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X-ray diffraction residual-stress techniques

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001761
EISBN: 978-1-62708-178-8
... model, and describes the most common methods of x-ray diffraction residual stress measurement, namely, single-angle and two angle techniques. It elaborates the major steps involved in x-ray diffraction residual stress measurement, explaining the possible sources of error in stress measurement...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006632
EISBN: 978-1-62708-213-6
... Abstract This article provides a detailed account of x-ray diffraction (XRD) residual-stress techniques. It begins by describing the principles of XRD stress measurement, followed by a discussion on the most common methods of XRD residual-stress measurement. Some of the procedures required...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003228
EISBN: 978-1-62708-199-3
... such as photoelastic coatings, brittle coatings, or strain gages ( Ref 8 ). If the stress-strain behavior of the material is known, these strain values can be converted into stress values. Residual stresses in materials can be nondestructively measured by a variety of methods, including x-ray diffraction ( Ref 9...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006768
EISBN: 978-1-62708-295-2
..., Society of Automotive Engineers , 2003 4. Prevey P.S. , X-Ray Diffraction Residual Stress Techniques , Materials Characterization , Vol 10 , ASM Handbook , American Society for Metals , 1986 , p 380 – 392 10.31399/asm.hb.v10.a0001761 5. Lu J. et al. , Handbook...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003528
EISBN: 978-1-62708-180-1
... Abstract This article focuses primarily on what an analyst should know about applying X-ray diffraction (XRD) residual stress measurement techniques to failure analysis. Discussions are extended to the description of ways in which XRD can be applied to the characterization of residual stresses...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
... states in crystalline materials. The technique is based on x-ray methodology, which is discussed in the article “X-Ray Diffraction Residual Stress Techniques” in this Volume. However, differences in types of applications and experimental procedures arise due to differences in beam penetration, peak...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003329
EISBN: 978-1-62708-176-4
... the semidestructive methods of residual stress measurement: blind hole drilling and ring coring, spot annealing, and X-ray diffraction techniques. Nondestructive methods such as neutron diffraction, ultrasonic velocity, and magnetic Barkhausen noise techniques, are also discussed. Barkhausen noise analysis...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001298
EISBN: 978-1-62708-170-2
... the fundamental principles and presents examples of practical measurements for each method. coatings hole-drilling strain-gage mechanical deflection residual macrostress stress determination X-ray diffraction COATINGS AND THIN FILMS can be produced by a large variety of deposition techniques...
Image
Published: 01 January 1994
Fig. 4 Measurement and analysis of surface damage using x-ray diffraction. (a) 38 mm (1.5 in.) 1018 steel cutoff sample showing burn-related discoloration. Two residual stress measurements by x-ray diffraction were made on the sample at the locations marked by the four concentric markers. (b More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... stresses single crystal orientations temperature effects threshold sensitivity X-ray diffraction X-ray diffractometer X-RAY DIFFRACTION (XRD) is the most extensively used method for identifying and characterizing various aspects of metals related to the arrangements and spacings of their atoms...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001238
EISBN: 978-1-62708-170-2
... = 10 MPa (1.5 ksi). Additional information about these measurement techniques is available in Ref 28 . As demonstrated in Fig. 4 , measurement of residual stresses by x-ray diffraction now offers a practical way to quantify what used to be only a visual observation. A stress measurement...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003325
EISBN: 978-1-62708-176-4
... sectioning x-ray diffraction neutron diffraction Barkhausen noise analysis ultrasonic propagation analysis impact toughness mechanical testing nondestructive techniques residual stress shear testing tensile strength weldability testing welded joints IN WELDED STRUCTURES, the welds typically...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
...).The critical step in data analysis is still indexing of the Laue pattern. Additional information is available in the article “X-Ray Diffraction Residual-Stress Techniques” in this Division. Glancing-Angle Camera Several other camera geometries have been proposed in the past to overcome the limitations...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
... force microscopy, and scanning acoustic microscopy. The article also reviews the X-ray diffraction technique used for determining the compositional changes, strain changes, and residual stress evaluation during the fatigue process. acoustic emission technique atomic force microscopy crack growth...
Image
Published: 15 December 2019
Fig. 4 Basic geometry of the single-angle technique for x-ray diffraction residual-stress measurement. β, angle of inclination of the instrument; 0, point at which a cone of diffracted radiation originates; 1 and 2, points of the diffracting crystals; S 1 and S 2 , the arc lengths along More
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001475
EISBN: 978-1-62708-173-3
... and classifies them as follows: Stress-relaxation techniques X-ray diffraction techniques Techniques using stress-sensitive properties Cracking techniques Classification of techniques for measuring residual stress Table 1 Classification of techniques for measuring residual stress...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005617
EISBN: 978-1-62708-174-0
... available measurement techniques and classifies them as follows: Stress-relaxation techniques X-ray diffraction techniques Techniques using stress-sensitive properties Cracking techniques Classification of techniques for measuring residual stress Table 1 Classification of techniques...
Image
Published: 01 January 1986
Fig. 4 Basic geometry of the single-angle technique for x-ray diffraction residual stress measurement. N p , normal to the lattice planes; N s , normal to the surface. See text for a discussion of other symbols. Source: Ref 2 More
Series: ASM Handbook
Volume: 4E
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.hb.v04e.a0006252
EISBN: 978-1-62708-169-6
... technique Residual stress, MPa (ksi) mm in. °C °F … … 7010 Forging 124 × 156 × 550 4.9 × 6.1 × 21.7 470 880 Water, 20 °C (70 °F) Center hole drilling σ min = −270 (−39) … … 7010 Forging 60 × 60 × 16 2.4 × 2.4 × 0.6 475 890 Water, 20 °C (70 °F) X-ray diffraction σ min...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
... in the article “X-Ray Diffraction Residual Stress Techniques” in this Volume. The pinhole camera, particularly in the back-reflection mode, is an effective and inexpensive instrument for aligning single crystals and surveying polycrystalline samples for crystallite size and perfection. Debye-Scherrer...