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analytical transmission electron microscopy

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
...Abstract Abstract Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. References References 1. Tator K. , Nanotechnology: The Future of Coatings—Parts 1 and 2 , Mater. Perform...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001725
EISBN: 978-1-62708-178-8
... deals with a set of related techniques, for example, “Electron Optical Methods.” Within each Section are several articles, each describing a separate analytical technique. For example, in the Section on “Electron Optical Methods” are articles on “Analytical Transmission Electron Microscopy,” “Scanning...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... Acronyms: Techniques APM atom probe microanalysis AAS atomic absorption spectrometry AEM analytical electron microscopy AES Auger electron spectroscopy; atomic emission spectrometry AFS atomic fluorescence spectrometry ATEM analytical transmission...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... on stereofractography is available in the article “Scanning Electron Microscopy” in this Volume. The formation of a single-stage replica is shown schematically in Fig. 1 . The contrast obtained with single-stage replicas in a transmission electron microscope derives solely from the greater effective thickness...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... “Analytical Transmission Electron Microscopy” and “Auger Electron Spectroscopy” in this Volume. Scanning electron microscopes are available that have been designed specifically to optimize chemical analysis with x-ray detectors. These instruments are often termed electron microprobes. Commercial...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001754
EISBN: 978-1-62708-178-8
..., transmission electron microscopy (TEM) consists of passing a beam of electrons through a very thin specimen and analyzing the transmitted beam for structural information (see the article “Analytical Transmission Electron Microscopy” in this Volume). Microscopy (microstructural examination) involves...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... A17 , 1939 , p 49 10.1139/cjr39a-004 64. Romig A.D. Jr. , et al. , Analytical Transmission Electron Microscopy , in Materials Characterization , Vol 10 , 9th ed. , Metals Handbook , American Society for Metals , 1986 , p 429 – 489 65. Robert L. , Bussot J...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... crystallographic information is needed for a particular phase, transmission electron microscopy can be employed. Microanalysis is a method that combines structural (location-specific) and compositional analysis in one operation, providing information about specimen composition on a microscopic scale. Hence...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
.../inert fusion analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b) Scanning electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... then be dispersed and characterized by using transmission electron microscopy (TEM) with image analysis to obtain the average diameter and length of the nanotubes. The carbon nanotube loading is also important and affects the mechanical properties as well; therefore, the residual mass of the nanotubes left after...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... … S S S S … … Scanning electron microscopy ● … … ● ● … … ● … ● ● … S … ● Secondary ion mass spectroscopy ● … ● ● … … … … ● ● ● S … … … Spark source mass spectrometry ● … ● ● ● ● ● … … ● ● ● … … … Transmission electron microscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
.... Heinrich K.F.J. , Electron Beam X-ray Microanalysis , Van Nostrand Reinhold , 1981 7. Goldstein J.I. , Newbury D.E. , Echlin P. , Joy D.C. , Fiori C. , and Lifshin E. , Scanning Electron Microscopy and X-ray Microanalysis , Plenum Press , 1981 8...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... they are applied to the solution of materials problems. For example, under the heading “Twinning,” the entries listed are metallography, by which twinning can be detected; x-ray diffraction, by which twinning in single crystals can be characterized; and transmission electron microscopy, by which twinning...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... the precision of the quantitative analytical results. Nonconductive samples or samples with marginally conductive surface regions must be coated with a thin layer of conductive material, typically carbon. X-Ray Fluorescence Spectroscopy (XRF) Transmission Electron Microscopy (TEM) Scanning Auger...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... resolution images of microstructures. As TEMs were enhanced to include features such as digitally scanned point beams and energy dispersive x-ray detectors for chemical microanalysis, alternative names, such as scanning transmission electron microscopy (STEM) and analytical electron microscopy (AEM), were...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... must then be performed. An important future source of high-quality electron-diffraction data will be scanning transmission electron analytical microscopes equipped with electron energy loss (EELS) detectors (see the article “Analytical Transmission Electron Microscopy” in this Volume). Slight...