Search Results for contrast-enhancement methods

This article describes the various aspects relating to the selection and preparation of ultrathin-section specimens of fiber-reinforced polymeric composites for examination by transmitted light microscopy. It provides information on the contrast-enhancement methods used by transmitted-light microscopy and optimization of microscope conditions. Examples of composite ultrathin sections analyzed using transmitted-light microscopy contrast methods are also presented.

Metallographic contrasting methods include various electrochemical, optical, and physical etching techniques, which in turn are enhanced by the formation of a thin transparent film on the specimen surface. This article primarily discusses etching in conjunction with light microscopy and describes several methods for film formation, namely, heat tinting, color etching, anodizing, potentiostatic etching, vapor deposition, and film deposition by sputtering. It provides information on the general procedures and precautions for etchants and reagents used in metallographic microetching, macroetching, electropolishing, chemical polishing, and other similar operations.

The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This article is intended to provide information that will help an investigator select the appropriate microscopy technique for the specific analysis objectives with a given composite material. The article opens with a discussion of macrophotography and microscope alignment, and then goes on to describe various illumination techniques that are useful for specific analysis requirements. These techniques include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical microscopy.

Microscopy is a valuable tool in materials investigations related to problem solving, failure analysis, advanced materials development, and quality control. This article describes the sample preparation techniques of composite materials. These techniques include mounting, rough grinding, and polishing. The preparation techniques of ultrathin sections are also summarized. The article explains the illumination methods used by reflected light microscopy to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi-fluorescence. The article also provides information on transmitted light microscopy.

This article describes the dispersed-phase toughening of thermoset matrices by the development of multiphase-structure thermosetting matrices using rubber and/or thermoplastic materials. It discusses two main methods for manufacturing prepregs, namely, single-pass impregnation and double-pass impregnation. The article illustrates reflected-light optical microscopy techniques to evaluate the morphology of thermoplastic materials for determining the material quality and correlating key microstructural features with material performance.

Zirconium, hafnium, and their alloys are reactive metals used in a variety of nuclear and chemical processing applications. This article describes various specimen preparation procedures for these materials, including sectioning, mounting, grinding, polishing, and etching. It reviews some examples of the microstructure and examination for zircaloy alloys, hafnium, zirconium, and bimetallic forms.

This article provides information on the basic components of a light microscope, including the illumination system, collector lens, and optical and mechanical components. It describes optical performance in terms of image aberrations, resolution, and depth of field. The article discusses the examination of specimen surfaces using polarized light, phase contrast, oblique illumination, dark-field illumination, bright-field illumination, interference-contrast illumination, and phase contrast illumination. Special techniques and devices that may be used with the optical microscope, to obtain additional information, are also described. The article concludes with information on photomicroscopy and macrophotography.

X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography. The article explains various topographic methods, namely, divergent beam method, polycrystal rocking curve analysis, line broadening analysis, microbeam method, and polycrystal scattering topography, as well as their instrumentation. It also describes the applications of x-ray topography.

Quantitative image analysis has expanded the capabilities of surface analysis significantly with the use of computer technology. This article provides an overview of the quantitative image analysis and optical microscopy. It describes the various steps involved in surface preparation of samples prone to abrasion damage and artifacts for quantitative image analysis.

This article reviews the main theoretical and practical aspects of sequence normally followed in digital image-acquisition, processing, analysis, and output for material characterization. It discusses the main methods of digital imaging, image processing, and analysis, as applied to microscopy of materials. The article describes the basic concepts of sampling and resolution and quantization of light microscopy, scanning electron microscopy, and transmission electron microscopy. It discusses the acquisition of a digital image that accurately represents the sample under observation and output of the image to a printer. The methods used to enhance the digital image and to extract quantitative information are also described. Different types of image segmentation, namely, adaptive segmentation and contour-based segmentation, are reviewed. The article also presents case studies on the application of image processing and analysis to materials characterization.

This article outlines the beam/sample interactions and the basic instrumental design of a scanning electron microscopy (SEM), which include the electron gun, probeforming column (consisting of magnetic electron lenses, apertures, and scanning coils), electron detectors, and vacuum system. It discusses the contrasts mechanisms used for imaging and analyzing materials in the SEM. These include the topographic contrast, compositional contrast, and electron channeling pattern and orientation contrast. Special instrumentation and accessory equipment used at elevated pressures and during the X-ray microanalysis are reviewed. The article also provides information on the sample preparation procedure and the materials applications of the SEM.

This article focuses on the modes of operation, physical basis, sample requirements, properties characterized, advantages, and limitations of the characterization methods used to evaluate the physical morphology and chemical properties of component surfaces for medical devices. These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy.

This article presents an approach to characterize the effects of surface treatments to enhance fatigue properties, with particular concern for wear, corrosion, and thermal effects. It discusses the considerations in selecting fabrication or subsequent surface processing procedures to improve fatigue resistance in terms of their respective effects on fatigue performance. The article details the experimental data sets representing specific materials, typical test geometries, and a range of different processing methods used to enhance resistance as compared to results for laboratory tests.

Radiography is a nondestructive-inspection method that is based on the differential absorption of penetrating radiation by the part or test piece (object) being inspected. This article discusses the fundamentals and general applications of radiography, and describes the sources of radiation in radiographic inspection, including X-rays and gamma rays. It deals with the characteristics that differentiate neutron radiography from X-ray or gamma-ray radiography. The geometric principles of shadow formation, image conversion, variation of attenuation with test-piece thickness, and many other factors that govern the exposure and processing of a neutron radiograph are similar to those for radiography using X-rays or gamma rays.

This article begins with an overview of the various aspects of infrared pulse thermography used to detect disbondments, delaminations, and generalized corrosion. It describes the distinctive phases of the pulse thermographic process and the key components that are required to perform active thermography. The components include an excitation source, a thermographic camera, and a computer with software that controls the instrumentation, acquires data, and displays the results. The article discusses the process and experimental setup of sonic thermography used for crack detection.

Computed tomography (CT) is an imaging technique that generates a three-dimensional (3-D) volumetric image of a test piece. This article illustrates the basic principles of CT and provides information on the types, applications, and capabilities of CT systems. A comparison of performance characteristics for film radiography, real-time radiography, and X-ray computed tomography is presented in a table. A functional block diagram of a typical computed tomography system is provided. The article discusses CT scanning geometry that is used to acquire the necessary transmission data. It also provides information on digital radiography, image processing and analysis, dual-energy imaging, and partial angle imaging, of a CT system.

This article describes the applications, methods, and limitations of five principal nondestructive test methods, namely, penetrant testing, magnetic-particle testing, eddy current testing, radiographic testing, and ultrasonic testing. The article also provides guidance for the method selection for respective applications.

X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.

Visual inspection is a nondestructive testing technique that provides a means to detect and examine a variety of surface flaws, such as corrosion, contamination, surface finish, and surface discontinuities. This article discusses the equipment used to aid visual inspection, including borescopes (rigid and flexible), optical sensors, and magnifying systems. The article discusses the special features of borescopes, the factors that influence the choice of a flexible or rigid borescope for use in a specific application, and some of the image sensors used in visual inspection.