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attack polishing

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Published: 01 December 2004
Fig. 47 Zircaloy 4 as-cast ingot. Use of attack polishing, heat tinting (425 °C, or 800 °F), and differential interference contrast illumination reveals the basic crystal structure and the iron-chromium second phase. 200×. (P.E. Danielson) More
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Published: 15 December 2019
Fig. 39 Attack-polished 14-karat gold etched using equal parts 10% NaCN and H 2 O 2 (30% concentration) and viewed using bright field (a) and Nomarski DIC (b). DIC reveals the grain structure much more effectively than bright field. More
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Published: 01 December 2004
Fig. 23 Mechanically twinned hafnium weld. Specimen was attack polished and heat tinted (∼400 °C, or 750 °F). Polarized light illumination. 60×. (P.E. Danielson) More
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Published: 01 December 2004
Fig. 46 Hafnium crystal bar showing twins caused by cold working. Attack polished, heat tinted at 480 °C (900 °F), and viewed under differential interference contrast illumination. 65×. (P.E. Danielson) More
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Published: 01 December 2004
Fig. 3 Zircaloy 4 as-cast ingot. (a) Center section. Attack polished, heat tinted, etchant procedure No. 6, and viewed with differential interference contrast illumination. (b) Midthickness. Attack polished, heat tinted, and viewed with differential interference contrast illumination More
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Published: 01 December 2004
Fig. 5 Zircaloy 4 hot-worked plate, longitudinal. Attack polished, heat tinted, and viewed with polarized light illumination. This micrograph shows a hot-worked and annealed structure. Original magnification: 100×. More
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Published: 01 December 2004
Fig. 6 Zircaloy 4 plate, longitudinal, attack polished, etchant procedure No. 3 ( Table 2 ). (a) Bright field. (b) Polarized light. (c) Differential interference contrast. (d) Dark field. These micrographs compare four different lighting conditions used for metallurgical examination. Original More
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Published: 01 December 2004
Fig. 7 Zircaloy 2 plate, transverse. Attack polished, anodized at 103 V, and viewed with bright-field illumination. This micrograph shows the presence of zirconium carbides, irregular in shape, in a Zircaloy matrix. Original magnification: 500×. More
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Published: 01 December 2004
Fig. 8 Zircaloy 2/pure zirconium coextruded tubing, transverse, attack polished, etchant procedure No. 2 ( Table 2 ), anodized at 15 V, polarized light. This area shows the interface region of the coextruded tube. Original magnification: 200× More
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Published: 01 December 2004
Fig. 9 Zircaloy 4 tube, attack polished, etchant procedure No. 2 ( Table 2 ), anodized at 15 V, polarized light. This micrograph shows an area of blocky α caused by cold work or surface damage followed by a recrystallization anneal (675 to 790 °C, or 1230 to 1455 °F). Original magnification More
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Published: 01 December 2004
Fig. 10 Zircaloy 4 rod, longitudinal. Attack polished, anodized at 108 V, and viewed with bright-field illumination. This micrograph shows the presence of a large nitride in the zirconium matrix. Original magnification: 100×. More
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Published: 01 December 2004
Fig. 11 Zircaloy 4 plate. Attack polished, anodized at 103 V, and viewed with bright-field illumination. These micrographs show a plate sample revealing a high-nitrogen area (bluish color) and a zirconium-nitride phase in the matrix. (a) Original magnification: 25×. (b) Original magnification More
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Published: 01 December 2004
Fig. 12 Zirconium crystal bar. Attack polished, heat tinted, and viewed with polarized light illumination. This micrograph shows large as-cast grains in zirconium crystal bar. Original magnification: 50×. More
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Published: 01 December 2004
Fig. 13 Zr702 sheet. Attack polished, etchant procedure No. 2, anodized at 15 V, and viewed with polarized light illumination. These micrographs show the difference in overall grain orientation between the (a) transverse and (b) longitudinal directions. Original magnification: 500×. More
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Published: 01 December 2004
Fig. 15 Zr702 plate, transverse. Attack polished, heat tinted, and viewed with polarized light illumination. These micrographs show an equiaxed alpha structure comparing the difference as viewed in (a) color and (b) monochromatic. Original magnification: 200×. More
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Published: 01 December 2004
Fig. 17 Zr702 plate, longitudinal, attack polished, etchant procedure No. 4 ( Table 2 ), bright field. The micrograph shows the presence of hydrides and carbides in a zirconium plate structure. Original magnification: 500× More
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Published: 01 December 2004
Fig. 18 Zirconium rod 12.5 mm (0.5 in.) diameter, attack polished, etchant procedure No. 2 ( Table 2 ), anodized at 15 V, polarized light. This micrograph shows local surface areas with higher cold work and surface cracking. Original magnification: ∼6× More
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Published: 01 December 2004
Fig. 19 Zr702 welded plate, transverse. Attack polished, anodized at 29 V, and viewed with bright-field illumination. This micrograph shows a crack in the area between the parent metal and the heat-affected zone. This also shows carbides along the area of crack propagation. (a) Original More
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Published: 01 December 2004
Fig. 20 Zr705 as-cast structure. Attack polished, anodized at 103 V, and viewed with bright-field illumination. This micrograph shows the presence of carbides in the cast structure. Original magnification: 200×. More
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Published: 01 December 2004
Fig. 21 Zr702 plate, transverse. Attack polished, anodized, and viewed with differential interference contrast illumination. This micrograph shows interstitial contamination in the weld area. Original magnification: 750×. More