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Published: 01 January 1986
Fig. 2 (a) Kα x-ray production cross sections versus proton energy and atomic number and (b) L x-ray production cross sections versus proton energy and atomic number. Source: Ref 4 .
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Published: 15 December 2019
Fig. 2 (a) Kα and (b) L x-ray production cross sections versus proton energy and atomic number. Source: Ref 4
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Published: 01 January 1986
Fig. 39 X-ray spectrum from bridgewire corrosion product. Note the presence of substantial amounts of chlorine.
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Published: 01 January 1986
Fig. 40 X-ray spectrum from pin corrosion product. Note the presence of substantial amounts of chlorine.
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Published: 01 December 1998
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... on iron—and higher for heavier elements. Another insight is that, to a good approximation, electrons bound with equal energy have approximately equal velocities. Thus, x-ray production for the Kα x-ray of arsenic (per atom) occurs with approximately the same probability as that of an Lα x-ray of lead (per...
Abstract
This article provides a detailed account of particle-induced x-ray emission (PIXE), covering the basic principles of PIXE analysis and calibration and quality-assurance protocols employed. A comparative study on PIXE and x-ray fluorescence is then presented. The article also discusses the applications of PIXE in atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
... proton on iron—and higher for heavier elements. Another insight is that, to a good approximation, electrons bound with equal energy have approximately equal velocities. Thus, x-ray production for the Kα x-ray of arsenic (per atom) occurs with approximately the same probability as that of an Lα x-ray...
Abstract
Particle-induced x-ray emission (PIXE) is one of several quantitative analyses based on characteristic x-rays. This article provides a detailed account on the principles of PIXE, discussing the data-reduction codes used to identify, integrate, and reduce x-ray peaks into elemental concentrations. It provides information on the calibration of PIXE analysis, which is mostly performed using gravimetric standards to avoid serious absorption, refluorescence, or ion energy change corrections. A comparative study on PIXE and x-ray fluorescence is also included. Finally, the article discusses the applications of PIXE in three areas, namely, atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... of Characteristic and Continuum X-Rays The incident electron kinetic energy, E 0 , must exceed the shell electron binding energy, E c , for ionization to occur. Characteristic x-ray production begins when the “overvoltage” U 0 = E 0 / E c for a particular shell exceeds unity: (Eq 1) U 0...
Abstract
This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along with the significance of the raw analytical total. Sections on accuracy of the standards-based k-ratio/matrix corrections protocol with EDS and processes of analysis when severe peak overlap occurs are also included. The article provides information on low-atomic-number elements, iterative qualitative-quantitative analysis for complex compositions, and significance of standardless analysis in the EDS software. It ends with a section on the processes involved in elemental mapping for major and minor constituents.
Series: ASM Handbook
Volume: 4A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v04a.a0005800
EISBN: 978-1-62708-165-8
... the parameters associated with resistance spot welding, laser welding, and metal active gas welding. It also provides useful information of retained austenite volume fraction measured by x-ray diffraction and electron backscatter diffraction. The article also examines microstructure evolution during tensile...
Abstract
Quenching and partitioning (Q&P) steel is a term used to describe a series of C-Si-Mn, C-Si-Mn-Al, or other steels subjected to the quenching and partitioning heat treatment process. This article discusses the Q&P steel's chemical compositions and mechanical properties, and provides an overview of the important background and product characteristics with a focus on the automotive sheet steel application. It schematically represents the continuous annealing process, consequent phase-transformation behaviors, and forming-limit curves of Q&P steels. The article describes the parameters associated with resistance spot welding, laser welding, and metal active gas welding. It also provides useful information of retained austenite volume fraction measured by x-ray diffraction and electron backscatter diffraction. The article also examines microstructure evolution during tensile testing at different strain levels using electron backscatter diffraction.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... of the micrograph. Source: Ref 3 Excitation and characteristic x-ray production also occurs as the incident electron beam interacts with the atoms in the sample. As in the SEM and EPMA, this provides the equivalent of a x-ray fluorescence spectrometer that can probe the chemistries of very small operator...
Abstract
Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection threshold and precision, limitations, sample requirements, and the capabilities of related techniques.
Book Chapter
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003238
EISBN: 978-1-62708-199-3
... other factors that govern the exposure and processing of a neutron radiograph are similar to those for radiography using X-rays or gamma rays. gamma-ray radiography image conversion neutron radiography shadow formation X-ray films X-ray production X-ray radiography RADIOGRAPHY...
Abstract
Radiography is a nondestructive-inspection method that is based on the differential absorption of penetrating radiation by the part or test piece (object) being inspected. This article discusses the fundamentals and general applications of radiography, and describes the sources of radiation in radiographic inspection, including X-rays and gamma rays. It deals with the characteristics that differentiate neutron radiography from X-ray or gamma-ray radiography. The geometric principles of shadow formation, image conversion, variation of attenuation with test-piece thickness, and many other factors that govern the exposure and processing of a neutron radiograph are similar to those for radiography using X-rays or gamma rays.
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... with higher resolution and sensitivity than EDS X-ray diffraction (XRD) Diffraction of the incident x-ray beam from various plans of crystal lattice create a diffraction pattern characteristic of the sample. Elemental and phase identity and composition of inorganic corrosion product Auger electron...
