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analytical electron microscopes

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Published: 01 January 1986
Fig. 6 Positioning of signal detectors in the analytical electron microscope column. Source: Ref 3 More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron...
Image
Published: 01 January 1986
Fig. 1 Comparison of the electron optical columns used in analytical electron microscopes. (a) SEM electron optical column. In the scanning electron microscope, the electron lenses are used to focus the electron beam to a small-diameter probe. To form an image, the scan coils raster the beam More
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of metal powders, surface analysis should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... to each analytical method. Surface sensitive analytical techniques, principles and applications Table 1 Surface sensitive analytical techniques, principles and applications Analytical technique Principle Target information Surface structure techniques Scanning electron microscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... by using x-ray fluorescent analysis or x-ray spectroscopy (XRS), coupled with a scanning electron microscope (SEM) to perform electron probe microanalysis (EPMA). However, this analysis can also be done at submicrometer levels when coupled with a transmission electron microscope (TEM) or analytical...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... temperatures in steel AEM analytical electron microscope/microscopy AES Auger electron spectroscopy; acoustic emission spectroscopy AESF American Electroplaters and Surface Finishers Society AFM atomic force microscope AG aged; alternating grinding AGMA American...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... the size of the imaged region, bonding. Either synchrotron x-radiation or for example, in micrometers or nanometers. the electron beam in the analytical transmis- sion electron microscope can be used as the lter. A semitransparent optical element capa- excitation source. See also analytical elec- ble...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... a sam- bombardment. See also neutron activation analytical electron microscopy (AEM). ple due to regions of different mass den- analysis. The technique of materials analysis in the sity and thickness. transmission electron microscope adsorption chromatography. Chromatog- equipped to detect and quantify...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... environments for coating failure analysis. chromatography differential scanning calorimetry electrochemical impedance spectroscopy Fourier transform infrared spectroscopy laboratory corrosion testing microscopic visual examination scanning electron microscopy-energy dispersive X-ray spectroscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... in the article “History of Fractography” in this Volume. A detailed review of the instrumentation, principles, and applications associated with the transmission electron microscope is provided in the article “Analytical Transmission Electron Microscopy” in Volume 10 of ASM Handbook, formerly 9th Edition...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... the response of the sample to the probe. The most common probe types for surface analysis include photons, electrons, ions, and energy fields. The response can be in the same class as the probe or one of the other types. Each analytical technique has its own capabilities and limitations. Different...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... the transmission electron microscope represent an important contribution to modern fractography. It should be noted, however, that the transmission electron microscope remains a vital tool in the field of analytical electron microscopy and enables the simultaneous examination of microstructural features...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006640
EISBN: 978-1-62708-213-6
... at the microscopic level, this is in fact an analytical advantage. To further reduce the effect of inhomogeneity, as well as effects of the sample surface preparation, a sparking-off (preburn) period of typically several hundred high-energy sparks normally precedes the spark train employed for the actual analysis...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... Abstract This article introduces various analytical techniques commonly used in the characterization of organic solids and liquids and discusses the challenges in performing the analysis, with examples. Some general advice in approaching a material analysis is also provided. organic...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... Abstract Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
..., and the images appear three dimensional. In addition, a broad range of magnifications (10 to 30,000×) facilitates the correlation of macro- and microscopic images. The scanning electron microscope also has analytical capabilities. Among the data signals released during examination are x-rays...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Understanding the various analytical...