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analytical transmission electron microscopy

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... Abstract Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001725
EISBN: 978-1-62708-178-8
...” are articles on “Analytical Transmission Electron Microscopy,” “Scanning Electron Microscopy,” “Electron Probe X-Ray Microanalysis,” and “Low-Energy Electron Diffraction.” Each article begins with a summary of general uses, applications, limitations, sample requirements, and capabilities of related...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... Acronyms: Techniques APM atom probe microanalysis AAS atomic absorption spectrometry AEM analytical electron microscopy AES Auger electron spectroscopy; atomic emission spectrometry AFS atomic fluorescence spectrometry ATEM analytical transmission...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Image
Published: 30 June 2023
, atom probe field-ion microscopy; AEM, analytic electron microscopy; LM, light microscopy; TEM, transmission electron microscopy; MQD, multiplex-quadrature detection; DSC, differential scanning calorimetry; SEM, scanning electron microscopy; EDS, energy-dispersive spectroscopy. Source: Ref 13 More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b) Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Surface Scanning Auger...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... of nanotechnology and the development of smart coatings have been dependent largely on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. ball milling chemical vapor...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... If specific crystallographic information is needed for a particular phase, transmission electron microscopy can be employed. Microanalysis Microanalysis is a method that combines structural (location-specific) and compositional analysis in one operation, providing information about specimen composition...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... by using transmission electron microscopy (TEM) with image analysis to obtain the average diameter and length of the nanotubes. The carbon nanotube loading is also important and affects the mechanical properties as well; therefore, the residual mass of the nanotubes left after combustion...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... transmission electron microscopy (STEM) and analytical electron microscopy (AEM), were coined and became commonly used. This section incorporates all of these under the general title transmission electron microscopy. Capabilities The transmission electron microscopy provides the highest resolution...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... the transmission electron microscope represent an important contribution to modern fractography. It should be noted, however, that the transmission electron microscope remains a vital tool in the field of analytical electron microscopy and enables the simultaneous examination of microstructural features...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... in the article “History of Fractography” in this Volume. A detailed review of the instrumentation, principles, and applications associated with the transmission electron microscope is provided in the article “Analytical Transmission Electron Microscopy” in Volume 10 of ASM Handbook, formerly 9th Edition...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... analytical capabilities. Transmission Electron Microscopy (TEM) Transmission electron microscopy (TEM) has better spatial resolution for imaging and chemical analysis, but an EDS system cannot readily analyze for low atomic number elements (below ∼7). The presence of lower atomic number elements can...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... a sam- bombardment. See also neutron activation analytical electron microscopy (AEM). ple due to regions of different mass den- analysis. The technique of materials analysis in the sity and thickness. transmission electron microscope adsorption chromatography. Chromatog- equipped to detect and quantify...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... the sample is excited in the sources used for emission spectroscopy and absorption contrast. In transmission electron aliquot. A representative sample of a larger spark source mass spectrometry. microscopy, image contrast caused by dif- quantity. ferences in absorption within a sample due analytical line...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... they are applied to the solution of materials problems. For example, under the heading “Twinning,” the entries listed are metallography, by which twinning can be detected; x-ray diffraction, by which twinning in single crystals can be characterized; and transmission electron microscopy, by which twinning...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... microscope) of the sample by scanning an electron beam over a raster and analyzing the various signals generated. The scanning transmission electron microscope is closely related to the conventional transmission electron microscope and is discussed in the article “Analytical Transmission Electron Microscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... Abstract Transmission electron microscopy (TEM) approach enables essentially simultaneous examination of microstructural features through imaging from lower magnifications to atomic resolution and the acquisition of chemical and crystallographic information from small regions of the thin...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001754
EISBN: 978-1-62708-178-8
... the transmitted beam for structural information (see the article “Analytical Transmission Electron Microscopy” in this Volume). Microscopy (microstructural examination) involves magnifications of approximately 50× or higher; macroscopy (macrostructural examination), 50 × or lower. Optical microscopy...