Abstract
This article describes the analytical methods for analyzing surfaces for corrosion and corrosion inhibition processes as well as failure analysis based on surface structure and chemical identity and composition. The principles and applications of the surface-structure analysis techniques, namely, optical microscopy, scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy, are reviewed. The article discusses the principles and applications of chemical identity and composition analysis techniques. These techniques include the energy dispersive X-ray spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis.
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006967
EISBN: 978-1-62708-439-0
... of the surface. These measurement techniques are still limited to surfaces with line-of-sight access, such that internal features remain a major challenge. Fig. 6 Image of a Sensofar S neox, which integrates several areal surface-measurement techniques in a single system. Source: Ref 7 X-Ray...
Abstract
As additive manufacturing (AM) gains maturity as a manufacturing technique for production in many industrial sectors, inspection as a tool for quality control gains importance. This article is focused on the field of dimensional metrology, which is typically concerned with the verification of size, location, form, and surface topography of geometric features. This is split into two categories: geometric (size, location, form) and surface measurement (topography). The article also focuses on applicable inspection technologies, and it discusses the context within digital thread manufacturing. A case study on the Digital Inspection Requirements Enhancing Coverage and Traceability (DIRECT) is also presented.
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006445
EISBN: 978-1-62708-190-0
... of a part that either reduces or increases x-ray attenuation will be resolvable by x-ray radiography. Some types of flaws and their x-ray images are shown in Fig. 11 ( Ref 11 ). Fig. 11 Schematic of flaws and their x-ray images. Defect types that can be detected by x-ray radiography are those...
Abstract
The potential for introducing defects during processing becomes greater as the relative density of pressed and sintered powder metallurgy (PM) parts increases and more multilevel parts with complex geometric shapes are produced. This article discusses the potential defects in pressed and sintered PM parts: density variations, compaction and ejection cracks, microlaminations, poor degree of sintering, and voids from prior lubricant agglomerates. It describes the various methods applicable to green compacts: direct-current resistivity testing, radiographic techniques, computed tomography, and gamma-ray density determination. The article also discusses the methods for automated nondestructive testing of pressed and sintered PM parts: acoustic methods-resonance testing, eddy current testing, magnetic bridge comparator testing, ultrasonic techniques, radiographic techniques, gamma-ray density determination, and visual inspection.
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... in sample by ejection of electrons (photoelectron production), and relaxation of excited atom by electronic transitions and accompanying characteristic x-ray emission The net result is that each element has a unique set of known electron energy levels. Similarly, the set of energy differences between...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and precision methods, and sample requirements. The amount of material that needs to be sampled, operating principles, and limitations of the stated methods are also discussed.
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005292
EISBN: 978-1-62708-187-0
... entrapped air and shrinkage. However, with human eyes, there is no way to detect this type of defect. Fortunately, with x-rays and automatic defect-recognition software, an in-line mass-production quality check can be done. Safety improvement: Die casting injuries are ranked very high among...
Abstract
High-pressure die casting is a fast method for the net shape manufacturing of parts from nonferrous alloys. This article reviews the automation technologies for the different stages or steps of the process. These steps include liquid metal pouring, injection, solidification, die open, part extraction, die lubrication, insert loading, and die close. Some manual aspects of the operations, together with automation options, are discussed. The article describes finishing steps, such as finish trimming, detailed deflashing, shot blast cleaning, and quality checks. Automation of the postcasting process is also discussed.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical...
Abstract
This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... spectrometers were used in laboratories, finding application in routine analyses for production and quality control and in specialized tasks. Initially, x-ray spectrometry found wide acceptance in applications related to metallurgical and geochemical analyses. Examples of specialized applications have included...
Abstract
This article provides a detailed account of X-ray spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength-dispersive spectrometer (WDS) and energy-dispersive spectrometer (EDS). This is followed by a discussion on the mechanism and effects of X-ray radiation, X-ray emission, and X-ray absorption. The article then discusses components used, operation, and applications of WDS and EDS. Some of the factors and processes involved in sample preparation for XRF analysis are also included. The article further provides information on the practical procedure for and the applications of WDS and EDS qualitative and quantitative analyses.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
... related to metallurgical and geochemical analyses. More recently, x-ray spectrometry has proved valuable in the analysis of environmental samples, in the determination of sulfur and wear elements in petroleum products, in applications involving forensic samples, and in measurements of electronic...
Abstract
This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS) that comprise x-ray tubes, the analyzing system, and detectors. The fundamentals of EDS operation are described. The article also provides useful information on preparation of various samples, explaining the qualitative and quantitative analyses of EDS. It reviews the applications of the x-ray spectrometry.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
.... XPS is perhaps most advantageous in the analysis of polymers because the bonds in polymers can be resolved, particularly for failure analysis, evaluation of production issues, and overall characterization. With advancements in x-ray sources, cluster guns, and imaging capabilities, XPS is useful...
Abstract
This article focuses on the principles and applications of X-ray photoelectron spectroscopy (XPS) for the analysis of elemental and chemical composition. The discussion covers the nomenclature, instruments, and specimen preparation process of XPS. Some of the factors pertinent to the calibration of materials for accurate measurements using XPS are provided, along with some aspects of the accuracy in quantitative analysis by XPS. In addition, the article presents examples of how XPS data can be used to solve problems with surface interactions.
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