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deep-field microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... of the absorbed current, because the sample itself acts as detector. Secondary and backscattered electrons may be used to image the sample topography. Advantages in comparison to light optical microscopy include the greater depth of field and the higher lateral resolution. Topographic contrast is, in most...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001237
EISBN: 978-1-62708-170-2
...Quantitative image analysis Table 1 Quantitative image analysis Field measurements (stereology) Object measurements (feature measurement) Area fraction Area Area percent Length ASTM E 112 grain size Width Count Aspect ratio Perimeter Feret measurements Mean...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001834
EISBN: 978-1-62708-181-8
... J.E. , The Operation and Modification of the Deep Field Microscope , in Proceedings of the 2nd Annual Technical Meeting , International Metallographic Society , 1969 , p 171 – 177 40. Waddell J.H. , Deep-Field Low-Power Microscope , Res. Dev. , Vol 19 , May 1968 , p 34 41...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... of light microscopy are covered in the Section “Metallography” and will not be repeated here. While light microscopy is an important metallurgical tool, it has a number of limitations: Spatial resolution: Conventional light microscopes cannot resolve features smaller than ∼1 μm. Depth of field...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... microscopy are covered in the Section “Metallography” and will not be repeated here. While light microscopy is an important metallurgical tool, it has a number of limitations: Spatial resolution: Conventional light microscopes cannot resolve features smaller than ∼1 μm. Depth of field: Light...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi-fluorescence. The article also provides information on transmitted light microscopy. References References 1. Mallick P.K. , Fiber-Reinforced Composites, Materials...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006387
EISBN: 978-1-62708-192-4
... microscope (TEM) images showing atomic wear on the silicon substrate. (a) An ~7.5 nm deep wear scar formed on silicon surface after sliding by a SiO 2 microsphere. Inset shows the AFM image of the wear scar. (b) Representative lattice resolved image in worn area marked with a box (dotted line...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
.... , and Succop P. , Use of a Field Portable X-Ray Fluorescence Analyzer to Determine the Concentration of Lead and Other Metals in Soil Samples , Ann. Agricul. Environ. Med. , Vol 6 ( No. 1 ), 1999 , p 27 – 32 2. Handbook of Analytical Methods for Materials , Materials Evaluation and Engineering...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003747
EISBN: 978-1-62708-177-1
...-acetic acid-ethanol reagent. Viewed in polarized light. 100×. (b) Compressed uniaxially at 200 °C. Etched in a picric acid-acetic acid-ethanol reagent. Viewed in bright-field illumination. 400×. Source: Ref 9 Fig. 1 Annealed 70-30 brass. (a) Taper section (horizontal magnification 600...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... of the sample surface. (b) The magnetic contrast is found by scanning the magnetic probe at a constant distance from the surface. A force due to the interaction of the magnetic tip with the magnetic field gradient from the sample provides the image. Fig. 36 Comparison of Kerr microscopy domain image...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006796
EISBN: 978-1-62708-295-2
... fields such as rain erosion of solid materials, gas turbine blades, wind turbine blades, airplane components, and pipe-wall thinning in nuclear/fossil power plants. Because of the fundamental interest in the mechanics of fluids and solids, this topic has been reviewed by Heymann ( Ref 1 ) and Richman...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
...-field micrographs are shown of the planar and side view of the composite for comparison. Fig. 2 Photograph of an ultrathin section made from a glass fabric composite material. In this sample, the backing pieces are made from carbon fiber composite to provide contrast with the glass fabric...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006383
EISBN: 978-1-62708-192-4
... T.C. , Deflaun M.F. , Hubbard S.S. , Radtke J. , Kovacik W.P. , and Holben W. , Ferrographic Tracking of Bacterial Transport in the Field at the Narrow Channel Focus Area, Oyster, VA , Environ. Sci. Technol. , Vol 35 , 2001 , p 182 – 191 10.1021/es001170e 130...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005504
EISBN: 978-1-62708-197-9
...-D atom probe tomography, field ion microscopy, and transmission electron microscopy tomography) and methods that examine very large volumes with much coarser resolution (such as mechanical serial sectioning coupled to optical microscopy, and x-ray tomography). The FIB instruments operate...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005605
EISBN: 978-1-62708-174-0
... interface was taken at the high point, as shown in (a). Note: Linear void density is the inverse of linear weld density. Source: Ref 8 Fig. 6 Transmission electron microscopy (TEM) images. (a) Bright-field TEM image taken from an interface location with apparent good bonding. The interface...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... in subsequent sections of this article and in Ref 1 , 2 , 3 , 4 , 5 , 6 , 7 , and 8 . Uranium alloys with more than one phase are frequently etched and examined by bright-field microscopy. Etching is most often done electrolytically, although some chemical etchants are also used. Preparation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... μA ~7–10 1 × 10 4 Xe, O 2 , O Gas field ion source <2% precision <10 pA; <1 pA typical <1 1 × 10 9 He, Ne, H, N 2 Cold atom Coming soon 0.5 pA to 1 nA 0.3 2 × 10 7 Li, Cs Source: Ref 13, 16, 24 Fig. 13 Various species of elemental ion beams...
Series: ASM Handbook
Volume: 14A
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v14a.a0004018
EISBN: 978-1-62708-185-6
... at the sheared surfaces. The three macrographs in Fig. 21 show related views of the plastic zone near a crack tip. Dark-field illumination makes the heavily etched deformed regions appear white and the undeformed surrounding material appear dark. Flow lines usually are revealed by deep etching cross...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
...Abstract Abstract Field ion microscopy (FIM) can be used to study the three-dimensional structure of materials, such as metals and semiconductors, because successive atom layers can be ionized and removed from the surface by field evaporation. The ions removed from the surface by field...