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bright-field microscopy

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Published: 01 June 2016
Fig. 24 Bright-field transmission electron microscopy image in the ⟨110⟩ α direction of Al-4Cu-0.1Mg-0.62Ag alloy aged for 1000 h at 250 °C (480 °F). It features Ω and θ′ precipitates. Source: Ref 174 More
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Published: 01 June 2016
Fig. 8 Bright-field transmission electron microscopy images of a 6060 alloy aged for 5 h at 190 °C (375 °F). (a) Undeformed alloy. (b) Alloy with 10% deformation before artificial aging. The precipitates in (a) are approximately half as long and 1 3 as thick, 5 times more numerous More
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Published: 01 October 2014
Fig. 6 Plan view thin-foil bright-field transmission electron microscopy image showing grains A, B, and C of expanded austenite and their respective selected-area electron diffraction patterns. Some phase-decomposition regions are indicated on the B grain surface (white arrows More
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Published: 01 December 2004
Fig. 16 (a) Bright-field transmission electron microscopy image showing four adjacent martensite laths (labeled A, B, C, D) in a matrix of austenite. (b) Dark-field image formed using the (200) b reflection. Source: Ref 11 . Reprinted with permission More
Image
Published: 01 December 2004
Fig. 3 Transmission electron microscopy bright field micrograph showing Ti 5 Si 3 precipitates at dislocations in a Ti 52 Al 48 -3Si2Cr alloy. Source: Ref 6 More
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Published: 31 October 2011
Fig. 6 Transmission electron microscopy (TEM) images. (a) Bright-field TEM image taken from an interface location with apparent good bonding. The interface cannot be determined easily, indicating potential recrystallization across the interface. Small, white Al-Mn-Fe intermetallics can be seen More
Image
Published: 15 December 2019
Fig. 60 Comparison of (a) bright-field light optical microscopy image (magnification: 1000×) and (b–d) backscattered electron SEM images (magnification: 1000, 5000, and 10,000×, respectively) of properly prepared as-rolled 9254 alloy steel with very fine pearlite. Increasing magnification More
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... grinding, and polishing. The preparation techniques of ultrathin sections are also summarized. The article explains the illumination methods used by reflected light microscopy to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... microscopy. bright-field illumination composite materials contrast microscopy dark-field illumination dyes etchants fluorescence microscopy interference microscopy macrophotography microscope alignment optical microscopy polarized-light microscopy reflected-light microscopy sample...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... reveals an irregular grain structure similar to that of cast unalloyed uranium, except that the grain size is finer (see Fig. 35 ). High-magnification bright-field microscopy reveals a fine, lamellar two-phase microstructure morphologically similar to pearlite in steels ( Fig. 36 ). Apparently...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... are markedly inferior to what can be achieved using the light microscope, as shown in this article. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright-field illumination, dark-field illumination, polarized light illumination...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
.... This article describes the optical microscopy and bright-field illumination techniques involved in analyzing ply terminations, prepreg plies, splices, and fiber orientation to provide the insight necessary for optimizing composite structure and performance. bright-field illumination composite materials...
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Published: 01 December 1998
Fig. 19 Transmission electron microscopy dark field image of same area as in Fig. 17 . Dark field image was obtained by imaging numerous diffraction spots, so most areas that strongly diffracted and appeared dark in Fig. 17 now appear bright. Areas that diffracted weakly and appeared bright More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
..., to obtain additional information, are also described. The article concludes with information on photomicroscopy and macrophotography. bright-field illumination dark-field illumination depth of field interference-contrast illumination light microscopy macrophotography mechanical components...
Image
Published: 01 June 2016
Fig. 16 θ′ precipitates in Al-4Cu alloy. (a) Bright-field transmission electron microscopy image after artificial aging for 1 h at 190 °C (375 °F). The alloy contained 0.01 wt% Sn, which forms the spherical nucleation sites marked by arrows ( Ref 146 ). (b) Atom probe tomography of a volume 78 More
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Published: 15 December 2019
Fig. 8 Schematic of various detector positions and associated electron trajectories for secondary electrons (SE; dotted arrows) and backscattered electrons (BE; solid arrows). STEM, scanning transmission electron microscopy; DF, dark field; BF, bright field More
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Published: 01 December 2004
Fig. 10 Microstructure of a stainless steel observed using different techniques of optical microscopy: (a) bright field, (b) dark field, and (c) differential interference contrast (DIC). Grain boundaries detected using simple binarization are marked on the right side as black (a and c More
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Published: 01 June 2016
Fig. 22 Precipitates in an Al-2.5Cu-1.5Mg alloy aged for 9 h at 200 °C (390 °F) as seen by (a) bright-field scanning transmission electron microscopy (STEM) and (b) high-angle annular dark-field STEM. Small, ordered Guinier-Preston-Bagaryatsky (GPB) zones are observed together with a large More
Image
Published: 01 August 2018
Fig. 35 Scanning laser acoustic microscopy image at 200 MHz of tape-automated-bonded leads on an integrated circuit. The bright areas at the tips of each lead indicate good-quality bonds. Field of view: 1.75 × 1.3 mm More
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Published: 01 August 2018
Fig. 21 Scanning laser acoustic microscopy image at 30 MHz of an alumina test disk similar in size to that shown in Fig. 18 . This sample was quite transparent to the ultrasound, as evidenced by the bright, relatively uniform appearance of the acoustic image. Field of view: 14 × 10.5 mm More