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analytical electron microscopes

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
...) or analytical electron microscope (AEM). The electron beam can be localized to an area, line, or spot to perform local qualitative or quantitative chemical analyses. Both TEM/XRS and AEM can be used to analyze cross-sectioned interfaces down to nearly atomic levels. Elemental maps can be produced that relate...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... temperatures in steel AEM analytical electron microscope/microscopy AES Auger electron spectroscopy; acoustic emission spectroscopy AESF American Electroplaters and Surface Finishers Society AFM atomic force microscope AG aged; alternating grinding AGMA American...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... the particles attached to the carbon film. The film, which contains the particles, can then be examined in the analytical electron microscope. The replicating procedure may alter the extracted particles and may produce spurious oxide particles. To assist in distinguishing detail from artifacts induced...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis of metal particles...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
..., principles and applications Analytical technique Principle Target information Surface structure techniques Scanning electron microscopy (SEM) Incident electron beam generates a secondary electron emission that is used to generate the surface image. Microscopic imaging of the surface...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... of KTA-Tator, Inc. Fig. 26 Scanning electron microscope. Courtesy of KTA-Tator, Inc. Fig. 27 Resolved image acquired by scanning electron microscopy-energy dispersive x-ray spectroscopy, with associated spectrum. Courtesy of KTA-Tator, Inc. Fig. 28 Spectrum obtained using...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from a microscopic part of a solid specimen bombarded by a beam of accelerated electrons. It provides information on the various aspects of energy-dispersive spectrometry (EDS) and wavelength-dispersive spectrometry (WDS...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... the response of the sample to the probe. The most common probe types for surface analysis include photons, electrons, ions, and energy fields. The response can be in the same class as the probe or one of the other types. Each analytical technique has its own capabilities and limitations. Different...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006640
EISBN: 978-1-62708-213-6
...-wide burn pattern on a planar sample. For an average analysis of a sample with inhomogeneity at the microscopic level, this is in fact an analytical advantage. To further reduce the effect of inhomogeneity, as well as effects of the sample surface preparation, a sparking-off (preburn) period...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006383
EISBN: 978-1-62708-192-4
... optical emission spectroscopy; SEM-EDS, scanning electron microscope with energy-dispersive x-ray spectroscopy. Particle detectable size for RDE-OES does not take into account complementary rotrode filter spectroscopy (RFS). (b) Depending on the type of ferrography. (c) Identifies all elements...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... in a scanning ion microprobe and an electron beam for charge neutralization Fig. 24 Positive secondary ion mass spectroscopy depth profiles for alkali-lead-silicate crystal glass. (a) Hazed surface. (b) Cleaned surface. Acquired using 18 O − primary beam bombardment in an ion microscope Fig...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... spectrometry The EDS technique is normally used in tandem with the electronic microscope in the microanalysis of samples. The accuracy of this analytical technique is considerably less than the accuracy of WXRFS. One of the most important advantages of XRFS is the automation of the spectrometer...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... tape whose only EDS detectible element is carbon. The EDS feature of a scanning electron microscope is an even more powerful tool for microchemical analysis work. The EDS method works when electrons from the SEM analyzing beam knock electrons out of their orbits around the atom. Electrons...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... conducting and semiconducting solids. However, AES analysis of some inorganic insulating materials is also possible. A competing process to Auger electron generation is that of x-ray emission, the analytical signal for the technique known as energy dispersive x-ray spectroscopy (EDS). In general, x-ray...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... versus depth. The beams of protons or other light ions allow use of several nuclear and atomic analytical methods, granting capabilities absent from electron microprobes. Because proton beams have no primary bremsstrahlung background, unlike electrons, sensitivities are significantly better—parts per...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... or analyzing problems that cannot be resolved by other analytical instruments such as electron microscopes or electron microprobe analyzers. For metal and alloy analysis, polished surfaces of standard alloys can be used and peak areas evaluated for the known and unknown samples. With background...