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backscattered electron imaging

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... Abstract This article describes some of the common elemental composition analysis methods and explains the concept of referee and economy test methods in failure analysis. It discusses different types of microchemical analyses, including backscattered electron imaging, energy-dispersive...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
.... These backscattered electron detectors complement the secondary electron detector and provide some information not available in the secondary electron signal. To understand the differences in the images provided by the two detectors and to obtain a better understanding of resolution limitations, it is useful...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... microstructural phases and compounds by their crystal structures Characterizing preferred crystallographic orientations by analysis of orientations of individual grains Secondary electron imaging of surface topography: ∼10 nm Backscattered electron imaging of atomic number contrast: ∼1 μm X-ray...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006131
EISBN: 978-1-62708-175-7
...) backscattered electron images of a cold working HATS with 2.9% C, 8% Cr, 1.5% Mo, and 10% V. The steel in Fig. 2(a) was manufactured by spray compacting a billet that was subsequently hot worked; the steel in Fig. 2(b) was HIP and hot worked. Backscattered electrons indicate the atomic mass...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000615
EISBN: 978-1-62708-181-8
... electron image of ENiCrFe-3 weld metal showing severe interdendritic attack. SEM, 65×. Fig. 825 : Sulfur map of field in Fig. 824 reveals high level of the element in interdendritic regions. Technique used was energy-dispersive x-ray spectroscopy (EDS). 65×. Fig. 826 : Backscattered electron image...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000628
EISBN: 978-1-62708-181-8
... aggregate embedded in the sulfur cement matrix. BE image, 17× (H.W. Leavenworth, Jr., U.S. Bureau of Mines) Backscattered electron (BE) fractographs of the inside of a noninterconnected void in the sulfur concrete shown in Fig. 1281 . Fig. 1285 : Note two-phase structure. BE image, 170×. Fig. 1286...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... B. , Weiss B. , and Stickler R. , Advanced Microstructural Investigation Using the REM-ECC Imaging Technique , Prakt. Metallogr. , Vol 38 , 2001 , p 19 – 30 14. Katrakova D. and Muecklich F. , Specimen Preparation for Electron Backscatter Diffraction, Part I...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003776
EISBN: 978-1-62708-177-1
... structure Figure 41 , 42 and 43 are backscattered electron images of AuAl 2 alloyed with 5 wt% Fe, Cr, and Mo, respectively. These alloying elements were added to investigate the effect of gold on catalytic activity for carbon monoxide oxidation. Various quantities of RuAl (50, 30, and 10...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003741
EISBN: 978-1-62708-177-1
... x Ni 1 − x ) 2 Si           > ( Co x Ni 1 − x ) 2 Si > Ni 5 Si 2 ( Co ) > Co 50 Ni 50 Fig. 14 Backscattered electron image of a Si/50Co + 50Ni diffusion couple heated at 800 °C (1470 °F) for 400 h...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... electron and backscattered electron images of the same area. The most crucial aspect of image recording for fractography is to maintain orientation and perspective. In general, only selected areas of a fracture surface are examined in depth, for example, the fracture origin. If the specimen exhibits...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... for backscattered electrons can also be a scintillator type but are more frequently a solid-state silicon detector. The SEM column and sample chamber are at a moderate vacuum to allow the electrons to travel freely from the electron beam source to the sample and then to the detectors. High-resolution imaging...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
..., many images of microstructures at 1000× and lower are being published in metallurgical journals using secondary electron and backscattered electron scanning electron microscopy (SEM) images rather than light microscope images. This is often poor practice, because microstructural details in SEM images...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... or poorly conductive samples and allows images of these types of samples to be obtained using backscattered electrons or specialized detectors for secondary electron imaging. Modern microscopes can allow the user to operate in either the high-vacuum conventional imaging mode or in the low-vacuum...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003728
EISBN: 978-1-62708-177-1
... of the Ti-Al-8Nb alloy showing coarse-grained as-cast structure. Source: Ref 55 Fig. 23 Backscattered electron image of the Ti-Al-8Nb-0.3B alloy showing coarse grain structure. Source: Ref 55 Fig. 24 Backscattered electron image showing refined as-cast structure in the Ti-Al-8Nb-1B...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001755
EISBN: 978-1-62708-178-8
... analysis system. Material was transferred from the collection filters onto metallographically polished beryllium stubs (for enhanced particle-to-background contrast in the backscattered electron imaging mode). A thin (approximately 20-nm-thick) layer of carbon was then evaporated onto each sample...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... D. , Ferreira M.E. , and Pistorius P.C. , Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time , Microsc. Microanal. , Vol 23 (No. 6 ), Dec 2017 , p 1082 – 1090...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... offer forescattered electron detectors located at the lower edge of the fluorescent screen. There may be other detectors located on the top edge or sides of the fluorescent screen for the collection of more typical backscattered electron images. Images with interesting and informative channeling...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... at vacuum levels of 20 torr and allows both backscattered and secondary images to be obtained from the sample surface. This is made possible by the use of an electron detector that operates on the principle of induced current. In this instance, the interaction of the electron signals from the sample surface...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... stainless steels are being utilized for welding, or determining hydrogen content to test for entrapped nascent hydrogen that could have caused hydrogen embrittlement. When identifying a location to perform chemical analysis in the SEM, simultaneous imaging using backscattered electron (BSE...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000607
EISBN: 978-1-62708-181-8
... of boxed area in Fig. 301 SEM, 200×. See also Fig. 303 and 304 . (J.H. Maker, Associated Spring, Barnes Group Inc.) Higher-magnification views of the fractured ASTM A230 spring wire shown in Fig. 301 and 302 . Fig. 303 : Secondary electron SEM image, 500×. Fig. 304 : Backscattered electron...