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Image
Published: 01 January 1986
Image
Sensitivity of PIXE analysis versus proton energy and atomic number based o...
Available to PurchasePublished: 01 January 1986
Fig. 5 Sensitivity of PIXE analysis versus proton energy and atomic number based on typical parameter given in the text. Source: Ref 4
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Image
Published: 01 January 1986
Fig. 10 The effect of atomic number on phases of structure factors. F is the vector sum of F H , the contribution from the heavy atom(s), and a series of F L 's, the contributions of all the light atoms. Because F H is the dominant contributor to F , Φ ≅ ϕ H .
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Image
Relative sensitivity as a function of atomic number for 2-keV helium and ne...
Available to PurchasePublished: 01 January 1986
Image
Backscattered electron image showing atomic number contrast in as-cast Cu-A...
Available to PurchasePublished: 01 December 1998
Fig. 8 Backscattered electron image showing atomic number contrast in as-cast Cu-Al-Mg alloy. Brightest areas represent phases containing the greatest concentration of high atomic number copper. Darker areas represent phases of progressively lower average atomic number. Courtesy of Joe Michael
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Image
Scanning Auger mapping of elements, including some of low atomic number, in...
Available to PurchasePublished: 01 December 1998
Fig. 5 Scanning Auger mapping of elements, including some of low atomic number, in a foreign particle on an integrated circuit. Note also the ability to distinguish between elemental silicon and silicon oxide due to bonding effects on Auger energies. (a) Secondary electron image of particle
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Image
Published: 15 December 2019
Image
Image generated from backscattered ions/atoms provides strong atomic number...
Available to PurchasePublished: 15 December 2019
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003083
EISBN: 978-1-62708-199-3
... includes a series of tables: the first gives the names and symbols of the elements in alphabetical order and the second lists the elements in order by atomic number and give the atomic weight for each. The periodic table of the elements also is included in the article. actinides alkali metals...
Abstract
Chemical elements are the basic chemical substances; that is, they cannot be decomposed by chemical change or made by chemical union. These elements follow a periodic pattern related to the atomic mass of each that allows them to be arranged into a convenient table. This article includes a series of tables: the first gives the names and symbols of the elements in alphabetical order and the second lists the elements in order by atomic number and give the atomic weight for each. The periodic table of the elements also is included in the article.
Book Chapter
Periodic Table of the Elements
Available to PurchaseSeries: ASM Handbook
Volume: 2
Publisher: ASM International
Published: 01 January 1990
DOI: 10.31399/asm.hb.v02.a0001116
EISBN: 978-1-62708-162-7
... Abstract This article represents the periodic table of elements, which is the tabular arrangement of the chemical elements, including metals and nonmetals with their atomic number and symbols. atomic number chemical elements metals non-metals periodic table Fig. 1 Periodic...
Abstract
This article represents the periodic table of elements, which is the tabular arrangement of the chemical elements, including metals and nonmetals with their atomic number and symbols.
Book Chapter
Electron Probe X-Ray Microanalysis
Available to PurchaseSeries: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... with the significance of the raw analytical total. Sections on accuracy of the standards-based k-ratio/matrix corrections protocol with EDS and processes of analysis when severe peak overlap occurs are also included. The article provides information on low-atomic-number elements, iterative qualitative-quantitative...
Abstract
This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along with the significance of the raw analytical total. Sections on accuracy of the standards-based k-ratio/matrix corrections protocol with EDS and processes of analysis when severe peak overlap occurs are also included. The article provides information on low-atomic-number elements, iterative qualitative-quantitative analysis for complex compositions, and significance of standardless analysis in the EDS software. It ends with a section on the processes involved in elemental mapping for major and minor constituents.
Image
Number of atoms in the first coordination sphere obtained by neutron diffra...
Available to Purchase
in The Liquid State and Principles of Solidification of Cast Iron
> Cast Iron Science and Technology
Published: 31 August 2017
Fig. 1 Number of atoms in the first coordination sphere obtained by neutron diffraction and x-ray. Source: Ref 2
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Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006005
EISBN: 978-1-62708-172-6
.... atomic number chemical bonding organic compounds polymers protective coatings BY VIRTUE OF ALL OF THE MANY TYPES of resins, pigments, solvents, and other constituents comprising a formulated coating, chemistry is an important consideration in this Volume. All of the articles in the Coating...
Abstract
This article provides an overview of chemistry and chemical interactions necessary to understand protective coatings. It includes information on elements, atoms, molecules, types of bonding, valence electrons, functional groups, polymer formation, and chemical bonding structures.
Book Chapter
Periodic Table of Elements
Available to PurchaseSeries: ASM Handbook
Volume: 22A
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.hb.v22a.a0005457
EISBN: 978-1-62708-196-2
... into the convenient periodic table. In the periodic table, the elements are arranged in the order of increasing atomic number (the number of protons in the nucleus), but those that have the same number of electrons inhabiting their outermost electron shells (and therefore having similar chemical behavior) are grouped...
Abstract
This article provides basic information on chemical elements and their arrangement into a periodic table based on recurring similarities in the fundamental nature of the elements.
Book Chapter
Periodic Table of Elements
Available to PurchaseBook: Corrosion: Materials
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0006545
EISBN: 978-1-62708-183-2
... pattern related to the electron configuration that allows them to be arranged into the convenient periodic table. In the periodic table, the elements are arranged in the order of increasing atomic number (the number of protons in the nucleus), but those that have the same number of electrons inhabiting...
Abstract
This article provides basic information on the chemical elements and their arrangement into a periodic table based on recurring similarities in the fundamental nature of the elements. These elements follow a periodic pattern related to the electron configuration that allows them to be arranged into the convenient periodic table.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... secondary ion mass spectroscopy surface analysis transmission electron microscopy X-ray photoelectron spectroscopy A NUMBER OF METHODS can be used to obtain information about the chemistry of the first one to several atomic layers of samples of metals, as well as of other materials...
Abstract
This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... of atomic number contrast: ∼1 μm X-ray characterization of elemental chemistry: ∼2 μm using typical beam voltages of ∼20 kV (much better resolution, ∼100 nm, can be obtained using low voltage beams) Electron diffraction characterization of crystal structure and orientation: ∼1 μm Elemental...
Abstract
Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection threshold and precision, limitations, sample requirements, and the capabilities of related techniques.
Image
(a) Kα x-ray production cross sections versus proton energy and atomic numb...
Available to PurchasePublished: 01 January 1986
Fig. 2 (a) Kα x-ray production cross sections versus proton energy and atomic number and (b) L x-ray production cross sections versus proton energy and atomic number. Source: Ref 4 .
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Image
(a) Illustration of compositional contrast due to backscattered electron (B...
Available to PurchasePublished: 15 December 2019
Fig. 31 (a) Illustration of compositional contrast due to backscattered electron (BE) emission variations from a flat surface with regions of higher and lower average atomic number, Z . (b) Plot of measured secondary electron (SE) and BE yield as a function of atomic number. Source: Ref 27
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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Detection and quantification of elements with atomic number 5 or higher (older energy dispersive units with beryllium window detectors are limited to atomic number 11 or higher) Typical Uses Qualitative and quantitative chemical analysis for major and minor elements in metals and alloys...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and precision methods, and sample requirements. The amount of material that needs to be sampled, operating principles, and limitations of the stated methods are also discussed.
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