1-20 of 96 Search Results for

X-ray microanalysis

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... Beam energy: 20 keV Element Certified wt% EDS wt% Relative error, % WDS wt% Relative error, % Copper 76.75 77.7 1.2 76.9 0.2 Zinc 23.26 23.6 1.5 23.5 1.0 Source: Ref 5 X-ray microanalysis of reaction zone at the aluminum wire/steel screw interface shown...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... and during the X-ray microanalysis are reviewed. The article also provides information on the sample preparation procedure and the materials applications of the SEM. compositional contrast electron channeling pattern instrumental design material applications orientation contrast sample preparation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... … N … • N … … • • • • … … • Auger electron spectroscopy • … … … • • … … • • • • … … … Electron probe x-ray microanalysis N … … … N N N … N … N N N … … Electron spin resonance N N … … N N N N … … … N N N … Elemental and functional...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... microanalysis, Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... microscopy; COMB, high-temperature combustion; EFG, elemental and functional group analysis; EPMA, electron probe x-ray microanalysis; ESR, electron spin resonance; FTIR; Fourier transform infrared spectroscopy; GC, gas chromatography; GC/MS, gas chromatography/mass spectrometry; IA, image analysis; IC, ion...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... ● … … ● ● … … ● ● ● ● S … … S Electron probe x-ray microanalysis ● … … ● ● ● … ● … ● ● S S … ● Image analysis … … … … … … ● ● … … … … … … ● Ion chromatography D, N … … D, N D, N D, N D, N … … D, N D, N D, N … … … Inductively coupled plasma atomic emission...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... electron microscopy, electron probe x-ray microanalysis, and Auger electron spectroscopy, by which inclusion chemistries can be determined. Again, it should be emphasized that this Handbook is meant as a tool to familiarize the nonanalytical specialist with modern analytical techniques and to help him...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... of the X-Ray Signal Detectors for X-Ray Spectroscopy Specimen Preparation and Data Collection Application of X-Ray Spectroscopy in Failure Analysis Acknowledgments References References 1. Newbury D.E. and Ritchie N.W.M. , Performing Elemental Microanalysis with High...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... product on a fracture surface should generally be confined to the strictly qualitative mode. Interpreting the quantitative results from such a test would be very difficult at best. Wavelength-Dispersive Spectrometry Microchemical Analysis In modern x-ray microanalysis, the analyst actually has...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... , p 71 12. Barbi N.C. , Electron Probe Microanalysis Using Energy Dispersive X-ray Spectroscopy , PGT, Inc. , 1981 13. Reed S.J.B. , Electron Microprobe Analysis , Cambridge University Press , 1975 14. Goldstein J.I. et al. , Scanning Electron Microscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001725
EISBN: 978-1-62708-178-8
... Electron Microscopy,” “Electron Probe X-Ray Microanalysis,” and “Low-Energy Electron Diffraction.” Each article begins with a summary of general uses, applications, limitations, sample requirements, and capabilities of related techniques, which is designed to give the reader a quick overview...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Microscope , J. Phys. E. , Vol 8 (No. 12 ), Dec 1975 , p 1037 – 1041 , 10.1088/0022-3735/8/12/018 4. Goldstein J.I. et al. , The SEM and Its Modes of Operation , Scanning Electron Microscopy and X-Ray Microanalysis , Springer US , Boston, MA , 2003 , p 21 – 60 10.1007/978-1...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000600
EISBN: 978-1-62708-181-8
... five line drawings, two of which are graphs containing superimposed electron fractographs. Information on the principles, instrumentation, and applications associated with AES and EDS is provided in the articles “Auger Electron Spectroscopy” and “Electron Probe X-Ray Microanalysis,” respectively...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003769
EISBN: 978-1-62708-177-1