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X-ray powder diffraction

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders or aggregates of finely divided material that readily diffract x-rays in specified patterns. This article provides an introduction to XRPD, beginning with a review of sensing...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
..., Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed. The article...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... and monochromatic beams, powder diffraction methods, and the Rietveld method. X-ray diffraction powder diffraction methods single-crystal methods Rietveld refinement References 1. Giacovazzo C. , Monaco H.L. , Artioli G. , Viterbo D. , Milanesio M. , Gilli...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... Abstract This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... and their uses are described in the following sections, along with information about the threshold sensitivity and precision, limitations, sample requirements, and capabilities of related techniques. Identification of Compounds and Phases Using X-Ray Powder Diffraction Typical Uses X-ray powder...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
...). Source: Ref 4 As noted in the section “Identification of Compounds and Phases Using X-Ray Powder Diffraction,” predictable and reproducible intensities are obtained for the diffracted beams corresponding to particular sets of planes in a given material, provided the sample consists...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... present in the powder were not dissolved during spraying. Fig. 2 Schematic of Bragg diffraction of a crystal Fig. 3 X-ray diffraction 2θ scan for WC/Co coating sprayed at moderate parameter levels. Compare with Fig. 4 . The individual peak heights for a given set of planes...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... materials. crystal structure qualitative analysis single crystal diffraction X-ray diffraction X-ray powder diffraction X-ray diffraction techniques are some of the most useful in the characterization of crystalline materials, such as metals, inter-metallics, ceramics, minerals, polymers...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005728
EISBN: 978-1-62708-171-9
... borrowed from other materials science disciplines. This article focuses on commonly used testing and characterization methods: metallography, image analysis, hardness, tensile adhesion testing, corrosion testing, x-ray diffraction, non-destructive testing, and powder characterization. It provides...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... x-ray powder diffraction XRF x-ray fluorescence XRS x-ray spectrometry Abbreviations a crystal lattice length along the a axis ac alternating current A absorbance ADC analog-to-digital converter AFC automatic frequency control...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
... sufficient intensity to be useful in neutron scattering research: fission (of 235 U or 239 Pu) and spallation. The fundamental equations governing neutron powder diffraction are essentially the same as for x-rays, except that the neutron scattering length b replaces the x-ray form factor f...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... diffraction pattern, termed a Kikuchi pattern, is analogous to the x-ray Kossel pattern, but is made up of straight lines that are easier to index. These Kikuchi patterns can be used to identify crystalline phases (similar to x-ray powder diffraction but based on a different diffraction geometry), as well...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... diffraction pattern, termed a Kikuchi pattern, is analogous to the x-ray Kossel pattern, but is made up of straight lines that are easier to index. These Kikuchi patterns can be used to identify crystalline phases (similar to x-ray powder diffraction but based on a different diffraction geometry), as well...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
..., unit cell parameters, atomic coordinates and thermal displacement parameters, bond lengths and angles between the atoms, and structural motive (or topology). The article “X-Ray Powder Diffraction” (XRPD) in this Volume describes techniques used to characterize samples in the form of loose powders...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... electrons, or neutrons that undergo wave interference with the regular arrangement of atoms in a crystalline lattice. Crystal diffraction techniques can be used to give both qualitative and quantitative data on the phases present. By far the most common technique used is x-ray powder diffraction...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... Göbel X-Ray , Mater. World , Vol 7 ( No. 10 ), 1999 , p 616 – 618 12. Namatame Y. , Kuzumaki T. , Shiramata Y. , and Nagao K. , Use of Multi-Dimensional Measurement in Powder X-Ray Diffraction , Rigaku J. , Vol 34 ( No. 1 ), 2018 , p 9 – 13 13. Chahine...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
.... The considerations are the same as those discussed in the article “X-Ray Powder Diffraction” in this Volume. However, the radiation used for RDF analyses (0.7 Å or less) is absorbed much less by most samples than the Cu Kα (1.54 Å) used in many powder diffractometers. The scattered radiation can be directed...