... This is an optical 8-bit image of a fatigue crack surface in a high-strength aluminum alloy that has not been enhanced, other than by changing the contrast and brightness. Out-of-focus areas are also obvious and are due to the low focal depth of optical microscope lenses (described in more detail later...
Abstract
This article presents a basic overview of technology-driven advances in the imaging of primarily metallic fracture surfaces. It describes various types of microscopes, including scanning electron, dual-beam, ion source, and transmission electron microscopes, and their capabilities. It also covers other useful hardware, such as computer-aided tomography (CAT) and micro-computer-aided tomography (micro-CAT) instruments. The article introduces some of the fracture image postprocessing methods and software, including image registration or alignment, focus stacking, Z-stacking, focal plane merging, and image stitching.
Image
Published: 01 June 2024
Fig. 23 SEM and optical (deep-focus) images showing the marker bands at the end of “superblock” repeats. Each image was taken at a similar crack depth for two rudder hinge fittings made from AA7075-T73 aluminum alloy. (a) SEM image from the first item tested. (b, c) Optical images from
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Book: Fractography
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001833
EISBN: 978-1-62708-181-8
... camera. Viewfinder magnifiers are available for use with 35-mm SLR cameras. A clear spot in the center of the ground glass crossed with fiduciary marks can aid in focusing dim images. Screens of this type are available for 35-mm SLR cameras. The plane of focus will be rendered with the highest...
Abstract
This article discusses the preparation of photomacrographs of fracture surfaces. It provides useful information on the equipment used, such as view cameras, 35-mm single-lens-reflex cameras, and stereomicroscopes. The article describes the role of lenses, focusing, camera magnification, and selection of lens aperture in a microscopic system. It illustrates the lighting techniques employed in photography and highlights the use of different films. The article concludes with a list of auxiliary equipment used in fracture surface photography.
Book: Fractography
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 June 2024
DOI: 10.31399/asm.hb.v12.a0006846
EISBN: 978-1-62708-387-4
.... Problems with autofocus, flash, and depth of field are common. Most digital cameras allow an image to be taken when the camera/subject distance is less than the minimum focal length of the lens, resulting in out-of-focus images. However, most cameras also have a close-up or macro setting that enables...
Abstract
This article provides a discussion on the following photographic equipment: point-and-shoot cameras, digital single-reflex cameras, stand-mounted digital zoom cameras, and digital microscope cameras. It presents two principal types of optical microscopes that are appropriate for visual examination of fractured parts: the stereomicroscope and the single-light-path digital microscope. The common features present on fracture surfaces are each considered separately, both in their significance and as photographic challenges. The article also presents a short note on low-magnification scanning electron microscopy and postcapture image processing.
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006851
EISBN: 978-1-62708-395-9
..., and priority controls, such as aperture, shutter, and program. Additional features include capturing of multiple planes of focus with subsequent image stitching (Z-stacking) to produce full depth-of-field focus images. Some digital photography cameras also feature high-resolution video and audio recording...
Abstract
Failure analysis is an investigative process in which the visual observations of features present on a failed component and the surrounding environment are essential in determining the root cause of a failure. This article reviews the basic photographic principles and techniques that are applied to failure analysis, both in the field and in the laboratory. It discusses the processes involved in visual examination, field photographic documentation, and laboratory photographic documentation of failed components. The article describes the operating principles of each part of a professional digital camera. It covers basic photographic principles and manipulation of settings that assist in producing high-quality images. The need for accurate photographic documentation in failure analysis is also presented.
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... lens with a ring flash is beneficial. Depth of field in macrophotography is critical. At very close focal distances, the depth of field will be limited. Typically, higher f-stop numbers, such as F11 and F16, are selected in macrophotography to ensure that the entire fracture surface is in focus...
Abstract
Failure analysis is an investigative process that uses visual observations of features present on a failed component fracture surface combined with component and environmental conditions to determine the root cause of a failure. The primary means of recording the conditions and features observed during a failure analysis investigation is photography. Failure analysis photographic imaging is a combination of both science and art; experience and proper imaging techniques are required to produce an accurate and meaningful fracture surface photograph. This article reviews photographic principles and techniques as applied to failure analysis, both in the field and in the laboratory. The discussion covers the processes involved in field and laboratory photographic documentations, provides a description of professional digital cameras, and gives information on photographic lighting and microscopic photography. Special techniques can be employed to deal with highly reflective conditions and are also described in this article.
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