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Published: 01 January 2002
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Published: 15 January 2021
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003795
EISBN: 978-1-62708-177-1
..., and polishing as well as ceramographic etching. It discusses common imaging approaches, including scanning electron microscopy and thin-section polarized light techniques, a type of optical microscopy. The article also addresses microstructural classification, examining detailed micrographs from samples...
Abstract
Microstructural analysis reveals many important details about the qualities and capabilities of high-performance ceramics. This article explains how to prepare ceramic samples for imaging and the imaging technologies normally used. It describes sectioning, mounting, grinding, and polishing as well as ceramographic etching. It discusses common imaging approaches, including scanning electron microscopy and thin-section polarized light techniques, a type of optical microscopy. The article also addresses microstructural classification, examining detailed micrographs from samples of aluminum oxide, zirconium dioxide, aluminum nitride, silicon carbide, and piezoelectric ceramics.
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
..., the secondary ions can be detected using a mass spectrometer. A quadrupole mass spectrometer can be installed on an existing Auger system fitted with an ion etching gun, and simultaneous AES and SIMS analyses can be made. Stand-alone SIMS systems can provide improved performance as a result of a smaller ion...
Abstract
This article focuses on the visual or macroscopic examination of damaged materials and interpretation of damage and fracture features. Analytical tools available for evaluations of corrosion and wear damage features include energy dispersive spectroscopy, electron probe microanalysis, Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed. The article concludes with a review of the evaluation of polymers and ceramic materials in failure analysis.
Book Chapter
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... of an ion beam with a material. Thus, when an ion beam, as used in AES analysis for depth profiling, impinges on a surface, the secondary ions can be detected using a mass spectrometer. A quadrupole mass spectrometer can be installed on an existing Auger system fitted with an ion etching gun...
Abstract
Examination of a damaged component involves a chain of activities that, first and foremost, requires good observation and documentation. Following receipt and documentation, the features of damage can be recorded and their cause(s) investigated, as this article briefly describes, for typical types of damage experienced for metallic components. This article discusses the processes involved in visual or macroscopic examination of damaged material; the interpretation of fracture features, corrosion, and wear damage features; and the analysis of base material composition. It covers the processes involved in the selection of metallurgical samples, the preparation and examination of metallographic specimens in failure analysis, and the analysis and interpretation of microstructures. Examination and evaluation of polymers and ceramic materials in failure analysis are also briefly discussed.
Book Chapter
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... Abstract Metallographic contrasting methods include various electrochemical, optical, and physical etching techniques, which in turn are enhanced by the formation of a thin transparent film on the specimen surface. This article primarily discusses etching in conjunction with light microscopy...
Abstract
Metallographic contrasting methods include various electrochemical, optical, and physical etching techniques, which in turn are enhanced by the formation of a thin transparent film on the specimen surface. This article primarily discusses etching in conjunction with light microscopy and describes several methods for film formation, namely, heat tinting, color etching, anodizing, potentiostatic etching, vapor deposition, and film deposition by sputtering. It provides information on the general procedures and precautions for etchants and reagents used in metallographic microetching, macroetching, electropolishing, chemical polishing, and other similar operations.