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X-ray diffractometers

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Published: 01 December 1998
Fig. 8 Schematic of x-ray diffractometer. Typically, the x-ray tube remains stationary while the detector mechanically scans a range of θ angles. The sample also rotates with the detector such that diffraction is recorded from planes parallel to the sample surface. More
Image
Published: 15 December 2019
Fig. 3 Schematic of x-ray diffractometer. Typically, the x-ray tube remains stationary while the detector mechanically scans a range of θ angles. The sample also rotates with the detector such that diffraction is recorded from planes parallel to the sample surface. More
Image
Published: 01 January 2000
Fig. 14 Photograph of a miniature x-ray diffractometer for the one angle technique arrangement of XRD stress measurement. This device incorporates a Ruud-Barrett position sensitive scintillation detector and is capable of being inserted in a 101.60 mm (4 in.) inside diameter for measuring More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... the Debye-Scherrer camera and the X-ray diffractometer. The article also describes the uses of XRD analyses, such as the identification of phases or compounds in metals and ceramics; detection of order and disorder transformation; determination of lattice parameters and changes in lattice parameters due...
Image
Published: 01 January 1994
) Typical d versus sin 2 Ψ curve (where d is the interatomic distance, which varies according to stress level, and Ψ is the angle of the incoming x-ray beam relative to the surface) obtained from an x-ray diffractometer. Seven different Ψ orientations (from −45° to +45°) were used. The d -spacing can More
Image
Published: 01 November 1995
Fig. 5 Schematic showing key components of an x-ray powder diffractometer More
Image
Published: 01 January 1986
Fig. 8 Geometry of the Bragg-Brentano diffractometer. F, line source of x-rays from the anode of the x-ray tube; P, soller slits (collimator); D, divergent slit; A, axis about which sample and detector rotate; S, sample; R, receiving slit; RP, receiving soller slits; SS, scatter slit More
Image
Published: 01 January 1986
Fig. 9 Schematic of a thin film diffractometer. A, line source of x-rays; B, axial divergence of soller slit; C, glancing angle; D, sample; E, equatorial divergence soller slit; F, detector More
Image
Published: 15 December 2019
Fig. 10 Geometry of the Bragg-Brentano diffractometer. F, line source of x-rays from the anode of the x-ray tube; P, Soller slits (collimator); D, divergent slit; A, axis about which sample and detector rotate; S, sample; R, receiving slit; RP, receiving Soller slits; SS, scatter slit More
Image
Published: 15 December 2019
Fig. 11 Schematic of a thin-film diffractometer. A, line source of x-rays; B, axial divergence of Soller slit; C, glancing angle; D, sample; E, equatorial divergence Soller slit; F, detector More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
.... Conventional Diffractometers Although film techniques have been in use since the inception of x-ray diffraction, the advent of powder diffractometers has been more recent. Powder diffractometers have been in use as a laboratory tool since the late 1950s and early 1960s. Automation of these devices began...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
.... The article ends with a few application examples of XRPD. X-ray powder diffraction diffractometers Overview X-RAY POWDER DIFFRACTION (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens ( Ref 1...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... to be a continuous ring ( Fig. 9 ). Fig. 9 X-ray diffraction data collected for (a) coarse, (b) medium, and (c) fine particle specimens (Cu Kα radiation, reflection-mode geometry diffractometer, and pixel detector). Source: Ref 15 . For sheet samples such as polymer films or thin metal foils, samples...
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Published: 15 December 2019
Fig. 9 X-ray diffraction data collected for (a) coarse, (b) medium, and (c) fine particle specimens (Cu Kα radiation, reflection-mode geometry diffractometer, and pixel detector). Source: Ref 15 . More
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Published: 15 December 2019
Fig. 14 Geometry of powder diffraction and several detection methods used in x-ray powder diffraction. (a) Cones of diffracted beams emanating from a powder sample. (b) Debye-Scherrer detection method. (c) Diffractometer method of detection. (d) Position-sensitive detection. (e) Guinier method More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
... in three days. The single-crystal diffractometer combines all the qualitative advantages of x-ray film techniques with the quantitative power of diffractometers. For example, a recent study of yttria-stabilized zirconia ( Ref 14 ) revealed the dc charge-induced mobility of oxygen atoms at 1040 K...
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Published: 15 December 2019
Fig. 20 Micro x-ray diffraction (μXRD) maps of kamacite and taenite showing the Widmanstätten pattern in a Toluca iron meteorite. (a) Toluca iron meteorite on the diffractometer. Etched portion of the cut surface shows the Widmanstätten pattern. (b) Two-dimensional (2-D) image collected More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006631
EISBN: 978-1-62708-213-6
... will be cooled, it is possible to use inert viscous liquids (e.g., motor or Vaseline oil), which will not crystallize at low temperatures. Then the crystalline sample should be placed for data collection into a single-crystal x-ray diffractometer. Today there are several world-leading manufacturers...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... micrometers. Nowadays, these beamlines are abundant in all synchrotron radiation facilities around the world. Fig. 13 Single-crystal diffractometer. (a) Euler and (b) kappa geometries Single-Crystal Topography X-ray topography is a unique application of single-crystal analysis. It essentially...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001238
EISBN: 978-1-62708-170-2
... d versus sin 2 Ψ curve (where d is the interatomic distance, which varies according to stress level, and Ψ is the angle of the incoming x-ray beam relative to the surface) obtained from an x-ray diffractometer. Seven different Ψ orientations (from −45° to +45°) were used. The d -spacing can...