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bright-field microscopy

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Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi-fluorescence. The article also provides information on transmitted light microscopy. References References 1. Mallick P.K. , Fiber-Reinforced Composites, Materials...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... Comparison of (a) bright-field light optical microscopy image (magnification: 1000×) and (b–d) backscattered electron SEM images (magnification: 1000, 5000, and 10,000×, respectively) of properly prepared as-rolled 9254 alloy steel with very fine pearlite. Increasing magnification increasingly reveals...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
... performance. This article describes the optical microscopy and bright-field illumination techniques involved in analyzing ply terminations, prepreg plies, splices, and fiber orientation to provide the insight necessary for optimizing composite structure and performance. bright-field illumination...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... in subsequent sections of this article and in Ref 1 , 2 , 3 , 4 , 5 , 6 , 7 , and 8 . Uranium alloys with more than one phase are frequently etched and examined by bright-field microscopy. Etching is most often done electrolytically, although some chemical etchants are also used. Preparation...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... materials, including small particles Identification of organic and mineral bulk material compounds Identification of constituents of embedded particles Mapping and depth profiling distribution of organic constituents Bright-Field Light Microscopy This method produces true-color images...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... be solved, at least in part, with AEM. analytical electron microscopes analytical transmission electron microscopy bright-field microscopy data analysis defect analysis deformation dislocations electron diffraction electron energy loss spectroscopy electron guns grain-boundary segregation...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... Mechanical Components Image Aberrations Resolution Depth of Field Bright-Field Illumination Oblique Illumination Dark-Field Illumination Polarized Light Phase Contrast Illumination Interference-Contrast Illumination Interference Techniques Light-Section Microscopy Laser...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009079
EISBN: 978-1-62708-177-1
... Micrograph of a carbon fiber composite that microcracked during thermal cycling. Bright-field illumination, 65 mm macrophotograph Fig. 3 Micrograph of a composite cross section showing a microcrack that initiated on the surface of the part. Slightly uncrossed polarized light, 10× objective...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009071
EISBN: 978-1-62708-177-1
... Fig. 1 Composite cross sections. (a) Sheet molding compound made from carbon-black-filled epoxy resin and chopped glass fiber. Bright-field illumination, 65 mm macrophotograph montage. (b) Quasi-isotropic unidirectional prepreg laminate. Slightly uncrossed polarized light, 5× objective...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
.... As a result, defects such as dislocations and stacking faults can be imaged by the TEM. Figure 18 shows an example of dislocations in aluminum imaged by TEM. Fig. 18 Transmission electron microscopy imaging of dislocations in aluminum. Source: Ref 3 In addition to the bright field images...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
.... Figure 18 shows an example of dislocations in aluminum imaged by TEM. Fig. 18 Transmission electron microscopy imaging of dislocations in aluminum. Source: Ref 3 In addition to the bright field images obtained from the directly transmitted beam, dark field images can also be obtained...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... filament. Lanthanum hexaboride (LaB 6 ) cathodes are used in order to obtain a higher brightness, which has additional benefits, such as improving the lateral resolution. Field emission sources, with still higher brightness than the LaB 6 cathode, recently became available for routine operation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... microscopy Features Type of electron source Tungsten hairpin LaB 6 Schottky field-emission gun Cold field-emission gun Work function, eV 4.5 2.4 3.0 4.5 Operating temperature, K 2700 1700 1700 300 Cross-over size, nm >10 5 10 4 15 3 Brightness, A/m 2...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009081
EISBN: 978-1-62708-177-1
... directly to scanning electron microscopy, losing the detail that can be provided through the use of optical microscopy techniques. Composite damage after an impact can be analyzed with optical microscopy to determine how the composite failed as well as the mechanism of failure. Epi-bright-field...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001237
EISBN: 978-1-62708-170-2
... and (b) mechanochemical polish Fig. 3 (a) Bright-field image of SiSiC. 200×. (b) Dark-field image of SiSiC. 200×. (c) Differential interference contrast illumination image of SiSiC. 200× Fig. 1 Gray-level threshold for a porous steatite ceramic sample Fig. 2 Phase analysis...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009085
EISBN: 978-1-62708-177-1
... handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including the type of lightning strike...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
... screen, where they form an enlarged, projected image of the surface from which they originate. Field ionization occurs preferentially above the most prominent surface atoms, and narrow cones of ions from these regions give rise to individual bright spots on the image screen. A microchannel plate-image...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... electrons (SE; dotted arrows) and backscattered electrons (BE; solid arrows). STEM, scanning transmission electron microscopy; DF, dark field; BF, bright field Fig. 7 Diagram of double-deflection system showing progressive line scanning to produce a frame of size r × r Fig. 40...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009083
EISBN: 978-1-62708-177-1
...) Transmitted light, Hoffman modulation contrast. (D) Reflected light, bright-field illumination Fig. 2 Ultrathin section of an area of a honeycomb sandwich composite structure showing the effects of core movement during manufacturing and the resulting deformation and separation of the prepreg plies...