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atomic emission
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001729
EISBN: 978-1-62708-178-8
... Abstract Inductively coupled plasma atomic emission spectroscopy (ICP-AES) is an analytical technique for elemental determinations in the concentration range of major to trace based on the principles of atomic spectroscopy. This article provides a description of the basic atomic theory...
Abstract
Inductively coupled plasma atomic emission spectroscopy (ICP-AES) is an analytical technique for elemental determinations in the concentration range of major to trace based on the principles of atomic spectroscopy. This article provides a description of the basic atomic theory, and explains the analytical procedures and various interference effects of ICP, namely, spectral, vaporization-atomization, and ionization. It provides a detailed discussion on the principal components of an analytical ICP system, namely, the sample introduction system; ICP torch and argon gas supplies; radio-frequency generator and associated electronics; spectrometers, such as polychromators and monochromators; detection electronics and interface; and the system computer with appropriate hardware and software. The article also describes the uses of direct-current plasma, and provides examples of the applications of ICP-AES.
Image
Published: 01 January 1986
Fig. 1 Energy-level transitions of the atomic spectrometries. (a) Atomic emission spectrometry. (b) Atomic absorption spectrometry. (c) Atomic fluorescence spectrometry. N *, number of atoms in the excited state; N 0 , number of atoms in the ground state; l 0 , light intensity measured
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Image
Published: 01 January 1986
Fig. 2 Comparison of (a) flame atomic emission spectrometry, (b) flame atomic absorption spectrometry, and (c) flame atomic fluorescence spectrometry.
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001728
EISBN: 978-1-62708-178-8
... Abstract This article discusses the general principles, optical systems, and emission sources of optical emission spectroscopy for elemental analysis. Changes in the energy of the valence or outer shell electrons result in the atomic lines used in emission spectroscopy. Each possible...
Abstract
This article discusses the general principles, optical systems, and emission sources of optical emission spectroscopy for elemental analysis. Changes in the energy of the valence or outer shell electrons result in the atomic lines used in emission spectroscopy. Each possible combination of electron configurations produces a spectroscopic term that describes the state of the atom. Atomic emission is analytically useful only to the extent that the emission from one atomic species can be measured and its intensity recorded independent of emission from other sources. Emission sources are often designed to minimize molecular emission. Each of the four types of emission sources; arcs, high-voltage sparks, glow discharges, and flames; has a set of physical characteristics with accompanying analytical assets and liabilities. The article also discusses the applications of each type of emission source.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
... Abstract This article provides a clear but nonexhaustive description of the general principle of atomic emission, with a particular focus on instrumentation, and summarizes the main characteristics of the inductively coupled plasma optical emission spectrometer technique. Basic atomic theory...
Abstract
This article provides a clear but nonexhaustive description of the general principle of atomic emission, with a particular focus on instrumentation, and summarizes the main characteristics of the inductively coupled plasma optical emission spectrometer technique. Basic atomic theory as well as the instrument characteristics and their influence on the instrument performances are presented. The advantages, drawbacks, and developments of this technique are discussed, and, finally, alternative techniques and examples of applications are provided.
Book: Powder Metallurgy
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Abstract
This article discusses the capabilities and limitations of various material characterization methods that assist in the selection of a proper analytical tool for analyzing particulate materials. Commonly used methods are microanalysis, surface analysis, and bulk analysis. The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques, such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001730
EISBN: 978-1-62708-178-8
... Abstract Atomic absorption spectrometry (AAS) is generally used for measuring relatively low concentrations of approximately 70 metallic or semimetallic elements in solution samples. This article describes several features that are common to three techniques, namely, AAS, atomic emission...
Abstract
Atomic absorption spectrometry (AAS) is generally used for measuring relatively low concentrations of approximately 70 metallic or semimetallic elements in solution samples. This article describes several features that are common to three techniques, namely, AAS, atomic emission spectrometry (AES), and atomic fluorescence spectrometry (AFS). It discusses the reasons for the extreme differences in AAS sensitivities that affect AFS and AES. The article provides information on the advantages and disadvantages of the Smith/Hieftje system and two types of background correction systems, namely, the continuum-source background correction and Zeeman background correction. It also provides a list of applications of conventional AAS equipment, which includes most of the types of samples brought to laboratories for elemental analyses.
Image
Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy
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Image
Published: 15 December 2019
Fig. 6 XPS emission process for a model atom. An incoming photon causes the ejection of a photoelectron (a). The relaxation process results in an emission process of an Auger electron (b) KL 23 L 23 . The final arrangement results in a two-electron vacancy at the L 2,3 or 2p level ( Ref 8 ).
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Book: Thermal Spray Technology
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... of materials used for thermal spray coatings; rather, atomic emission and absorption and x-ray fluorescence and diffraction techniques are favored. Spectographic Analysis The balance of this section draws heavily upon a standard reference for atomic absorption, atomic emission, and x-ray fluorescence...
