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X-ray topography

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
... Abstract X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006644
EISBN: 978-1-62708-213-6
... Abstract X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical...
Image
Published: 15 December 2019
Fig. 1 (a) Schematic of x-ray topography technique. (b) Typical transmission x-ray topograph from a quartz wafer showing images of dislocations More
Image
Published: 01 January 1986
Fig. 1 Arrangements for x-ray topography. (a) Reflection topography (the Bragg case). (b) Transmission topography (the Laue case.) P, primary beam; R, diffracted beam; n, normal to diffraction planes; θ B , Bragg angle More
Image
Published: 01 January 1986
Fig. 16 Divergent beam anomalous transmission method of x-ray topography. Source: Ref 24 More
Image
Published: 15 December 2019
Fig. 6 Synchrotron white-beam x-ray topography transmission topograph ( g = 10 1 ¯ 0 , λ = 0.75 Å) recorded from an AlN single crystal under high-absorption conditions (μ t = 8) showing the direct (1), intermediary (3), and dynamical (2) images of a dislocation More
Image
Published: 15 December 2019
Fig. 7 (a) Schematic of section x-ray topography. (b) Wavefields in Borrmann fan leading to formation of Pendellösung fringes. (c) Section x-ray topograph from a diamond crystal showing Pendellösung fringes that are distorted by dislocations More
Image
Published: 15 December 2019
Fig. 27 (a)–(f) Simulated 11 2 ¯ 0 grazing incidence x-ray topography images of threading-edge dislocations (TEDs) with six different Burgers vectors. Top: The six types of TEDs are illustrated according to the position of the extra atomic half-planes associated with them. More
Image
Published: 15 December 2019
Fig. 29 Synchrotron white-beam x-ray topography transmission images recorded from a region near the edge of a 76 mm (3.0 in.) wafer cut with 4° offcut toward [ 11 2 ¯ 0 ]. (a) 01 1 ¯ 0 reflection showing stacking-fault contrast from fault A only. (b) 0 1 ¯ 11 More
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005218
EISBN: 978-1-62708-187-0
... topography, two-dimensional X-ray radiography, and ultra-fast three-dimensional X-ray tomography. solidification microstructure solidification two-dimensional X-ray topography two-dimensional X-ray radiography in situ monitoring X-ray imaging synchrotron radiation ultra-fast three-dimensional X...
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Published: 15 December 2019
spiral advanced in the opposite direction during physical vapor transport growth. (b)–(d) Glide of pinned BPD segment leading to activation of double-ended Frank-Read sources under elevated temperature after growth. (e)–(h) Series of recorded 11 2 ¯ 0 transmission x-ray topography images More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... for examining effects due to crystal defects or unusual aspects of a crystal structure. Single Crystal Topography X-ray topography is a unique application of single crystal analysis. It is essentially x-ray diffraction radiography in which a large area of a single crystal produces a single diffracted...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... micrometers. Nowadays, these beamlines are abundant in all synchrotron radiation facilities around the world. Fig. 13 Single-crystal diffractometer. (a) Euler and (b) kappa geometries Single-Crystal Topography X-ray topography is a unique application of single-crystal analysis. It essentially...
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006967
EISBN: 978-1-62708-439-0
... conditions Heat exchangers and lattice structures Surface topography characterization Extraction of surface topography for areal texture measurement Postfinishing assessment of surface roughness, including in internal channels Image-based modeling Conversion of x-ray computed tomography image...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... ball. For obvious reasons, these are termed backscattered electrons. Fig. 3 Interaction of the primary electron beam with atoms in the sample resulting in backscattered primary electrons, secondary electrons, and characteristic x-rays Secondary Electron Imaging of Surface Topography...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
...-thickness changes, etc. EPMA Electron probe microanalysis Electron Characteristic x-ray Energy-dispersive x-ray, wavelength-dispersive x-ray quantitative analysis ≈0.5 µm; depth direction 0.3 to several micrometers Analysis of slip products ESR Electron spin resonance Magnetic field...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
..., surface topography, crystal orientation, magnetic domains 50–1000 nm 30–1000 nm Specimen current No external detector necessary Complementary contrast to backscattered plus secondary electron signal Same as backscattered electrons Same as backscattered electrons Characteristic x-rays (primary...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...