1-20 of 447 Search Results for

contrast microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 December 2004
Fig. 35 Principles of phase contrast microscopy More
Image
Published: 01 December 1998
Fig. 17 Transmission electron microscopy grain orientation contrast in a sample of fine-grained polycrystalline silicon. Courtesy of Tom Headley, Sandia National Laboratories More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... Abstract The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This article is intended to provide information that will help an investigator select the appropriate microscopy...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... Abstract This article describes the various aspects relating to the selection and preparation of ultrathin-section specimens of fiber-reinforced polymeric composites for examination by transmitted light microscopy. It provides information on the contrast-enhancement methods used by transmitted...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
..., to obtain additional information, are also described. The article concludes with information on photomicroscopy and macrophotography. bright-field illumination dark-field illumination depth of field interference-contrast illumination light microscopy macrophotography mechanical components...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... scanning electron microscopy topographic contrast X-ray microanalysis THE SCANNING ELECTRON MICROSCOPE is one of the most versatile instruments for investigating the microstructure of materials. Under electron bombardment, a variety of different signals is generated (including secondary electrons...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy...
Image
Published: 01 June 2016
Fig. 40 Coherent transition precipitates revealed by strain contrast (dark-field) in transmission electron microscopy. The specimen is a Cu-3.1Co alloy aged 24 h at 650 °C (1200 °F). The precipitate is a metastable face-centered cubic (fcc) phase of virtually pure cobalt in the fcc matrix More
Image
Published: 01 December 2004
Fig. 12 Coherent transition precipitates revealed by strain contrast (dark-field) in transmission electron microscopy. The specimen is a Cu-3.1Co alloy aged 24 h at 650 °C (1200 °F). The precipitate is a metastable face-centered cubic (fcc) phase of virtually pure cobalt in the fcc matrix More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... Abstract Metallographic contrasting methods include various electrochemical, optical, and physical etching techniques, which in turn are enhanced by the formation of a thin transparent film on the specimen surface. This article primarily discusses etching in conjunction with light microscopy...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
... of the thermosetting resin. As a result, the phase separation of the rubber may be incomplete, which can lead to ambient- and elevated-temperature property degradation. In the following figures, ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... methods use several contrast-enhancement methods that are not commonly used in metallurgical reflective microscopy. These methods include bright field; polarized light; phase contrast; differential interference contrast (DIC), also known as Nomarski; modulation contrast, also known as Hoffman contrast...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... light and dark contrast in the image. Grains that transmitted a high percentage of the incident beam appear bright, and those that diffracted more of the incident beam appear dark. Figure 17 shows an example of this type of grain contrast. Fig. 17 Transmission electron microscopy grain...
Image
Published: 01 December 2004
Fig. 8 Transmitted-light microscopy of the natural fiber composite ultrathin section. Phase contrast, 40× objective More
Image
Published: 01 December 2004
Fig. 9 Transmitted-light microscopy of the natural fiber composite ultrathin section. Hoffman modulation contrast, 40× objective More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... Higher-magnification view of the same area as Fig. 5 . Bright-field illumination, 25× objective The use of phase contrast, which is not commonly performed using reflected-light microscopy, provided more insight into the fiber and matrix microstructure ( Fig. 7 ). This contrast technique...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009094
EISBN: 978-1-62708-177-1
...-matrix composite materials, focuses on the microstructure and morphology of these unique materials. In the following articles, the authors explain the materials, equipment, and procedures of how to prepare composite samples, followed by the illumination and contrast techniques of optical microscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
..., and (3) the use of voltage contrast, electron beam induced currents, and cathodoluminescence for such purposes as characterization and failure analysis of semiconductor devices. This article will provide detailed information on the instrumentation and principles of scanning electron microscopy (SEM...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents...
Image
Published: 01 August 2018
Fig. 25 Scanning acoustic microscopy surface-mode image at 400 MHz of a manganese-zinc ferrite sample that was polished metallurgically but not chemically etched. The elastic property differences between the various phases of this material are responsible for the contrast shown in this image More