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X-ray spectrometers
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Image
Published: 01 January 1986
Fig. 3 Schematic diagram of the detector of an energy-dispersive x-ray spectrometer. Source: Ref 9
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Image
Published: 01 January 1986
Fig. 4 Schematic diagram of a complete energy-dispersive x-ray spectrometer. Various pulse processing functions and the multichannel analyzer are shown. Source: Ref 9
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Published: 01 January 2002
Fig. 6 Schematic of a complete energy-dispersive x-ray spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor
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Published: 15 January 2021
Fig. 2 Schematic of a silicon-lithium energy-dispersive x-ray spectrometer. Courtesy of Thermo Fisher Scientific
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Published: 15 December 2019
Fig. 6 Principle of the wavelength dispersive x-ray spectrometer (WDS) with the spectrum of YBa 2 Cu 3 O 7 -Al measured with scans of three diffractors (LDE1, TAP, and LiF) to measure all of the characteristic peaks. LDE, layered dispersive element; lithium fluoride, LiF; PET, pentaerythritol
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Image
Published: 15 December 2019
Fig. 13 Schematic diagram of a complete energy-dispersive x-ray spectrometer. Various pulse-processing functions and the multichannel analyzer (MCA) are shown. FET, field-effect transistor
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
... Abstract This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS...
Abstract
This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS) that comprise x-ray tubes, the analyzing system, and detectors. The fundamentals of EDS operation are described. The article also provides useful information on preparation of various samples, explaining the qualitative and quantitative analyses of EDS. It reviews the applications of the x-ray spectrometry.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... Abstract This article provides a detailed account of X-ray spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength...
Abstract
This article provides a detailed account of X-ray spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength-dispersive spectrometer (WDS) and energy-dispersive spectrometer (EDS). This is followed by a discussion on the mechanism and effects of X-ray radiation, X-ray emission, and X-ray absorption. The article then discusses components used, operation, and applications of WDS and EDS. Some of the factors and processes involved in sample preparation for XRF analysis are also included. The article further provides information on the practical procedure for and the applications of WDS and EDS qualitative and quantitative analyses.
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis are then covered...
Abstract
X-ray spectroscopy is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even to the point of being considered a necessity by most operators. While “stand-alone” x-ray detection systems are used less frequently in failure analysis than the more exact instrumentation employed in SEMs, the technology is advancing and is worthy of note due to its capability for nondestructive analysis and application in the field. This article begins with information on the basis of the x-ray signal. This is followed by information on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis are then covered. The article ends with a discussion on the applications of x-ray spectroscopy in failure analysis.
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Published: 01 December 1998
Fig. 2 Schematic of x-ray fluorescence spectrometer. X-rays emitted from the sample are analyzed to determine the characteristic energies (or wavelengths) of x-rays emitted and the intensities of the various characteristic energies
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Published: 15 December 2019
Fig. 1 Schematic of x-ray fluorescence spectrometer. X-rays emitted from the sample are analyzed to determine the characteristic energies (or wavelengths) of x-rays emitted and the intensities of the various characteristic energies.
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Published: 15 December 2019
Fig. 14 Schematic diagrams of silicon-lithium semiconductor x-ray detector used in an energy-dispersive x-ray spectrometer
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Published: 01 January 1986
Fig. 7 Wavelength-dispersive x-ray spectrum of AISI type 347 stainless steel. Philips PW-1410 sequential x-ray spectrometer; molybdenum x-ray tube, 30 kV, 30 mA; P-10 flow proportional detector; LiF(200) analyzing crystal; fine collimation; 100 kcps full scale
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Image
Published: 15 December 2019
Fig. 12 Wavelength-dispersive x-ray spectrum of AISI type 347 stainless steel. Philips PW-1410 sequential x-ray spectrometer; molybdenum x-ray tube, 30 kV, 30 mA; P-10 flow-proportional detector; LiF(200) analyzing crystal; fine collimation; 100 kcps full scale
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Published: 15 May 2022
Fig. 57 Block diagram of a typical x-ray photoelectron spectroscopy spectrometer. UHV, ultrahigh vacuum
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Published: 01 January 2002
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Published: 01 January 1986
Fig. 6 Schematic diagram of the components of a wavelength-dispersive x-ray spectrometer. Courtesy of Cameca Instruments
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Published: 01 June 2012
Fig. 4 Schematic of the electron beam interaction with the sample for scanning electron microscopy and energy-dispersive x-ray spectrometer analysis
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Published: 01 June 2024
Fig. 12 In situ plasma cleaner in an electron beam instrument. EDS, energy-dispersive x-ray spectrometer. Source: XEI Scientific
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Published: 15 December 2019
Fig. 7 Principle of the semiconductor silicon drift detector energy dispersive x-ray spectrometer (SDD-EDS) with the spectrum of YBa 2 Cu 3 O 7 -0.4wt%Al
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