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contrast microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
...Abstract Abstract The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This article is intended to provide information that will help an investigator select the appropriate...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... of fiber-reinforced polymeric composites for examination by transmitted light microscopy. It provides information on the contrast-enhancement methods used by transmitted-light microscopy and optimization of microscope conditions. Examples of composite ultrathin sections analyzed using transmitted-light...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... Microscopy (OIM) , J. Comput.-Assist. Microsc. , Vol 5 , 1993 , p 207 12. Katrakova D. , Maas C. , Hohnerlein D. , and Muecklich F. , Experiences on Contrasting Microstructure Using Orientation Imaging Microscopy , Prakt. Metallogr. , Vol 35 , 1998 , p 4 – 20 13...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... of the sample surface. (b) The magnetic contrast is found by scanning the magnetic probe at a constant distance from the surface. A force due to the interaction of the magnetic tip with the magnetic field gradient from the sample provides the image. Fig. 36 Comparison of Kerr microscopy domain image...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... the intersections of individual grains. Grain boundaries have a higher dissolution potential than the individual grains because of their high density of structural defects. Accumulation of impurities in grain boundaries increases this effect. Grain-contrast etching Etching the surface of the grains according...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... of 72 pixels denoted by the dotted white line. Fig. 11 Five scanning electron micrographs of gold nanoparticles recorded at various brightness and contrast settings, with superimposed waveform (yellow plot). (a) Excessive brightness leads to loss of information. (b) Excessive contrast results...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... Backscattered (elastic) Essentially same as beam energy Beam electron scattered back after elastic collision Atomic number contrast, channeling contrast, channeling patterns, and magnetic contrast in SEM Backscattered (inelastic) Energies less than beam energy Beam electron scattered back after...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... polarized light reveals the packet size by contrast differences. Tint etched in 10% Na 2 S 2 O 5 . 100× Fig. 35 Principles of phase contrast microscopy Fig. 16 Relationship between the resolution possible with an incident-light microscope and the numerical aperture of the objective lens...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
.... Shibata N. , Findlay S.D. , Kohno Y. , Sawada H. , Kondo Y. , and Ikuhara Y. , Differential Phase-Contrast Microscopy at Atomic Resolution , Nature Phys. , Vol 8 , 2012 , p 611 – 615 10.1038/nphys2337 14. Ryll H. , Simson M. , Hartmann R. , Holl...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
..., are detectable ( Ref 26 ). Other applications include observation of moiré fringes for edge dislocations, x-ray phase contrast microscopy, and precise measurement of x-ray refractive indices, x-ray scattering factors, and lattice constants. A technique that preserves the scanning feature of Lang but uses...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... Science , Vol 19 , 1992 , p 653 – 657 5. Abromowitz M. , “Contrast Methods in Microscopy: Transmitted Light, Basics and Beyond,” Olympus Corp. , Lake Success, NY , 1987 6. Bloss F.D. , An Introduction to the Methods of Optical Crystallography , Saunders College Publishers...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
...Abstract Abstract Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... and Crystallographic Microanalysis Voltage Contrast and Analysis of Microelectronic Devices Electron Probe Microanalysis Transmission Electron Microscopy Scanning Auger Microscopy The electron probe microanalyzer (frequently termed the electron microprobe) is essentially a scanning electron microscope...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
.... In the following figures, ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 1 shows a cross section of a carbon-fiber-reinforced composite that has a very small dispersed-rubber phase in the matrix...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... bright, and those that diffracted more of the incident beam appear dark. Figure 17 shows an example of this type of grain contrast. Fig. 17 Transmission electron microscopy grain orientation contrast in a sample of fine-grained polycrystalline silicon. Courtesy of Tom Headley, Sandia National...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... illumination, 25× objective Fig. 7 An area in Fig. 5 viewed using reflected-light phase contrast with the same magnification as Fig. 6 . Notice the shading on the outer edges of the micrograph due to this contrast technique. Fig. 8 Transmitted-light microscopy of the natural fiber...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... is approximately 0.2 μm. However, smaller features—as small as approximately 0.05 μm—can be detected by image contrast enhancement with polarized light, interference contrast, or dark-field illuminations. Fig. 1 Light microscopy image showing the surface texture of stainless steel tubing for needles...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... current, successful techniques. Methods for preparation of thin foils for transmission electron microscopy are also described in the literature ( Ref 6 , 10 ), but are not reviewed in this article. Differential interference contrast (DIC) illumination is also effective in revealing structure (see...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
... Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural parameters...