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X-ray fluorescence spectroscopy

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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
...Abstract Abstract The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Abstract The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... handheld X-ray fluorescence analysis instrumentation scanning electron microscope wavelength-dispersive spectrometers X-ray spectroscopy Abstract X-ray spectroscopy is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... Abstract This article provides a detailed account of X-ray spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
.... This is identical to the atomic process described in the section on x-ray fluorescence spectroscopy in the article “Bulk Elemental Analysis.” As in x-ray fluorescence spectroscopy, the energies of these x-rays can be compared to the known characteristic energies of each element, enabling the atoms in the sample...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... an energy dispersive x-ray detector, but subsequent quantitative analyses are done using the wavelength dispersive crystal spectrometers (WDS). As described in the section on x-ray fluorescence spectroscopy in the article “Bulk Elemental Analysis” and illustrated in Fig. 4–6, wavelength dispersive x-ray...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... information, see the section “X-Ray Fluorescence Spectroscopy” in the article “Bulk Elemental Analysis” in this Handbook. However, emission of characteristic x-rays is only one of the mechanisms by which this energy can be released. Another common mechanism is by the release of an Auger electron...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... difference between the donor and acceptor levels. For more information, see the section “X-Ray Fluorescence Spectroscopy” in the article “Bulk Elemental Analysis” in this Handbook. However, emission of characteristic x-rays is only one of the mechanisms by which this energy can be released. Another common...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... different analytical techniques. Table 1 Classification of characterization methods most commonly used with metals Type of analysis Information obtained/method Elemental Structural Morphological Bulk X-ray fluorescence spectroscopy (XRF) Optical emission spectroscopy (OES) Combustion...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... with metals Type of analysis Information obtained/method Elemental Structural Morphological Bulk X-ray fluorescence spectroscopy (XRF) Optical emission spectroscopy (OES) Combustion/inert fusion analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
... spectroscopy (SIMS and SNMS) ( Ref 5 , 6 ). Glow discharge optical emission spectroscopy (GDOES) or glow discharge mass spectroscopy (GDMS), ion scattering spectroscopy (ISS), and Rutherford backscattering spectroscopy (RBS) are becoming of increasing importance, as is total reflection x-ray fluorescence...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... can be obtained with a backscatter electron detector and by x-ray fluorescent spectroscopy, which permits analysis of both structure and microchemistry. The scale of the SEM is particularly suitable for many ceramic parts and raw materials. The depth of focus provided by this instrument makes...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006056
EISBN: 978-1-62708-175-7
... Surface X-ray fluorescence spectroscopy (XRF) Fluorescence High matrix interference, relatively high limits of detection, consistency of results dependent upon homogeneity, simple sample preparation, flexible across chemistries, may be incorporated in electron microscopy Surface X-ray...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
... the applications of PIXE in three areas, namely, atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes. calibration data reduction particle-induced X-ray emission spectroscopy quality assurance X-ray fluorescence spectroscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... with the atoms that make up the sample. A small fraction of these electrons are excited to higher energy states, as described in the section “X-Ray Fluorescence Spectroscopy” in the article “Bulk Elemental Analysis.” Most electrons remain unexcited but are set into oscillatory motion around their centers...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... to the computer regarding what elements are, are not, and may be in the sample. This information is typically obtained by x-ray fluorescence spectroscopy. Once this elemental information has been input, the software searches only compounds that are consistent with it. Once the phases or compounds present...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
..., deterioration TDS Thermal desorption spectroscopy Thermal energy Desorbed atoms, molecules Imaging … Identification of adsorbed and stored materials TXRF Total-reflection x-ray fluorescence spectroscopy X-ray Fluorescent x-ray Composition distribution 10 9 atoms/cm 2 ; depth direction several...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...