Abstract
The raw materials used in thermal spray processes are a critical parameter in the finished coating because the variations in their size, morphology, chemistry, and phase composition can significantly impact coating properties. Therefore, it is important to test and characterize the raw materials. This article discusses various characterization methods for powders. Topics discussed include: methods for determining particle size and/or size distribution; powder and coating stoichiometry; particle chemistry; and phase analysis by x-ray diffraction. This article discusses the characterization of thermal spray powders which involves the determination of particle size and/or size distribution and phase analysis by x-ray diffraction. It provides information on preferential volatilization and rapid solidification that influence compositional differences. Wet chemical methods, spectographic analysis, and atomic absorption spectrometry are also discussed.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... Acronyms: Techniques APM atom probe microanalysis AAS atomic absorption spectrometry AEM analytical electron microscopy AES Auger electron spectroscopy; atomic emission spectrometry AFS atomic fluorescence spectrometry ATEM analytical transmission...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006640
EISBN: 978-1-62708-213-6
.... optical emission spectroscopy direct solids analysis Overview Introduction History Optical emission spectroscopic methods originated in experiments performed in the mid-1800s ( Ref 1 ), yet they remain some of the most useful and flexible means of performing elemental analysis. Free atoms...
Abstract
This article is a detailed account of optical emission spectroscopy (OES) for elemental analysis. It begins with a discussion on the historical background of OES and development trends in OES methods. This is followed by a description of the general principles and optical systems of OES, along with various types of emission sources commonly used for OES. Some of the processes involved in calibration and quantification of OES for direct solids analysis by the ratio method are then described. The article ends with a discussion on the applications of each type of emission sources.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... in sample by ejection of electrons (photoelectron production), and relaxation of excited atom by electronic transitions and accompanying characteristic x-ray emission The net result is that each element has a unique set of known electron energy levels. Similarly, the set of energy differences between...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and precision methods, and sample requirements. The amount of material that needs to be sampled, operating principles, and limitations of the stated methods are also discussed.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006653
EISBN: 978-1-62708-213-6
... of the incident and transmitted intensities of that light ( Fig. 3 ). Because gas-phase atoms exhibit absorption line spectra, it was critical for the development of AAS that the effective spectral bandwidth of the instrumentation be comparable ( Ref 7 ). This was accomplished by using atomic line emission...
Abstract
This article focuses on some of the factors pertinent to atomic absorption spectroscopy (AAS). It begins by describing the working principle, critical components, and construction of flame atomic absorption instrumentation. This is followed by sections discussing various types of interferences in AAS, namely vaporization, ionization, matrix interferences, and background correction. Some of the methods for the analysis of microliter-sized samples and methods of standard additions to the sample solution for generating calibration standards are then reviewed. The article concludes with a section on processes involved in matrix matching.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... of tary positive charges (protons) contained emission of Auger electrons from a particu- banded microstructure. Microstructure hav- within the nucleus of an atom. For an elec- lar element. A map is normally produced by ing alternate bands parallel to the deformation trically neutral atom, the number...
Book Chapter
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
..., interpre- quantity. analytical gap. The region between two tation, and application of spectra originat- electrodes in which the sample is excited ing in the absorption of electromagnetic amorphous solid. A rigid material whose in the sources used for emission spectros- radiation by atoms, ions, radicals...
Book Chapter
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
.... Chemical analysis is carried out by X-ray fluorescence spectrometry, atomic absorption spectrophotometry, and plasma-emission spectrophotometry. Phase analysis is done by X-ray diffraction, spectroscopic methods, thermal analysis, and quantitative analysis. Techniques used for microstructural analysis...
Abstract
This article describes testing and characterization methods of ceramics for chemical analysis, phase analysis, microstructural analysis, macroscopic property characterization, strength and proof testing, thermophysical property testing, and nondestructive evaluation techniques. Chemical analysis is carried out by X-ray fluorescence spectrometry, atomic absorption spectrophotometry, and plasma-emission spectrophotometry. Phase analysis is done by X-ray diffraction, spectroscopic methods, thermal analysis, and quantitative analysis. Techniques used for microstructural analysis include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area. The article describes testing methods such as room and high-temperature strength test methods, proof testing, fracture toughness measurement, and hardness and wear testing. It also explains methods for determining thermal expansion, thermal conductivity, heat capacity, and emissivity of ceramics and glass and measurement of these properties as a function of temperature.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used...
Abstract
This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.
Image
Published: 01 December 1998
Fig. 1 Excitation of atom in sample by ejection of electrons (photoelectron production), and relaxation of excited atom by electronic transitions and accompanying characteristic x-ray emission
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Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
.... These methods can be classified by the method of excitation and the nature of x-ray detection. The excitation source creates inner electron shell atomic vacancies that cause x-ray emission when filled by outer electrons. X-ray fluorescence (XRF) uses x-rays for this purpose; electrons are used to cause...
Abstract
This article provides a detailed account of particle-induced x-ray emission (PIXE), covering the basic principles of PIXE analysis and calibration and quality-assurance protocols employed. A comparative study on PIXE and x-ray fluorescence is then presented. The article also discusses the applications of PIXE in atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes.