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Image
Published: 01 January 1986
Fig. 14 Depth-of-field comparison between optical microscopy (a) and SEM (b). Original magnification, 300× More
Image
Published: 01 January 1987
Fig. 3 Recommended f /numbers for optimum depth of field with high resolution. See Table 1 . Source: Ref 4 More
Image
Published: 01 December 2004
Fig. 17 Relationship among depth of field of the image produced, numerical aperture of the objective used, and wavelength of light employed More
Image
Published: 31 December 2017
Fig. 7 Depth of hardpan layer contours across a field in the silty uplands of northern Mississippi. The hardpan depth was defined at the depth of the occurrence of the 2 MPa (0.29 ksi) level of cone index. Adapted from Ref 9 More
Image
Published: 30 November 2018
Fig. 21 Effect of magnetic field on penetration depth and inlet diameter with increasing number of pulses. Source: Ref 71 More
Image
Published: 01 August 2018
Fig. 23 C-mode scanning acoustic microscopy reflection-mode image at 50 MHz made by setting the gate and focus to approximately 1 mm (0.04 in.) below the surface. The white circular spots correspond to individual pores located at this depth. Field of view: 30 × 30 mm More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... Abstract This article provides information on the basic components of a light microscope, including the illumination system, collector lens, and optical and mechanical components. It describes optical performance in terms of image aberrations, resolution, and depth of field. The article...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... Abstract This article introduces the concepts of electron and light microscopy with some general features of imaging systems and the ideas of magnification, resolution, depth of field, depth of focus, and lens aberrations as they apply to simple and familiar light-optical systems. In addition...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... of the instrumentation and principles of SEM, broadly explaining its capabilities in resolution and depth of field imaging. It describes three additional functions of SEM, including the use of channeling patterns to evaluate the crystallographic orientation of micron-sized regions; use of backscattered detectors...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... Abstract The application of transmission electron microscope to the study of fracture surfaces and related phenomena has made it possible to obtain magnifications and depths of field much greater than those possible with light (optical) microscopes. This article reviews the methods...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006458
EISBN: 978-1-62708-190-0
... Abstract This article describes the basic features of electromagnetic acoustic transducers (EMATs) and discusses their existing and some potential uses within the field of ultrasonic nondestructive evaluation (UNDE). It provides sufficient basic and practical information to make an informed...
Series: ASM Handbook
Volume: 4C
Publisher: ASM International
Published: 09 June 2014
DOI: 10.31399/asm.hb.v04c.a0005857
EISBN: 978-1-62708-167-2
... current (ac) potential drop and field methods can be used to measure the depths of cracks and other defects in metals. The simplest ultrasonic method for measuring the depth of a surface-breaking crack is to locate the probe on the surface opposite to the surface containing the crack and then to note...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003233
EISBN: 978-1-62708-199-3
... is registered on a magnetic tape pressed onto the surface). Analysis of Leakage Field Data Most leakage-field testing applications require flaw detection and an estimate of the severity. Flaw characterization is based on the relation of leakage field signal amplitude to flaw size (and depth...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001833
EISBN: 978-1-62708-181-8
... surface lenses scanning light photomacrography stereomicroscopes visual examination PHOTOGRAPHY plays an important role in recording the features of a fracture. Most optical fractographs will be at magnifications of 1× and greater. Depth-of-field inadequacies usually limit the maximum...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003234
EISBN: 978-1-62708-199-3
... serviceability can cause instrument signals that mask critical variables or are mistakenly interpreted to be caused by critical variables. Eddy-Current vs. Magnetic Inspection Methods In eddy-current inspection, eddy currents create their own electromagnetic field, which is sensed either through...
Image
Published: 01 January 1990
Fig. 19 The critical state model of flux penetration into a superconducting slab. As the applied field is raised from zero (a and b), the field penetrates the surface of the superconductor to a depth p The gradient of the field (∂ B /∂ x is equal to the critical current density ( J c More
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001400
EISBN: 978-1-62708-173-3
... to the overall coupling efficiency (and therefore heating rate) caused by resistance changes are not easily predicted because part geometry and penetration depth of the electromagnetic field have a synergistic effect. Relationship of temperature to electrical resistivity, the product of specific heat...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... Technique Property Advantages Limitations Light microscopy Physical morphology True color, ambient conditions, few sample limitations Limited magnification, low depth of field Scanning electron microscopy Physical morphology Spatial resolution, rapid data collection Potentially destructive...
Image
Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006476
EISBN: 978-1-62708-190-0
... ), as shown in Fig. 8 . Fig. 8 Example of magnetic Barkhausen noise signal amplitude versus applied field in a ferrite steel and three martensite steels with varying carbon content. Source: Ref 10 Detection of Case Depth As an alternative to sectioning and metallography, MBN can be used...