1-9 of 9 Search Results for

delayering

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 15 December 2019
Fig. 36 (a) Typical focused ion beam (FIB)/sample orientation for top-down delayering. (b) FIB image of newly exposed surface More
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006460
EISBN: 978-1-62708-190-0
Series: ASM Handbook
Volume: 20
Publisher: ASM International
Published: 01 January 1997
DOI: 10.31399/asm.hb.v20.a0002428
EISBN: 978-1-62708-194-8
... for many corporate activities, it does not work well for developing innovative new products, which require heavy horizontal information flow. Fortunately, corporate organizational structures are becoming more horizontal as firms delayer, decentralize, empower workers, and move toward team-based...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... individual transistors within an integrated circuit (see article “Focused Ion Beam Instruments” in this Volume) ( Ref 3 ). Delayering , or removing the insulating and conducting layers in the interconnect structure from the surface of the semiconductor, can be accomplished with mechanical, ion...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006478
EISBN: 978-1-62708-190-0
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.9781627081900
EISBN: 978-1-62708-190-0
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003436
EISBN: 978-1-62708-195-5
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6