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X-ray photoelectron spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... Abstract This article focuses on the principles and applications of X-ray photoelectron spectroscopy (XPS) for the analysis of elemental and chemical composition. The discussion covers the nomenclature, instruments, and specimen preparation process of XPS. Some of the factors pertinent...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001771
EISBN: 978-1-62708-178-8
... Abstract This article provides a detailed account of the principles, instrumentation,and applications of x-ray photoelectron spectroscopy (XPS), a technique used for elemental and compositional analysis of surfaces and thin films. It reviews the nomenclature of energy states and sensitivity...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... the ejection of an outer shell electron. The energy of this ejected electron is characteristic of the surface atoms. Elemental identity and composition of the surface species and the depth profile X-ray photoelectron spectroscopy (XPS) or ultraviolet photoelectron spectroscopy (UPS) Incident x-rays...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... devices. The methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive x-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, x-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
... surface analysis methods, namely, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and Rutherford backscattering spectroscopy. It also provides useful information on the applications of surface analysis. Auger electron...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... surface analysis transmission electron microscopy X-ray photoelectron spectroscopy Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006657
EISBN: 978-1-62708-213-6
...., Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy , John Wiley & Sons , 1983 15. Chang C.C. , Advances in Analytical Auger Electron Spectroscopy , MRS Bull. , Vol 12 , 1987 , p 70 – 74 , 10.1557/S0883769400067269 16. Chang C.C. , Surf. Sci. , Vol...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... steels); corrosion mechanisms; electrochemistry; tribology X-ray photoelectron spectroscopy (XPS) X-ray Photoelectrons Chemical state and composition 20–500 μm for monochromatic x-ray; 10–30 mm for nonmonochromatic x-ray 10 nm Elemental analysis of all elements with an atomic number of lithium...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... … N N … … • … N N … C • Ultraviolet/visible absorption spectroscopy D, • D, • D,• … D,• D,• D,• D,• … … D,• D,• D,• … … X-ray diffraction … … C … C C C,S C … … C C … C … X-ray photoelectron spectroscopy • N S … • • S … … • • • … … … X...
Series: ASM Handbook
Volume: 13C
Publisher: ASM International
Published: 01 January 2006
DOI: 10.31399/asm.hb.v13c.a0004103
EISBN: 978-1-62708-184-9
... using x-ray photoelectron spectroscopy. Fig. 1 Chloride pit on the casing of a centrifugal pump used for hot water for injection. The pit was caused by chloramines. Chloramines are formed by the reaction of hypochlorous acid and ammonia. There are three species of chloramine...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
...; SIMS, secondary ion mass spectroscopy; TEM, transmission electron microscopy; UV/VIS, ultraviolet/visible absorption spectroscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x-ray spectrometry Fig. 1 Flow charts of common techniques for characterization of organic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x-ray spectrometry. (a) Limited number of elements or groups. (b) Under special conditions Table 1 Characterization techniques for ceramics...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SSMS spark source mass spectrometry STEM scanning transmission electron microscopy TEM transmission electron microscopy TNAA thermal neutron activation analysis UV/VIS ultraviolet/visible (absorption spectroscopy) XPS x-ray photoelectron spectroscopy XRPD...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... nanometers Surface contaminants UPS Ultraviolet photoelectron spectroscopy Light (ultraviolet) Photoelectron Adsorption, material decomposition 1 µm Surface-oriented tribological analysis, bonding state XRD X-ray diffraction X-ray X-ray diffraction Trace element analysis Several hundreds...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001770
EISBN: 978-1-62708-178-8
... Analysis by Auger and X-Ray Photoelectron Spectroscopy , John Wiley & Sons , 1983 8. Chang C.C. , Surf. Sci. , Vol 25 , 1971 , p 53 10.1016/0039-6028(71)90210-X 9. Stein D.F. and Joshi A. , Annu. Rev. Mater. Sci. , Vol 11 , 1981 , p 485 10.1146/annurev.ms...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... to the quantity of an element and any other facets of the techniques that would not be known by the customer. Failure investigations where the surface of the subject part is important can include surface chemical analysis techniques such as x-ray photoelectron spectroscopy (XPS), or electron spectroscopy...